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1.发明申请公开(公告)号：US20230063843A1
公开(公告)日：2023-03-02
申请号：US17796822
申请日：2021-02-01
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Derek Decker , David Grigg
Abstract: A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
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公开(公告)号：US11480518B2
公开(公告)日：2022-10-25
申请号：US16702094
申请日：2019-12-03
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , David Grigg , Derek Decker
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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Patent Agency Ranking
公开(公告)号：US20210164894A1
公开(公告)日：2021-06-03
申请号：US16702094
申请日：2019-12-03
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , David Grigg , Derek Decker
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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4.发明公开公开(公告)号：US20240353324A1
公开(公告)日：2024-10-24
申请号：US18300858
申请日：2023-04-14
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Derek Decker , David Grigg
IPC: G01N21/3563
CPC classification number: G01N21/3563
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.
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公开(公告)号：US20240044782A1
公开(公告)日：2024-02-08
申请号：US18452023
申请日：2023-08-18
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , David Grigg , Derek Decker
CPC classification number: G01N21/35 , G02B21/002 , G01J3/45
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号：US11774354B2
公开(公告)日：2023-10-03
申请号：US17955131
申请日：2022-09-28
Applicant: Photothermal Spectroscopy Corp
Inventor： Craig Prater , David Grigg , Derek Decker
CPC classification number: G01N21/35 , G01J3/45 , G02B21/002
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号：US20230236118A1
公开(公告)日：2023-07-27
申请号：US17955131
申请日：2022-09-28
Applicant: Photothermal Spectroscopy Corp
Inventor： Craig Prater , David Grigg , Derek Decker
CPC classification number: G01N21/35 , G02B21/002 , G01J3/45
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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