公开(公告)号：US20170162238A1

公开(公告)日：2017-06-08

申请号：US15295571

申请日：2016-10-17

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hyunui LEE ,  Won-joo YUN ,  Hye-seung YU ,  In-dal SONG

IPC: G11C7/12 ,  G06F3/06 ,  G11C29/12 ,  G11C7/22 ,  G11C8/14 ,  G11C8/08

CPC classification number: G11C7/12 ,  G06F3/0608 ,  G06F3/0652 ,  G06F3/0656 ,  G06F3/0673 ,  G06F13/4086 ,  G11C7/02 ,  G11C7/1057 ,  G11C7/1084 ,  G11C7/22 ,  G11C8/08 ,  G11C8/14 ,  G11C29/021 ,  G11C29/022 ,  G11C29/028 ,  G11C29/12 ,  G11C29/12005 ,  G11C29/1201 ,  G11C29/56012 ,  G11C2029/5602 ,  G11C2207/105

Abstract: Provided is a memory device configured to perform a calibration operation without having a ZQ pin. The memory device includes a calibration circuit configured to generate a pull-up calibration code and a pull-down calibration code which termination of a data input/output pad for impedance matching in the data input/output pad is controlled. The calibration circuit performs a first calibration operation for trimming first and second reference resistors based on an external resistor to be connected to a pad, and a second calibration operation for generating the pull-up calibration code and the pull-down calibration code based on the trimmed second reference resistor.