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Patent Agency Ranking
公开(公告)号：US20240045754A1
公开(公告)日：2024-02-08
申请号：US17880155
申请日：2022-08-03
Applicant: Micron Technology, Inc.
Inventor： Lei Zhang , Francis Chee Khai Chew , Michael Miller
CPC classification number: G06F11/0793 , G06N5/022 , G06F11/073
Abstract: A processing device in a memory sub-system identifies a set of parameters associated with one or more errors detected with respect to a memory device of a memory sub-system. A vector representing the set of parameters is generated. Based on the vector, a classification value corresponding to the one or more errors is generated. Based on the classification value, a set of error recovery operations is selected from a plurality of sets of error recovery operations, and the set of error recovery operations is executed.
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2.发明授权公开(公告)号：US11024394B2
公开(公告)日：2021-06-01
申请号：US16844269
申请日：2020-04-09
Applicant: Micron Technology, Inc.
Inventor： Harish Singidi , Kishore Muchherla , Ashutosh Malshe , Vamsi Rayaprolu , Sampath Ratnam , Renato Padilla, Jr. , Michael Miller
Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
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3.发明申请公开(公告)号：US20200234775A1
公开(公告)日：2020-07-23
申请号：US16844269
申请日：2020-04-09
Applicant: Micron Technology, Inc.
Inventor： Harish Singidi , Kishore Muchherla , Ashutosh Malshe , Vamsi Rayaprolu , Sampath Ratnam , Renato Padilla, JR. , Michael Miller
Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
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公开(公告)号：US12197277B2
公开(公告)日：2025-01-14
申请号：US17880155
申请日：2022-08-03
Applicant: Micron Technology, Inc.
Inventor： Lei Zhang , Francis Chee Khai Chew , Michael Miller
Abstract: A processing device in a memory sub-system identifies a set of parameters associated with one or more errors detected with respect to a memory device of a memory sub-system. A vector representing the set of parameters is generated. Based on the vector, a classification value corresponding to the one or more errors is generated. Based on the classification value, a set of error recovery operations is selected from a plurality of sets of error recovery operations, and the set of error recovery operations is executed.
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5.发明授权公开(公告)号：US10658047B1
公开(公告)日：2020-05-19
申请号：US16177193
申请日：2018-10-31
Applicant: Micron Technology, Inc.
Inventor： Harish Singidi , Kishore Muchherla , Ashutosh Malshe , Vamsi Rayaprolu , Sampath Ratnam , Renato Padilla, Jr. , Michael Miller
Abstract: A memory sub-system can be determined to be operating within a target operating characteristic based on a threshold success rate associated with error control operations using a particular parameter. Upon determining that the memory sub-system is operating within the target operating characteristic, a sticky read mode is entered by performing subsequent read operations using the particular parameter. It is determined that additional error control operations are triggered for at least a first threshold number of read operations using the particular parameter during the sticky read mode. Upon determining that the additional error control operations are triggered for at least the first threshold number of read operations using the particular parameter during the sticky read mode, the sticky read mode is exited by performing further read operations using a default parameter associated with the memory sub-system.
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