公开(公告)号：US10585118B2

公开(公告)日：2020-03-10

申请号：US15721604

申请日：2017-09-29

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman ,  Wayne M. Wilburn

IPC: G01R31/20 ,  G01R1/067 ,  H03H1/02 ,  G01R31/319 ,  G01R1/073

Abstract: Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

公开(公告)号：US20180328961A1

公开(公告)日：2018-11-15

申请号：US15721604

申请日：2017-09-29

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman ,  Wayne M. Wilburn

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/319 ,  H03H1/02

CPC classification number: G01R1/06766 ,  G01R1/06772 ,  G01R1/07328 ,  G01R31/31905 ,  H03H1/02

Abstract: Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

公开(公告)号：US10514394B2

公开(公告)日：2019-12-24

申请号：US15268433

申请日：2016-09-16

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman ,  Wayne M. Wilburn

IPC: G01R1/30 ,  G01R1/067 ,  G01R13/00 ,  G01R1/20

Abstract: A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.

公开(公告)号：US20170248631A1

公开(公告)日：2017-08-31

申请号：US15268433

申请日：2016-09-16

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman ,  Wayne M. Wilburn

IPC: G01R1/30 ,  G01R1/067 ,  G01R13/00

CPC classification number: G01R1/30 ,  G01R1/067 ,  G01R1/06766 ,  G01R1/06788 ,  G01R1/20 ,  G01R13/00

Abstract: A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.