公开(公告)号：US20230305055A1

公开(公告)日：2023-09-28

申请号：US18164256

申请日：2023-02-03

Applicant: Samsung Electronics Co., Ltd.

Inventor： Bumsuk Chung ,  Hyungseok Kang ,  Kyewan Park ,  Sungbo Shim ,  Sanghyun Ahn ,  Inkap Chang ,  Minho Jeong

IPC: G01R31/28

CPC classification number: G01R31/2896

Abstract: A method of testing a semiconductor device includes obtaining first data generated by testing wafers, each including a plurality of chips, the obtaining based on a plurality of first items, obtaining second data generated by testing packages, each including a packaged chip, the obtaining based on a plurality of second items, detecting correlations between the plurality of first items and the plurality of second items, based on the first data and the second data, identifying at least one first item affecting variation of the packages, based on the correlations, and testing the identified at least one first item.

公开(公告)号：US10778617B2

公开(公告)日：2020-09-15

申请号：US14832518

申请日：2015-08-21

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jongmin Kim ,  Busic Koag ,  Sanghyun Ahn ,  Hoyong Choi ,  Jongwu Baek ,  Yonghoon Choi ,  Sangduk Hwangbo ,  Minho Kim ,  Yeunwook Lim

IPC: G06F3/048 ,  H04L12/58 ,  G06F3/0488 ,  G06F3/0482

Abstract: A method for executing a function of an electronic device is provided. The method includes identifying data of a first application, determining at least one second application in response to a user event and identifying an attribute of each of the at least one second application, and processing the data of the first application based on the attributes of the each of the at least one second application to execute a function related to at least one second application.