公开(公告)号：US20240003932A1

公开(公告)日：2024-01-04

申请号：US18343077

申请日：2023-06-28

Applicant: SEIKO EPSON CORPORATION

Inventor： Keita KUBO ,  Chikara KOJIMA ,  Mitsuru MIYASAKA ,  Yoshio ARAI ,  Hiroto TOMIOKA

IPC: G01P5/24 ,  G01N1/20 ,  C02F1/36 ,  C02F1/00 ,  B01D21/28 ,  B01D21/34

CPC classification number: G01P5/241 ,  G01N1/2035 ,  C02F1/36 ,  C02F1/008 ,  B01D21/283 ,  B01D21/34 ,  C02F2209/40

Abstract: A fluid device 10 includes: a flow path 20 through which a fluid containing a fine particle flows; an ultrasonic transmitter 60 configured to transmit an ultrasonic wave to the fluid in the flow path 20 in response to an input of a drive signal; a flow velocity measurement unit 40 configured to measure a flow velocity of the fluid in the flow path 20; and a controller 70 configured to control the ultrasonic transmitter 60. The controller 70 sets an amplitude of the drive signal according to a measured flow velocity that is a flow velocity measured by the flow velocity measurement unit 40, and inputs the drive signal having the set amplitude to the ultrasonic transmitter 60.

公开(公告)号：US20140361178A1

公开(公告)日：2014-12-11

申请号：US14296248

申请日：2014-06-04

Applicant: SEIKO EPSON CORPORATION

Inventor： Hiroto TOMIOKA

IPC: G01J5/10

CPC classification number: G01J5/10 ,  G01J5/0853 ,  G01J5/34

Abstract: A terahertz wave detecting device includes: a substrate; and a plurality of detection elements that is arranged above the substrate, wherein the detection element includes an absorbing section that absorbs a terahertz wave to generate heat, and a converting section that converts the heat generated in the absorbing section into an electric signal, wherein the absorbing section includes a dielectric layer, a first metal layer that is provided on a surface of the dielectric layer, and a second metal layer that is provided on the other surface of the dielectric layer, and wherein the plurality of detection elements is arranged so that the terahertz wave that is diffracted between the adjacent absorbing sections is incident onto the dielectric layer.

Abstract translation: 太赫波检测装置包括：基板; 以及多个检测元件，其布置在所述基板上方，其中所述检测元件包括吸收太赫兹波以产生热量的吸收部分，以及将所述吸收部分中产生的热量转换为电信号的转换部分，其中， 吸收部分包括电介质层，设置在电介质层的表面上的第一金属层和设置在电介质层的另一个表面上的第二金属层，并且其中多个检测元件被布置成使得 在相邻的吸收部之间衍射的太赫波入射到电介质层上。

公开(公告)号：US20230234375A1

公开(公告)日：2023-07-27

申请号：US18100587

申请日：2023-01-24

Applicant: SEIKO EPSON CORPORATION

Inventor： Hiroto TOMIOKA

IPC: B41J11/00

CPC classification number: B41J11/0024

Abstract: A dielectric heating apparatus includes: a conveyance unit configured to convey an object to be heated; an electrode unit including a first electrode and a second electrode which face the object to be heated, that is conveyed in a first direction, in a second direction intersecting the first direction and which are applied with an alternating current voltage; and a metal first cover unit configured to surround the electrode unit. The first cover unit includes a first insertion port through which the object to be heated is inserted into the first cover unit, a first feed-out port through which the object to be heated is fed out of the first cover unit, and a plurality of first opening portions that are different from the first insertion port and the first feed-out port.

公开(公告)号：US20190393677A1

公开(公告)日：2019-12-26

申请号：US16451199

申请日：2019-06-25

Applicant: Seiko Epson Corporation

Inventor： Hiroto TOMIOKA

IPC: H01S5/18 ,  H01S5/028 ,  H01L33/00

Abstract: A surface emitting laser includes a semiconductor substrate, a resonance portion that is disposed over the semiconductor substrate and that emits light, an insulating layer disposed in a side face of the resonance portion, and a coating film covering the resonance portion and the insulating layer, wherein a portion disposed in a side face of the insulating layer of the coating film is constituted by an atomic layer deposition film.

公开(公告)号：US20170307419A1

公开(公告)日：2017-10-26

申请号：US15493817

申请日：2017-04-21

Applicant: Seiko Epson Corporation

Inventor： Hiroto TOMIOKA ,  Tetsuo NISHIDA

IPC: G01D5/347 ,  B25J13/08 ,  H01S5/183

CPC classification number: G01D5/3473 ,  B25J13/088 ,  G01D5/345 ,  H01S5/0264 ,  H01S5/0425 ,  H01S5/18311 ,  H01S5/18355 ,  H01S5/34313 ,  H01S5/423 ,  H01S2301/176

Abstract: An encoder includes an optical scale that is so provided as to be pivotable around a pivotal axis and includes a polarizing portion having a polarization characteristic, a light outputting portion that outputs linearly polarized light toward the polarizing portion, and a light detecting portion that detects the linearly polarized light from the optical scale. The light outputting portion includes a vertical cavity surface emitting laser, and light emitted from the vertical cavity surface emitting laser spreads at an angle greater than or equal to 5° but smaller than or equal to 20°.

公开(公告)号：US20140252231A1

公开(公告)日：2014-09-11

申请号：US14201542

申请日：2014-03-07

Applicant: SEIKO EPSON CORPORATION

Inventor： Hiroto TOMIOKA ,  Satoshi TAKENAKA

IPC: G01N21/89

CPC classification number: G01N21/89 ,  G01N21/3581 ,  G01N21/9508

Abstract: A specimen inspection apparatus includes: a terahertz wave generation unit which generates a terahertz wave; a transportation unit which includes a transportation surface on which specimens as inspection objects are loaded and is configured so as to transport the specimens in an in-plane direction of the transportation surface; an irradiation direction changing unit which changes an irradiation direction of a terahertz wave which is emitted from the terahertz wave generation unit and is emitted to the specimens loaded on the transportation surface; and a terahertz wave detection unit which detects a terahertz wave which is emitted to the specimens loaded on the transportation surface to transmit therethrough or be reflected thereby, wherein the irradiation direction changing unit changes the irradiation direction by changing a position of the terahertz wave generation unit.

Abstract translation: 样本检查装置包括：产生太赫兹波的太赫兹波生成单元; 运输单元，其包括输送表面，在该输送表面上加载作为检查对象的样本，并且被构造成沿所述输送表面的面内方向输送所述样本; 照射方向改变单元，其改变从太赫兹波发生单元发射并发射到装载在运送表面上的样本的太赫兹波的照射方向; 以及太赫兹波检测单元，其检测发射到装载在所述输送面上的试样的太赫兹波，以将其传输通过或由其反射，其中所述照射方向改变单元通过改变所述太赫兹波产生单元的位置来改变所述照射方向 。

公开(公告)号：US20240278155A1

公开(公告)日：2024-08-22

申请号：US18443341

申请日：2024-02-16

Applicant: SEIKO EPSON CORPORATION

Inventor： Chikara KOJIMA ,  Yoshio ARAI ,  Keita KUBO ,  Hiroto TOMIOKA

IPC: B01D43/00 ,  B06B1/02

CPC classification number: B01D43/00 ,  B06B1/023 ,  B06B2201/55 ,  B06B2201/70

Abstract: A fluid device includes a chamber that is provided with an inlet and an outlet opened at different positions on an X axis and is formed with a flow path space in which a fluid is caused to flow from the inlet to the outlet, a first ultrasonic element configured to generate a standing wave in a direction along an X axis in the fluid in the chamber, a driver configured to drive the first ultrasonic element, and a drive controller configured to control the driver such that a drive voltage applied to the first ultrasonic element is reduced over time.

公开(公告)号：US20220305809A1

公开(公告)日：2022-09-29

申请号：US17655666

申请日：2022-03-21

Applicant: Seiko Epson Corporation

Inventor： Tadashi AIZAWA ,  Hiroto TOMIOKA

IPC: B41J11/00 ,  B41J3/407

Abstract: A printing apparatus 1 includes a pretreatment unit 4 that applies a processing liquid containing a polar material to a fabric M, a printing unit 5 that applies ink containing a color material to the fabric M applied with the processing liquid, and an AC electric field generator 62 that generates an AC electric field. The AC electric field generator 62 includes a first electrodes 71 and a second electrode 72 that face the fabric M and that are disposed adjacent to each other, a high-frequency voltage generator 77 that generates a high-frequency voltage to be applied to the first electrodes 71 and the second electrode 72, and a conductors 73 that electrically connects the first electrodes 71 and the second electrode 72 to the high-frequency voltage generator 77.

公开(公告)号：US20140361169A1

公开(公告)日：2014-12-11

申请号：US14296211

申请日：2014-06-04

Applicant: SEIKO EPSON CORPORATION

Inventor： Hiroto TOMIOKA

IPC: G01J5/34

CPC classification number: G01J5/34 ,  G01J5/046 ,  G01J5/0853

Abstract: A terahertz wave detecting device includes: a substrate; and a plurality of detection elements that is arranged above the substrate, wherein the detection element includes a first metal layer that is provided on the substrate, an absorbing section that is provided to be spaced from the first metal layer and absorbs a terahertz wave to generate heat, and a converting section that includes a second metal layer, a pyroelectric layer and a third metal layer layered on the absorbing section on a side opposite to the first metal layer, and converts the heat generated in the absorbing section into an electric signal.

Abstract translation: 太赫波检测装置包括：基板; 以及布置在所述基板上方的多个检测元件，其中所述检测元件包括设置在所述基板上的第一金属层，设置成与所述第一金属层间隔开并吸收太赫兹波以产生的吸收部 热和转换部分，其包括在与第一金属层相对的一侧层叠在吸收部分上的第二金属层，热电层和第三金属层，并将吸收部分中产生的热量转换为电信号。

公开(公告)号：US20130099118A1

公开(公告)日：2013-04-25

申请号：US13656809

申请日：2012-10-22

Applicant: Seiko Epson Corporation

Inventor： Hiroto TOMIOKA

IPC: G01J5/08 ,  G01J5/10

CPC classification number: G01J5/0862 ,  G01J3/42 ,  G01J5/0853 ,  G01J2003/1213

Abstract: A terahertz wave detecting device includes a wavelength filter and a detection part. The wavelength filter is configured to convert terahertz waves to heat. The detection part is configured to detect the heat converted by the wavelength filter. The wavelength filter includes a wavelength selection layer and a terahertz wave absorption layer. The wavelength selection layer is configured to transmit terahertz waves of a prescribed wavelength among the terahertz waves. The terahertz wave absorption layer is provided in contact with the wavelength selection layer and the detection part, and contains a material for absorbing the terahertz waves of the prescribed wavelength.

Abstract translation: 太赫波检测装置包括波长滤波器和检测部。 波长滤波器被配置为将太赫兹波转换成热。 检测部被配置为检测由波长滤波器转换的热量。 波长滤波器包括波长选择层和太赫兹波吸收层。 波长选择层被配置为在太赫兹波之间传输规定波长的太赫兹波。 提供与波长选择层和检测部分接触的太赫兹波吸收层，并且包含用于吸收规定波长的太赫兹波的材料。