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公开(公告)号：US20250003865A1
公开(公告)日：2025-01-02
申请号：US18886739
申请日：2024-09-16
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US20230236112A1
公开(公告)日：2023-07-27
申请号：US18162385
申请日：2023-01-31
Applicant: Photothermal Spectroscopy Corp
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
CPC classification number: G01N21/171 , G01J3/2823 , G01J3/427 , G01J3/4406 , G01J3/4412 , G01N21/6458 , G01N21/65 , G01N2021/1714
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US10969405B2
公开(公告)日：2021-04-06
申请号：US15826147
申请日：2017-11-29
Applicant: Photothermal Spectroscopy Corp.
Inventor： Roshan Shetty , Kevin Kjoller , Craig Prater
IPC: G01N21/17 , G01N21/31 , G01N21/65 , G01Q30/02 , G01N21/3563
Abstract: Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 μm or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip. The methods and apparatus also include the ability to analyze light reflected/scattered from the sample via a Raman spectrometer for complementary analysis by Raman spectroscopy. Using a UV/vis source or IR source at higher intensity it is possible to thermally desorb material from a sample for analysis by mass spectrometry. The AFM tip can also be heated to desorb material for mass spec analysis at even higher spatial resolution.
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公开(公告)号：US20190120753A1
公开(公告)日：2019-04-25
申请号：US16155089
申请日：2018-10-09
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
IPC: G01N21/35 , G01N21/65 , G01N21/59 , G01N21/552 , G01N23/20091 , G01N23/207 , H01J49/26 , H01J37/26
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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5.发明公开公开(公告)号：US20240280477A1
公开(公告)日：2024-08-22
申请号：US18171161
申请日：2023-02-17
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller
IPC: G01N21/35 , G06T5/50 , G06V10/141 , H04N23/20
CPC classification number: G01N21/35 , G06T5/50 , G06V10/141 , H04N23/20 , G06T2207/10024 , G06T2207/10048 , G06T2207/20221
Abstract: Methods described herein provide improvements on composite infrared absorption imaging. Scanning patterns described herein reduce erroneous measurements caused by thermal drift, as well as optical interference that occurs between light scattering from the top surface of the sample and light scattering from an underlying substrate.
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Patent Agency Ranking
公开(公告)号：US20220065772A1
公开(公告)日：2022-03-03
申请号：US17316453
申请日：2021-05-10
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US10942116B2
公开(公告)日：2021-03-09
申请号：US16155089
申请日：2018-10-09
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
IPC: G01N21/35 , G01N21/65 , G01N21/59 , H01J37/26 , G01N23/20091 , G01N23/207 , G01N21/552 , G01N21/17 , G01N21/3563 , H01J49/26 , G01N21/47 , G01N21/64
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US20200025677A1
公开(公告)日：2020-01-23
申请号：US16465824
申请日：2017-11-29
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US12209950B2
公开(公告)日：2025-01-28
申请号：US18162385
申请日：2023-01-31
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US11680892B2
公开(公告)日：2023-06-20
申请号：US17316453
申请日：2021-05-10
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
CPC classification number: G01N21/171 , G01J3/2823 , G01J3/427 , G01J3/4406 , G01J3/4412 , G01N21/6458 , G01N21/65 , G01N2021/1714
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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