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公开(公告)号:US11467192B2
公开(公告)日:2022-10-11
申请号:US17069560
申请日:2020-10-13
Applicant: Texas Instruments Incorporated
Inventor: Vijay Krishnamurthy , Abidur Rahman , Min Chu , Sualp Aras
IPC: G01R19/10 , H01L29/78 , G01R19/00 , H03K17/16 , H01L29/735 , H01L27/088 , H01L29/06 , H01L21/8234
Abstract: A microelectronic device has a common terminal transistor with two or more channels, and sense transistors in corresponding areas of the channels. The channels and the sense transistors share a common node in a semiconductor substrate. The sense transistors are configured to provide sense currents that are representative of currents through the corresponding channels. The sense transistors are located so that a ratio of the channel currents to the corresponding sense currents is less than a target value of cross-talk. The microelectronic device may be implemented without a compensation circuit which provides a compensation signal used to adjust one or more of the sense currents to reduce cross-talk. A method of forming the microelectronic device, including estimating a potential distribution in the semiconductor substrate containing the common node of the common terminal transistor, and selecting locations for the sense transistors based on the estimated potential distribution, is disclosed.
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公开(公告)号:US20210025925A1
公开(公告)日:2021-01-28
申请号:US17069560
申请日:2020-10-13
Applicant: Texas Instruments Incorporated
Inventor: Vijay Krishnamurthy , Abidur Rahman , Min Chu , Sualp Aras
IPC: G01R19/10 , H01L29/78 , G01R19/00 , H03K17/16 , H01L29/735 , H01L27/088 , H01L29/06 , H01L21/8234
Abstract: A microelectronic device has a common terminal transistor with two or more channels, and sense transistors in corresponding areas of the channels. The channels and the sense transistors share a common node in a semiconductor substrate. The sense transistors are configured to provide sense currents that are representative of currents through the corresponding channels. The sense transistors are located so that a ratio of the channel currents to the corresponding sense currents is less than a target value of cross-talk. The microelectronic device may be implemented without a compensation circuit which provides a compensation signal used to adjust one or more of the sense currents to reduce cross-talk. A method of forming the microelectronic device, including estimating a potential distribution in the semiconductor substrate containing the common node of the common terminal transistor, and selecting locations for the sense transistors based on the estimated potential distribution, is disclosed.
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公开(公告)号:US10679938B2
公开(公告)日:2020-06-09
申请号:US16050383
申请日:2018-07-31
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Kuntal Joardar , Min Chu , Vijay Krishnamurthy , Tikno Harjono , Ankur Chauhan , Vinayak Hegde , Manish Srivastava
IPC: G11C17/00 , H01L23/525 , G11C17/16 , H01L27/112
Abstract: An electronic device comprises a first semiconductor die; a power transistor integrated in the first semiconductor die, the power transistor comprising a first gate, a first terminal, and a second terminal; a first sense transistor integrated in the first semiconductor die, the first sense transistor comprising a second gate and third and fourth terminals, the second gate coupled to the first gate and the fourth terminal coupled to the second terminal; a first resistor integrated in the first semiconductor die, the first resistor has a first temperature coefficient; a second sense transistor integrated in the first semiconductor die, the second sense transistor comprising a third gate and seventh and eighth terminals, the third gate coupled to the first gate and the eighth terminal coupled to the second terminal; and a second resistor integrated in the first semiconductor die, the second resistor has a second temperature coefficient.
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公开(公告)号:US10670638B2
公开(公告)日:2020-06-02
申请号:US15947389
申请日:2018-04-06
Applicant: Texas Instruments Incorporated
Inventor: Vijay Krishnamurthy , Abidur Rahman , Min Chu , Sualp Aras
IPC: G01R19/10 , H01L29/78 , G01R19/00 , H03K17/16 , H01L29/735 , H01L27/088 , H01L29/06 , H01L21/8234
Abstract: A microelectronic device has a common terminal transistor with two or more channels, and sense transistors in corresponding areas of the channels. The channels and the sense transistors share a common node in a semiconductor substrate. The sense transistors are configured to provide sense currents that are representative of currents through the corresponding channels. The sense transistors are located so that a ratio of the channel currents to the corresponding sense currents have less than a target value of cross-talk. The microelectronic device may be implemented without a compensation circuit which provides a compensation signal used to adjust one or more of the sense currents to reduce cross-talk. A method of forming the microelectronic device, including estimating a potential distribution in the semiconductor substrate containing the common node of the common terminal transistor, and selecting locations for the sense transistors based on the estimated potential distribution, is disclosed.
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公开(公告)号:US20200174045A1
公开(公告)日:2020-06-04
申请号:US16783436
申请日:2020-02-06
Applicant: Texas Instruments Incorporated
Inventor: Vijay Krishnamurthy , Abidur Rahman , Min Chu , Sualp Aras
IPC: G01R19/10 , H01L29/78 , G01R19/00 , H03K17/16 , H01L29/735 , H01L27/088 , H01L29/06 , H01L21/8234
Abstract: A microelectronic device has a common terminal transistor with two or more channels, and sense transistors in corresponding areas of the channels. The channels and the sense transistors share a common node in a semiconductor substrate. The sense transistors are configured to provide sense currents that are representative of currents through the corresponding channels. The sense transistors are located so that a ratio of the channel currents to the corresponding sense currents have less than a target value of cross-talk. The microelectronic device may be implemented without a compensation circuit which provides a compensation signal used to adjust one or more of the sense currents to reduce cross-talk. A method of forming the microelectronic device, including estimating a potential distribution in the semiconductor substrate containing the common node of the common terminal transistor, and selecting locations for the sense transistors based on the estimated potential distribution, is disclosed.
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公开(公告)号:US10422818B2
公开(公告)日:2019-09-24
申请号:US15859470
申请日:2017-12-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Tikno Harjono , Vijay Krishnamurthy , Min Chu , Kuntal Joardar , Gary Eugene Daum , Subrato Roy , Vinayak Hegde , Ankur Chauhan , Sathish Vallamkonda , Md Abidur Rahman , Eung Jung Kim
IPC: G01R15/14 , H01L27/06 , H03K17/567 , H01L25/18 , H01L49/02
Abstract: An electronic device comprises: a first semiconductor die; a power transistor integrated in the first semiconductor die, the power transistor comprising a gate, a first terminal, and a second terminal; a sense transistor integrated in the first semiconductor die, the sense transistor comprising a gate coupled to the gate of the power transistor, a first terminal, and a second terminal coupled to the second terminal of the power transistor; and a first resistor integrated in the first semiconductor die, the first resistor comprising a polysilicon section and a metal section coupled to the polysilicon section, the first resistor comprising a first terminal and a second terminal, wherein the first terminal of the first resistor is coupled to the first terminal of the sense transistor.
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公开(公告)号:US11152341B2
公开(公告)日:2021-10-19
申请号:US16460870
申请日:2019-07-02
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Kuntal Joardar , Min Chu , Vijay Krishnamurthy , Tikno Harjono
IPC: H01L25/07 , H01L25/16 , G01R31/28 , G11C11/4074 , H01L29/66
Abstract: In some examples, an integrated circuit includes a plurality of power modules formed on a substrate, including a first power module located between second and third power modules. The first power module is configured to conduct a load current, and includes a power transistor and first and second sense transistors. The first sense transistor is disposed at a first position between the second power module and a central axis of the first power module, and the second sense transistor is disposed at a second position between the third power module and the central axis. The first sense transistor is configured to conduct a first sense current; and the second sense transistor is configured to conduct a second sense current. The first and second sense transistors are configured to direct the first and second sense currents toward a measurement circuit that is configured to determine a derived sense current indicative of the load current.
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公开(公告)号:US20190137546A1
公开(公告)日:2019-05-09
申请号:US15947389
申请日:2018-04-06
Applicant: Texas Instruments Incorporated
Inventor: Vijay Krishnamurthy , Abidur Rahman , Min Chu , Sualp Aras
Abstract: A microelectronic device has a common terminal transistor with two or more channels, and sense transistors in corresponding areas of the channels. The channels and the sense transistors share a common node in a semiconductor substrate. The sense transistors are configured to provide sense currents that are representative of currents through the corresponding channels. The sense transistors are located so that a ratio of the channel currents to the corresponding sense currents have less than a target value of cross-talk. The microelectronic device may be implemented without a compensation circuit which provides a compensation signal used to adjust one or more of the sense currents to reduce cross-talk. A method of forming the microelectronic device, including estimating a potential distribution in the semiconductor substrate containing the common node of the common terminal transistor, and selecting locations for the sense transistors based on the estimated potential distribution, is disclosed.
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