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公开(公告)号:US20220293184A1
公开(公告)日:2022-09-15
申请号:US17200607
申请日:2021-03-12
Applicant: Micron Technology, Inc.
Inventor: Pitamber SHUKLA , Giuseppina PUZZILLI , Niccolo' RIGHETTI , Scott A. STOLLER , Priya VENKATARAMAN
Abstract: A method and system for temperature-dependent operations in a memory device are described. Temperature measurements of a memory device are recorded. A determination that a temperature measurement of the memory device satisfies a threshold temperature value is performed. In response to the determination, execution of a background operation in the memory device is delayed, and host system operation(s) continue to be executed in the memory device while execution of the background operation is delayed.
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公开(公告)号:US20240071506A1
公开(公告)日:2024-02-29
申请号:US17823191
申请日:2022-08-30
Applicant: Micron Technology, Inc.
Inventor: Zhongguang XU , Murong LANG , Zhenming ZHOU , Ugo RUSSO , Niccolo' RIGHETTI , Nicola CIOCCHINI
CPC classification number: G11C16/102 , G11C16/08 , G11C16/16 , G11C16/28
Abstract: A memory device may include a memory and a controller. The controller may be configured to receive a read command associated with a block of the memory. The controller may be configured to determine a block type associated with the block. The controller may be configured to identify, based on the block type, one or more read voltage offsets for a read operation associated with the block. The controller may be configured to perform the read operation based on the one or more read voltage offsets.
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