公开(公告)号：US20200337553A1

公开(公告)日：2020-10-29

申请号：US16855393

申请日：2020-04-22

Applicant: TOPCON CORPORATION

Inventor： Zaixing Mao ,  Zhenguo Wang ,  Bin Cao ,  Kinpui Chan

IPC: A61B3/10 ,  G01B9/02 ,  G01B11/06 ,  A61B3/14 ,  A61B3/00

Abstract: A method for determining thickness of layers of the tear film includes reconstructing a full- or hyper-spectral interference pattern from an imaged multi-spectral pattern. Tear film thickness can then be estimated from the full- or hyper-spectral interference pattern. Using a full- or hyper-spectral interference pattern provides a greater number of frequency sampling points for increased tear film thickness estimation accuracy, without traditional time consuming techniques.

公开(公告)号：US11684253B2

公开(公告)日：2023-06-27

申请号：US16855393

申请日：2020-04-22

Applicant: TOPCON CORPORATION

Inventor： Zaixing Mao ,  Zhenguo Wang ,  Bin Cao ,  Kinpui Chan

IPC: G01J3/45 ,  A61B3/10 ,  A61B3/00 ,  A61B3/14 ,  G01B9/02 ,  G01B11/06

CPC classification number: A61B3/101 ,  A61B3/0025 ,  A61B3/14 ,  G01B9/02041 ,  G01B9/02083 ,  G01B11/06 ,  G01J3/45

Abstract: A method for determining thickness of layers of the tear film includes reconstructing a full- or hyper-spectral interference pattern from an imaged multi-spectral pattern. Tear film thickness can then be estimated from the full- or hyper-spectral interference pattern. Using a full- or hyper-spectral interference pattern provides a greater number of frequency sampling points for increased tear film thickness estimation accuracy, without traditional time consuming techniques.

公开(公告)号：US11614321B2

公开(公告)日：2023-03-28

申请号：US16829673

申请日：2020-03-25

Applicant: TOPCON CORPORATION

Inventor： Jongsik Kim ,  Bin Cao ,  Song Mei ,  Kinpui Chan ,  Zhenguo Wang ,  Zaixing Mao

IPC: G01C1/04 ,  A61B3/10 ,  A61B3/113 ,  A61B3/14 ,  A61B3/12 ,  G01B11/06

Abstract: An interferometric method of identifying the thickness of an object that is too thin to be resolved by a Fourier transform of the interference signal includes applying a harmonic frequency modulation to an envelope of the interference signal. Where the object is a tear film, this method may be utilized to determine a thickness of the lipid layer of the tear film.

公开(公告)号：US20200309510A1

公开(公告)日：2020-10-01

申请号：US16829673

申请日：2020-03-25

Applicant: TOPCON CORPORATION

Inventor： Jongsik Kim ,  Bin Cao ,  Song Mei ,  Kinpui Chan ,  Zhenguo Wang ,  Zaixing Mao

IPC: G01B11/06 ,  A61B3/113 ,  A61B3/10 ,  A61B3/14

Abstract: An interferometric method of identifying the thickness of an object that is too thin to be resolved by a Fourier transform of the interference signal includes applying a harmonic frequency modulation to an envelope of the interference signal. Where the object is a tear film, this method may be utilized to determine a thickness of the lipid layer of the tear film.