Error sampler circuit
    1.
    发明授权

    公开(公告)号:US11916703B2

    公开(公告)日:2024-02-27

    申请号:US18066027

    申请日:2022-12-14

    CPC classification number: H04L25/03057 H03K3/0372

    Abstract: An error sampler circuit includes a differential input voltage input, a differential reference voltage input, a master latch circuit, and a slave latch circuit. The master latch circuit includes a slicer circuit. The slicer circuit includes a first input, a second input, and a differential output. The first input is coupled to the differential input voltage input. The second input is coupled to the differential reference voltage input. The slave latch includes a differential input coupled to the differential output of the slicer circuit.

    Error sampler circuit
    4.
    发明授权

    公开(公告)号:US11575546B2

    公开(公告)日:2023-02-07

    申请号:US17193067

    申请日:2021-03-05

    Abstract: An error sampler circuit includes a differential input voltage input, a differential reference voltage input, a master latch circuit, and a slave latch circuit. The master latch circuit includes a slicer circuit. The slicer circuit includes a first input, a second input, and a differential output. The first input is coupled to the differential input voltage input. The second input is coupled to the differential reference voltage input. The slave latch includes a differential input coupled to the differential output of the slicer circuit.

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