Level shifter with dynamic bias technique under overstress voltage
    1.
    发明授权
    Level shifter with dynamic bias technique under overstress voltage 有权
    在超应力电压下具有动态偏置技术的电平移位器

    公开(公告)号:US09537489B1

    公开(公告)日:2017-01-03

    申请号:US15135530

    申请日:2016-04-21

    Inventor: Po-Yao Ko

    CPC classification number: H03K19/018521 H03K3/356182

    Abstract: A level shifter for converting a first voltage range to a second voltage range includes a latch circuit, a stack device and a dynamic bias circuit. The latch circuit is used for outputting the second voltage range. The stack device, coupled to the latch circuit, includes a stack transistor, which is used for sustaining the second voltage range of the latch circuit. The dynamic bias circuit, coupled to the stack device, is used for turning on the stack transistor to toggle the latch circuit.

    Abstract translation: 用于将第一电压范围转换为第二电压范围的电平移位器包括锁存电路,堆叠装置和动态偏置电路。 锁存电路用于输出第二电压范围。 耦合到锁存电路的堆叠装置包括用于维持锁存电路的第二电压范围的堆叠晶体管。 耦合到堆叠装置的动态偏置电路用于接通堆叠晶体管以切换锁存电路。

    Data receiver and controller for DDR memory

    公开(公告)号:US10163465B1

    公开(公告)日:2018-12-25

    申请号:US15680216

    申请日:2017-08-18

    Abstract: A data receiver for a double data rate (DDR) memory includes a first stage circuit and a second stage circuit. The first stage circuit is deployed for receiving a single-ended signal from the DDR memory and converting the single-ended signal into a pair of differential signals. The second stage circuit, coupled to the first stage circuit, is deployed for receiving the differential signals from the first stage circuit and converting the differential signals into an output signal. Both of the first stage circuit and the second stage circuit are implemented in a core voltage domain.

    DUTY CYCLE CALIBRATION CIRCUIT AND FREQUENCY SYNTHESIZER USING THE SAME

    公开(公告)号:US20180302073A1

    公开(公告)日:2018-10-18

    申请号:US15488545

    申请日:2017-04-17

    Abstract: A duty cycle calibration circuit and a frequency synthesizer using the same are provided. The duty cycle calibration circuit includes a single-ended correction circuit and a single-ended detection circuit. The single-ended correction circuit is configured to adjust a duty cycle of an input clock signal. The single-ended correction circuit includes a first slew rate controller, a second slew rate controller, and at least one logic gate. The first slew rate controller adjusts a rising slew rate of an output clock signal in response to a control signal. The second slew rate controller adjusts a falling slew rate of the output clock signal in response to the control signal. The single-ended detection circuit is configured to detect a duty cycle of the output clock signal by converting the duty cycle of the output clock signal to an average voltage to be served as the control signal.

    Resistor calibration system
    4.
    发明授权

    公开(公告)号:US09825613B1

    公开(公告)日:2017-11-21

    申请号:US15585174

    申请日:2017-05-03

    Inventor: Po-Yao Ko

    CPC classification number: H03K5/24 G01R35/005

    Abstract: A resistor calibration system includes a reference resistor, a first control circuit, a second control circuit, a comparator, a multiplexer and a de-multiplexer. The first control circuit calibrates a first resistor and a duplicated first resistor. The second control circuit calibrates a second resistor. The comparator includes a first input terminal receiving a reference voltage, a second input terminal and an output terminal. The multiplexer includes a first input terminal coupled to the reference resistor and the first resistor, a second input terminal coupled to the duplicated first resistor and the second resistor, and an output terminal coupled to the second input terminal of the comparator. The de-multiplexer includes an input terminal coupled to the output terminal of the comparator, a first output terminal coupled to the first control circuit, and a second output terminal coupled to the second control circuit.

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