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公开(公告)号：US06271672B1
公开(公告)日：2001-08-07
申请号：US09140220
申请日：1998-08-26
IPC分类号： G01R3106
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.
摘要翻译： 一种弹簧探针，用于在具有定位在镜筒内的柱塞的电气装置上进行测试，并且包括位于所述镜筒内的与所述柱塞相邻的弹簧以对所述柱塞施加弹簧力。 柱塞包括具有成角度的表面的接触端，用于接触电气装置以将侧向负载施加到筒体;以及接触端中的槽，用于在与电气装置接触时分开弹簧力。
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公开(公告)号：USD400811S
公开(公告)日：1998-11-10
申请号：US79957
申请日：1997-11-21
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公开(公告)号：US5781023A
公开(公告)日：1998-07-14
申请号：US792658
申请日：1997-01-31
CPC分类号： G01R1/06722
摘要： A hollow plunger spring probe assembly for performing tests on an electrical device including a probe receptacle for receipt of the hollow plunger. The plunger includes a tip at one end of the plunger for contacting the electrical device and a spring positioned within the opening in the plunger between the tip and a receptacle post having a head portion extending into the plunger through a second end. The post is rigidly attached to the receptacle. The plunger includes an attachment mechanism for releasably attaching the plunger to the head portion of the post.
摘要翻译： 一种用于在包括用于接收中空柱塞的探针插座的电气装置上进行测试的中空柱塞弹簧探针组件。 柱塞包括在柱塞的一端处的用于接触电气装置的尖端和位于柱塞内的开口之间的弹簧，该弹簧位于尖端和插座柱之间，其具有通过第二端延伸到柱塞中的头部。 该柱刚性地附接到容器。 柱塞包括用于将柱塞可释放地附接到柱的头部的附接机构。
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公开(公告)号：US06204680B1
公开(公告)日：2001-03-20
申请号：US09139543
申请日：1998-08-25
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals. For closely spaced test sites a thinner daughter board is electrically connected to the load board through a hole in the load board. The test socket is then positioned on the daughter board.
摘要翻译： 一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。 上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。 插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。 多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。 非导电推杆位于弹簧和柱塞的斜边之间，并且非导电帽位于负载板上方以用于高频测试信号。 对于紧密间隔的测试位置，较薄的子板通过负载板上的孔与负载板电连接。 然后将测试插座定位在子板上。
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公开(公告)号：US6084421A
公开(公告)日：2000-07-04
申请号：US44874
申请日：1998-03-20
IPC分类号： G01R31/26 , G01R1/04 , G01R1/073 , G01R31/02 , H01L21/66 , H01L21/822 , H01L23/32 , H01L27/04 , H01R12/16 , H01R33/76
CPC分类号： G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A ball is positioned between the spring and a beveled edge of the plunger to aid in biasing the plunger. Electrically conductive cylindrical eyelets or plated through holes are positioned within the holes in the load board to guide the travel of the socket plungers and to transfer the test signals from the socket plungers to the load board.
摘要翻译： 一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。 上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。 插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。 多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。 一个球定位在弹簧与柱塞的斜边之间，有助于偏压柱塞。 导电圆柱形孔眼或电镀通孔位于负载板的孔内，以引导插座柱塞的行进，并将测试信号从插座柱塞传输到负载板。
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公开(公告)号：US06462567B1
公开(公告)日：2002-10-08
申请号：US09614422
申请日：2000-07-12
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/06733
摘要： An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact component is in contact with the first contact component. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.
摘要翻译： 提供外部弹簧探针，其具有相对于彼此延伸和压缩的第一部分和第二部分。 第一部分由一端的尖端和与尖端相对的第一接触部件组成。 凸缘在尖端和第一接触部件之间径向向外延伸。 第二部分包括在一端的尖端和与尖端相对的第二接触部件。 第二接触部件与第一接触部件接触。 凸缘在第二部分尖端和第二接触部件之间径向向外延伸。 弹簧被夹在围绕两个接触部件的两个凸缘之间。 第一和第二接触部件在压缩和延伸两部分期间保持彼此接触。
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公开(公告)号：US06396293B1
公开(公告)日：2002-05-28
申请号：US09253320
申请日：1999-02-18
IPC分类号： G01R3102
CPC分类号： G01R1/06722
摘要： An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact tip is in contact with the first contact tip. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.
摘要翻译： 提供外部弹簧探针，其具有相对于彼此延伸和压缩的第一部分和第二部分。 第一部分由一端的尖端和与尖端相对的第一接触部件组成。 凸缘在尖端和第一接触部件之间径向向外延伸。 第二部分包括在一端的尖端和与尖端相对的第二接触部件。 第二接触尖端与第一接触尖端接触。 凸缘在第二部分尖端和第二接触部件之间径向向外延伸。 弹簧被夹在围绕两个接触部件的两个凸缘之间。 第一和第二接触部件在压缩和延伸两部分期间保持彼此接触。
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公开(公告)号：US5180976A
公开(公告)日：1993-01-19
申请号：US757006
申请日：1991-09-09
IPC分类号： G01R1/04 , G01R31/316
CPC分类号： G01R1/0425 , G01R31/316
摘要： Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of spring contacts for releasably contacting corresponding electrical leads adjacent opposite sides of the IC package. An upper surface of the module has an array of electrically conductive test pads internally connected to corresponding contacts on the module. The test pads match an array of spring probes in the test unit. The module can be a molded plastic housing with metal leaf spring contacts, or it can comprise a composite flex-circuit material with individual contacts comprising flexible spring-like metalized plastic fingers. Contacts on the test module can releasably engage the leads on the IC package directly, or they can contact separate conductive leads on the PCB adjacent the leads on the IC package. During testing, the spring probes contact the test pads on the test modules and circuit continuity is established via the electrical connections from the spring probes through the modules to the leads adjacent the IC packages. The modules translate dense in-line spacing of leads adjacent the IC packages to the oversized in-line spacing of test pads on the module. In another embodiment, the translator module is attached to a flex-circuit cable coupled to the test system electronics. The translator module is manually placed over each IC package during testing. In a further embodiment, an integrated circuit package contains a built-in test verifier system so that standard test probes can be used to test the package without use of a separate translator module.
摘要翻译： 安装在加载印刷电路板（PCB）上的集成电路（IC）封装由转换器模块测试，首先在每个封装上放置相应的模块。 每个模块具有一排弹簧触点，用于可释放地接触与IC封装相对侧相对应的电引线。 模块的上表面具有内部连接到模块上的相应触点的导电测试焊盘阵列。 测试垫与测试单元中的一组弹簧探针相匹配。 模块可以是具有金属板弹簧触点的模制塑料壳体，或者其可以包括具有包括柔性弹簧状金属化塑料指状物的单独触头的复合柔性电路材料。 测试模块上的触点可以直接可释放地接合IC封装上的引线，或者它们可以接触与IC封装上引线相邻的PCB上分开的导电引线。 在测试期间，弹簧探头接触测试模块上的测试焊盘，并通过从弹簧探头通过模块到邻近IC封装的引线的电气连接建立电路连续性。 这些模块将紧邻IC封装的引线的密集在线间距转换为模块上测试焊盘的过大的在线间距。 在另一个实施例中，翻译器模块连接到耦合到测试系统电子装置的柔性电路电缆。 翻译器模块在测试期间手动放置在每个IC封装上。 在另一实施例中，集成电路封装包含内置的测试验证器系统，使得可以使用标准测试探针来测试封装而不使用单独的转换器模块。
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9.发明授权
公开(公告)号：US5134280A
公开(公告)日：1992-07-28
申请号：US715025
申请日：1991-06-13
申请人： Charles J. Johnston , Mark A. Swart
发明人： Charles J. Johnston , Mark A. Swart
CPC分类号： G02B6/3616 , G02B6/3873 , G02B6/4202 , G02B6/3821
摘要： Optical fiber test probes test the optical functions of light-emitting circuit elements or displays, or are used in optical test fixtures. In one embodiment, an optical fiber test probe comprises an optical fiber in two sections in which both are movable with a receptacle against the bias of a compression spring during testing. One fiber is contained within a removable barrel so it can be replaced by removing it from the receptacle independently of the compression spring. In their operative test position, the two optical fibers are mounted in the receptacle to maintain light-tight optical continuity during testing. In another embodiment, an optical fiber test probe comprises a barrel and an optical fiber contained within a plunger movable in the barrel, in which a free end portion of the optical fiber extends unsupported through a compression spring which applies a spring bias to an internal end of the plunger. The fiber optic probe is isolated from loads imposed on the plunger during repetitive testing with the probe. A further embodiment comprises a fiber optic test having a low compliance, one-piece, spring loaded, molded plastic optical fiber retainer.
摘要翻译： 光纤测试探头测试发光电路元件或显示器的光学功能，或用于光学测试夹具。 在一个实施例中，光纤测试探头包括在两个部分中的光纤，其中两个部分在测试期间可抵抗压缩弹簧的偏压与插座一起移动。 一个纤维被容纳在可移除的桶内，因此可以独立于压缩弹簧将其从容器中取出来进行更换。 在其操作测试位置，两个光纤安装在插座中，以在测试期间保持不透光的光学连续性。 在另一个实施例中，光纤测试探针包括筒体和容纳在可在筒体内移动的柱塞内的光纤，其中光纤的自由端部分通过压缩弹簧而不支撑，该弹簧将弹簧偏压施加到内部端 的柱塞。 光纤探头与使用探头进行重复测试时与施加在柱塞上的负载隔离。 另一实施例包括具有低顺应性，单件式，弹簧加载的模制塑料光纤保持器的光纤测试。
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公开(公告)号：US5557211A
公开(公告)日：1996-09-17
申请号：US462229
申请日：1995-06-05
CPC分类号： G01R1/07328
摘要： A test fixture for testing circuit boards has a vacuum chamber between a stationary probe plate and a movable top plate. Separate adjustable linear bearings located in quadrants of the fixture provide parallel alignment between the top plate and the probe plate. A continuous vacuum seal between the probe plate and top plate bypasses the bearings so the bearings are outside the vacuum area. Spring loaded test probes in the probe plate extend through holes in the top plate for access to a circuit board under test. The probes contact the board when the top plate moves down toward the probes under a vacuum. The top plate is secured to the probe plate by separate quick-release latch pins extending through the linear bearings. The moving top plate carries fixed tooling pins for mounting the board to the top plate. Movable bearing blocks support the bearings. The top plate is movable for aligning the board with the test probes. The top plate, latch pins, bearings and bearing blocks are movable as a unit relative to the probe plate. After the top plate is aligned with the probes to compensate for art shift among circuit board lots, the quick-release latches are engaged to retain the alignment. The latches can comprise part of a guide post assembly for guiding vertical travel of the top plate during vacuum cycling of the test fixture. An optical alignment system in combination with the movable bearings provides a quick and easy means of aligning the board and the probes with extremely high accuracy.
摘要翻译： 用于测试电路板的测试夹具在固定探针板和可移动顶板之间具有真空室。 位于夹具象限中的可分离的可调直线轴承提供顶板和探针板之间的平行对准。 探头板和顶板之间的连续真空密封件绕过轴承，因此轴承位于真空区域之外。 探针板中的弹簧加载的测试探针延伸穿过顶板中的孔，用于进入被测电路板。 当顶板在真空下向下移动探针时，探针接触板。 顶板通过延伸穿过直线轴承的单独的快速释放闩锁销固定到探针板上。 移动的顶板承载用于将板安装到顶板的固定工具销。 可移动轴承座支撑轴承。 顶板可移动以使板与测试探针对准。 顶板，闩锁销，轴承和轴承座可作为相对于探针板的单元移动。 在顶板与探针对准以补偿电路板批次之间的技术偏移之后，快速释放闩锁被接合以保持对准。 闩锁可以包括用于在测试夹具的真空循环期间引导顶板的垂直行进的导柱组件的一部分。 与可移动轴承结合的光学对准系统提供了一种快速且简便的方法，可以极高的精度对准电路板和探头。
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