公开(公告)号：US07683647B1

公开(公告)日：2010-03-23

申请号：US12205271

申请日：2008-09-05

申请人： Carl Scharrer ,  Dave Rose ,  Martin J. Rice ,  James A. Niemann ,  William F. Merkel ,  Warren Kumley ,  William Knauer ,  Wayne C. Goeke

发明人： Carl Scharrer ,  Dave Rose ,  Martin J. Rice ,  James A. Niemann ,  William F. Merkel ,  Warren Kumley ,  William Knauer ,  Wayne C. Goeke

IPC分类号： G01R31/02 ,  G01R31/26

CPC分类号： G01R31/2889

摘要： A test head for testing a DUT includes a probe card having a plurality of DUT probes, the probes being in contact with the DUT during the testing; an instrument carrier, the instrument carrier being located above the DUT during the testing; and a SMU mounted on the carrier for each of the probes, each SMU being operably connectable to a respective probe, wherein the carrier is moved with respect to the probe card to permit replacement of the probe card.

摘要翻译： 用于测试DUT的测试头包括具有多个DUT探针的探针卡，在测试期间探针与DUT接触; 仪器载体，仪器载体在测试期间位于DUT的上方; 以及安装在每个探针的载体上的SMU，每个SMU可操作地连接到相应的探针，其中载体相对于探针卡移动以允许更换探针卡。

公开(公告)号：US08717053B2

公开(公告)日：2014-05-06

申请号：US13289382

申请日：2011-11-04

申请人： Wayne C. Goeke ,  William Knauer

发明人： Wayne C. Goeke ,  William Knauer

IPC分类号： G01R31/00 ,  G01R31/02 ,  G01R1/067 ,  G01R1/073 ,  G01R1/18 ,  G01R1/00 ,  G01R31/319 ,  G01R3/00

CPC分类号： G01R1/06766 ,  G01R1/00 ,  G01R1/073 ,  G01R1/18 ,  G01R3/00 ,  G01R31/31926

摘要： A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

摘要翻译： 用于测试DUT的DC-AC探针卡包括：多个探针，每个探针具有用于接触所述DUT的远端; 以及可操作以将测试仪器连接到探针的多个连接通道，其中每个连接通道提供用于AC测量的所需特性阻抗和用于各测试仪器连接件和探针之间的DC测量的保护通路。

公开(公告)号：US20130113511A1

公开(公告)日：2013-05-09

申请号：US13289382

申请日：2011-11-04

申请人： Wayne C. Goeke ,  William Knauer

发明人： Wayne C. Goeke ,  William Knauer

IPC分类号： G01R1/073

CPC分类号： G01R1/06766 ,  G01R1/00 ,  G01R1/073 ,  G01R1/18 ,  G01R3/00 ,  G01R31/31926

摘要： A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

摘要翻译： 用于测试DUT的DC-AC探针卡包括：多个探针，每个探针具有用于接触所述DUT的远端; 以及可操作以将测试仪器连接到探针的多个连接通道，其中每个连接通道提供用于AC测量的所需特性阻抗和用于各测试仪器连接件和探针之间的DC测量的保护通路。

公开(公告)号：US07616088B1

公开(公告)日：2009-11-10

申请号：US11758310

申请日：2007-06-05

申请人： Dan Baker ,  Wayne C. Goeke

发明人： Dan Baker ,  Wayne C. Goeke

IPC分类号： H01F27/28

CPC分类号： H01F30/16 ,  H01F17/0033 ,  H01F27/38 ,  H01F2027/2814

摘要： A toroidal step-up or step-down transformer includes a toroidal magnetic core, a primary formed from a plurality of primary windings, and a secondary formed from a plurality of secondary windings. Parallel connected windings are added to at least one of the primary and secondary to make the number of primary windings equal to the number of secondary windings, the primary and secondary windings being arranged symmetrically around the core.

摘要翻译： 环形升压或降压变压器包括环形磁芯，由多个初级绕组形成的初级和由多个次级绕组形成的次级。 平行连接的绕组被添加到初级和次级中的至少一个，以使初级绕组的数量等于次级绕组的数量，主绕组和次级绕组围绕芯对称地布置。

公开(公告)号：US07614274B1

公开(公告)日：2009-11-10

申请号：US11716430

申请日：2007-03-09

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： G01R17/14

CPC分类号： G01R35/005

摘要： A method for verifying the adjustment of a plurality of measurement instruments includes measuring a first value of an un-verified test value of a parameter with a first measurement instrument; measuring a second value of the same un-verified test value of a parameter with a second measurement instrument; comparing the first value with the second value; and determining an adjustment verification state based on the comparison.

摘要翻译： 用于验证多个测量仪器的调整的方法包括：用第一测量仪器测量未验证的参数测试值的第一值; 用第二测量仪器测量与参数相同的未验证测试值的第二值; 将第一个值与第二个值进行比较; 以及基于所述比较来确定调整验证状态。

公开(公告)号：US20080303535A1

公开(公告)日：2008-12-11

申请号：US11758940

申请日：2007-06-06

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： G01R27/26 ,  G01R27/28

CPC分类号： G01R31/275 ,  G01R19/0023 ,  G01R31/2621

摘要： A method for measuring electrical parameters of a DUT having at least three terminals includes applying a first AC voltage to a first terminal; separately driving a second and a third terminal each to a virtual second AC voltage, each virtual voltage requiring a respective current; and measuring an electrical parameter of the DUT based on the first AC voltage and the second and third terminals each being at the virtual second AC voltage.

摘要翻译： 一种用于测量具有至少三个端子的DUT的电参数的方法包括：向第一端施加第一AC电压; 分别驱动第二和第三端子到虚拟第二AC电压，每个虚拟电压需要相应的电流; 以及基于所述第一AC电压测量所述DUT的电参数，并且所述第二和第三端分别处于所述虚拟的第二AC电压。

公开(公告)号：US07276893B2

公开(公告)日：2007-10-02

申请号：US11067953

申请日：2005-02-28

申请人： John G. Banaska ,  Wayne C. Goeke

发明人： John G. Banaska ,  Wayne C. Goeke

IPC分类号： G01R1/38

CPC分类号： G01R15/09

摘要： A range-changing circuit includes an array of graduated impedances in serial relationship, and a voltage sensing and limiting switch across one of said impedances. The switch limits the voltage across said one of the impedances in response to a voltage sensed by the switch.

摘要翻译： 范围改变电路包括串联关系的分级阻抗阵列，以及横跨所述阻抗之一的电压感测和限制开关。 该开关响应于由开关感测的电压来限制所述阻抗之间的电压。

公开(公告)号：US07202676B2

公开(公告)日：2007-04-10

申请号：US11068120

申请日：2005-02-28

申请人： John G. Banaska ,  Wayne C. Goeke ,  Gregory Sobolewski

发明人： John G. Banaska ,  Wayne C. Goeke ,  Gregory Sobolewski

IPC分类号： G01R27/08

CPC分类号： G01R31/2839

摘要： A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device, an error amplifier selectable to control the controlled current or voltage, the error amplifier providing an error signal for the control, and a floating buffer driving the series combination in response to the error signal.

摘要翻译： 用于交替地控制通过器件的电流并允许测量器件上的电压或控制器件上的电压并允许测量通过器件的电流的电路包括与器件串联组合的检测阻抗，误差放大器可选择 以控制受控电流或电压，误差放大器提供用于控制的误差信号，以及响应于误差信号驱动串联组合的浮动缓冲器。

公开(公告)号：US08810256B1

公开(公告)日：2014-08-19

申请号：US12336896

申请日：2008-12-17

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： G01R31/27

CPC分类号： G01R35/005 ,  G01R27/02

摘要： A method for verifying the adjustment for the purpose of calibration of an impedance meter having at least a first and a second measurement range includes measuring within the first range a first measured value of a test impedance; measuring within the second range a second measured value of the test impedance; and comparing the first and second measured values to verify the calibration of the impedance meter.

摘要翻译： 用于验证用于校准具有至少第一和第二测量范围的阻抗计的目的的调整方法包括在第一范围内测量测试阻抗的第一测量值; 在第二范围内测量测试阻抗的第二测量值; 并比较第一和第二测量值以验证阻抗计的校准。

公开(公告)号：US07872481B1

公开(公告)日：2011-01-18

申请号：US12113391

申请日：2008-05-01

申请人： Wayne C. Goeke ,  Martin J. Rice

发明人： Wayne C. Goeke ,  Martin J. Rice

IPC分类号： G01R31/302

CPC分类号： G01R31/2889

摘要： A measurement system with selectable feedback paths includes a DUT interface including a first and a second DUT sensor, the first sensor being connected to a first feedback path for providing a measure of a first DUT characteristic, the second sensor being connected to a second feedback path for providing a measure of a second DUT characteristic, the sensors having a shared reference path and each feedback path including a set point adjustment; a differential amplifier system including differential inputs and differential outputs, the differential outputs being applied to the DUT interface; and a multi-pole switcher for connecting the differential inputs to either the first feedback path and the reference path or to the reference path and the second feedback path, respectfully. The first feedback path is selected to produce a desired first DUT characteristic or the second feedback path is selected to produce a second desired DUT characteristic.

摘要翻译： 具有可选择的反馈路径的测量系统包括：DUT接口，包括第一和第二DUT传感器，第一传感器连接到第一反馈路径，用于提供第一DUT特性的测量，第二传感器连接到第二反馈路径 用于提供第二DUT特性的量度，所述传感器具有共享参考路径，并且每个反馈路径包括设定点调整; 包括差分输入和差分输出的差分放大器系统，差分输出被施加到DUT接口; 以及用于将差分输入连接到第一反馈路径和参考路径或者参考路径和第二反馈路径的多极切换器。 选择第一反馈路径以产生期望的第一DUT特性，或者选择第二反馈路径以产生第二期望的DUT特性。