公开(公告)号：US08717053B2

公开(公告)日：2014-05-06

申请号：US13289382

申请日：2011-11-04

申请人： Wayne C. Goeke ,  William Knauer

发明人： Wayne C. Goeke ,  William Knauer

IPC分类号： G01R31/00 ,  G01R31/02 ,  G01R1/067 ,  G01R1/073 ,  G01R1/18 ,  G01R1/00 ,  G01R31/319 ,  G01R3/00

CPC分类号： G01R1/06766 ,  G01R1/00 ,  G01R1/073 ,  G01R1/18 ,  G01R3/00 ,  G01R31/31926

摘要： A DC-AC probe card for testing a DUT includes: a plurality of probe needles, each probe needle having a distal end for contacting said DUT; and a plurality of connection pathways operable to connect test instrumentation to the probe needles, wherein each connection pathway provides both a desired characteristic impedance for AC measurements and a guarded pathway for DC measurements between respective test instrument connections and probe needles.

摘要翻译： 用于测试DUT的DC-AC探针卡包括：多个探针，每个探针具有用于接触所述DUT的远端; 以及可操作以将测试仪器连接到探针的多个连接通道，其中每个连接通道提供用于AC测量的所需特性阻抗和用于各测试仪器连接件和探针之间的DC测量的保护通路。

公开(公告)号：US20140111188A1

公开(公告)日：2014-04-24

申请号：US13657549

申请日：2012-10-22

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： G01R19/145

CPC分类号： G01R1/203 ,  G01R19/0023 ,  G01R19/0092 ,  H03F1/34 ,  H03F3/45475 ,  H03F2200/261 ,  H03F2203/45138

摘要： An active shunt ammeter for measuring current flowing through a device under test (DUT) and method are disclosed. The active shunt ammeter includes an input configured to receive an input signal having a frequency within a frequency band and representing the current flowing through the DUT. An output is configured to generate an output voltage representing the current flowing through the DUT. The active shunt ammeter also includes a gain circuit having an amplifier with a gain characteristic that varies respect to frequency within the frequency band and a feedback element having an impedance coupled from an output of the gain circuit to a negative input of the gain circuit, the feedback element impedance being configured to change with frequency to correlate with the amplifier gain characteristic such that the feedback element impedance divided by the amplifier gain over the frequency band has minimal frequency dependency.

摘要翻译： 公开了一种用于测量流过被测器件（DUT）的电流的主动分流电流表和方法。 主动分流电流表包括被配置为接收具有在频带内的频率并且表示流过DUT的电流的输入信号的输入。 输出被配置为产生表示流过DUT的电流的输出电压。 主动分流电流表还包括具有增益特性的放大器的增益电路，该放大器具有与频带内的频率相关的增益特性，以及具有从增益电路的输出耦合到增益电路的负输入的阻抗的反馈元件， 反馈元件阻抗被配置为随频率变化以与放大器增益特性相关，使得反馈元件阻抗除以频带上的放大器增益具有最小的频率依赖性。

公开(公告)号：US07906977B1

公开(公告)日：2011-03-15

申请号：US12053878

申请日：2008-03-24

申请人： Wayne C. Goeke ,  Martin J. Rice

发明人： Wayne C. Goeke ,  Martin J. Rice

IPC分类号： G01R27/02 ,  G01R27/08

CPC分类号： G01R31/2841

摘要： A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device; a buffer communicating with a common point between the sense impedance and the device; a current output stage; and a voltage output stage. When the circuit is controlling the current through the device, the voltage output stage forces the common point to a virtual ground and the current output stage forces a desired current through the device in response to a signal from the buffer. When the circuit is controlling the voltage across the device, the current output stage forces the common point to a virtual ground and the voltage output stage forces a desired voltage across the device in response to the signal from the buffer.

摘要翻译： 用于交替地控制通过器件的电流并允许测量器件上的电压或控制器件上的电压并允许测量通过器件的电流的电路包括与器件串联组合的检测阻抗; 与感测阻抗和设备之间的公共点通信的缓冲器; 当前输出阶段; 和电压输出级。 当电路控制通过器件的电流时，电压输出级将公共点强制到虚拟接地，并且当前输出级响应于来自缓冲器的信号迫使所需电流通过器件。 当电路正在控制器件上的电压时，电流输出级将公共点强制到虚拟接地，并且电压输出级响应于来自缓冲器的信号强制跨器件的期望电压。

公开(公告)号：US20080258741A1

公开(公告)日：2008-10-23

申请号：US11788499

申请日：2007-04-20

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： G01R27/26

CPC分类号： G01R31/31924

摘要： A method for making electrical measurements of a first and a second DUT, the DUTs being in sufficient proximity to exhibit crosstalk therebetween, the method comprising: applying a first signal to the first DUT; applying a second signal to the second DUT, the first signal and the second signal being contemporaneous and orthogonal to each other; measuring a first DUT response; and measuring a second DUT response. The first and second DUT responses exhibit independence from the second and first signals, respectively.

摘要翻译： 一种用于对第一和第二DUT进行电测量的方法，所述DUT足够接近以在其间显示出串扰，所述方法包括：将第一信号施加到所述第一DUT; 向第二DUT施加第二信号，第一信号和第二信号彼此同时且正交; 测量第一个DUT响应; 并测量第二DUT响应。 第一和第二DUT响应分别表现出与第二和第一信号的独立性。

公开(公告)号：US07388366B2

公开(公告)日：2008-06-17

申请号：US11347617

申请日：2006-02-03

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： G01R31/02

CPC分类号： G01R31/2822 ,  G01R1/0416

摘要： A connection system for connecting test equipment to a device under test (DUT) includes a first pair of equal-length triaxial cables, each having a desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each first cable being connected to each other at respective proximal and distal ends of the first cables, the distal end of each first cable center conductor being connected to each other, and the distal end of each of a first cable intermediate conductor being connected to each other; and a second pair of equal-length triaxial cables, each having the desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each second cable being connected to each other at respective proximal and distal ends of the second cables as well as to the respective proximal and distal ends of the outer conductors of the first cables, the distal end of each second cable center conductor being connected to each other, and the distal end of each of a second cable intermediate conductor being connected to each other, wherein four-wire measurements are made using each of the triaxial cables individually and two-wire measurements are made using each pair of cables in parallel thereby providing a characteristic impedance equal to the desired characteristic impedance, the DUT being locatable at the distal end of the cables.

摘要翻译： 用于将测试设备连接到被测设备（DUT）的连接系统包括第一对等长三轴电缆，每根电缆在中心导体和外部导体之间具有期望的特性阻抗，每个第一电缆的外部导体被连接 在第一电缆的各个近端和远端处彼此连接，每个第一电缆中心导体的远端彼此连接，并且第一电缆中间导体中的每一个的远端彼此连接; 以及第二对等长三轴电缆，每个在中心导体和外部导体之间具有期望的特性阻抗，每个第二电缆的外部导体在第二电缆的各个近端和远端处彼此连接 对于第一电缆的外导体的各自的近端和远端，每个第二电缆中心导体的远端彼此连接，并且第二电缆中间导体中的每一个的远端彼此连接， 其中使用每个三轴电缆单独进行四线测量，并且使用每对电缆并联进行两线测量，从而提供等于所需特性阻抗的特性阻抗，所述DUT位于所述三轴电缆的远端 电缆

公开(公告)号：US5117227A

公开(公告)日：1992-05-26

申请号：US767006

申请日：1991-09-27

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： H03M1/52 ,  H03M1/50 ,  H03M1/54

CPC分类号： H03M1/50

摘要： A continuously integrating analog-to-digital converter (ADC) calculates a digital output by integrating an input voltage over a number of time intervals using a multisloping technique to define the input voltage in terms of a slope count. A residue ADC is used in lieu of a run-down interval of the integrator to calculate the least significant bits of the ADC digital output. This is accomplished by first sampling the integrator output voltage, and then after a number of time intervals, sampling the integrator output voltage a second tune. The difference between the two residue voltages is converted into a fractional slope count by multiplication with a calibration constant. The fractional slope count can then be added to the slope count from the integrator, so that the resulting total slope count is directly proportional to the input voltage at a high resolution. Multiplication by the calibration constant may be effectuated by controlling the gain on the residue ADC with a digital-to-analog converter (DAC), or like device.

摘要翻译： 连续积分模数转换器（ADC）通过使用多斜率技术对多个时间间隔的输入电压进行积分来计算数字输出，以斜率计算来定义输入电压。 使用残余ADC代替积分器的衰减间隔来计算ADC数字输出的最低有效位。 这是通过首先对积分器输出电压进行采样，然后在多个时间间隔之后，对积分器输出电压进行第二次调谐。 通过与校准常数相乘，将两个残留电压之间的差值转换为分数斜率计数。 然后可以将积分斜率计数加到积分器的斜率计数中，从而得到的总斜率计数与高分辨率下的输入电压成正比。 校准常数的乘法可以通过使用数模转换器（DAC）或类似器件控制残留ADC的增益来实现。

公开(公告)号：US08810256B1

公开(公告)日：2014-08-19

申请号：US12336896

申请日：2008-12-17

申请人： Wayne C. Goeke

发明人： Wayne C. Goeke

IPC分类号： G01R31/27

CPC分类号： G01R35/005 ,  G01R27/02

摘要： A method for verifying the adjustment for the purpose of calibration of an impedance meter having at least a first and a second measurement range includes measuring within the first range a first measured value of a test impedance; measuring within the second range a second measured value of the test impedance; and comparing the first and second measured values to verify the calibration of the impedance meter.

摘要翻译： 用于验证用于校准具有至少第一和第二测量范围的阻抗计的目的的调整方法包括在第一范围内测量测试阻抗的第一测量值; 在第二范围内测量测试阻抗的第二测量值; 并比较第一和第二测量值以验证阻抗计的校准。

公开(公告)号：US07872481B1

公开(公告)日：2011-01-18

申请号：US12113391

申请日：2008-05-01

申请人： Wayne C. Goeke ,  Martin J. Rice

发明人： Wayne C. Goeke ,  Martin J. Rice

IPC分类号： G01R31/302

CPC分类号： G01R31/2889

摘要： A measurement system with selectable feedback paths includes a DUT interface including a first and a second DUT sensor, the first sensor being connected to a first feedback path for providing a measure of a first DUT characteristic, the second sensor being connected to a second feedback path for providing a measure of a second DUT characteristic, the sensors having a shared reference path and each feedback path including a set point adjustment; a differential amplifier system including differential inputs and differential outputs, the differential outputs being applied to the DUT interface; and a multi-pole switcher for connecting the differential inputs to either the first feedback path and the reference path or to the reference path and the second feedback path, respectfully. The first feedback path is selected to produce a desired first DUT characteristic or the second feedback path is selected to produce a second desired DUT characteristic.

摘要翻译： 具有可选择的反馈路径的测量系统包括：DUT接口，包括第一和第二DUT传感器，第一传感器连接到第一反馈路径，用于提供第一DUT特性的测量，第二传感器连接到第二反馈路径 用于提供第二DUT特性的量度，所述传感器具有共享参考路径，并且每个反馈路径包括设定点调整; 包括差分输入和差分输出的差分放大器系统，差分输出被施加到DUT接口; 以及用于将差分输入连接到第一反馈路径和参考路径或者参考路径和第二反馈路径的多极切换器。 选择第一反馈路径以产生期望的第一DUT特性，或者选择第二反馈路径以产生第二期望的DUT特性。

公开(公告)号：US07683647B1

公开(公告)日：2010-03-23

申请号：US12205271

申请日：2008-09-05

申请人： Carl Scharrer ,  Dave Rose ,  Martin J. Rice ,  James A. Niemann ,  William F. Merkel ,  Warren Kumley ,  William Knauer ,  Wayne C. Goeke

发明人： Carl Scharrer ,  Dave Rose ,  Martin J. Rice ,  James A. Niemann ,  William F. Merkel ,  Warren Kumley ,  William Knauer ,  Wayne C. Goeke

IPC分类号： G01R31/02 ,  G01R31/26

CPC分类号： G01R31/2889

摘要： A test head for testing a DUT includes a probe card having a plurality of DUT probes, the probes being in contact with the DUT during the testing; an instrument carrier, the instrument carrier being located above the DUT during the testing; and a SMU mounted on the carrier for each of the probes, each SMU being operably connectable to a respective probe, wherein the carrier is moved with respect to the probe card to permit replacement of the probe card.

摘要翻译： 用于测试DUT的测试头包括具有多个DUT探针的探针卡，在测试期间探针与DUT接触; 仪器载体，仪器载体在测试期间位于DUT的上方; 以及安装在每个探针的载体上的SMU，每个SMU可操作地连接到相应的探针，其中载体相对于探针卡移动以允许更换探针卡。

公开(公告)号：US20080018348A1

公开(公告)日：2008-01-24

申请号：US11489356

申请日：2006-07-19

申请人： James A. Niemann ,  John Gibbons ,  Kevin Cawley ,  Wayne C. Goeke

发明人： James A. Niemann ,  John Gibbons ,  Kevin Cawley ,  Wayne C. Goeke

IPC分类号： G01R27/26

CPC分类号： G01R1/18 ,  G01R1/203

摘要： A guarded sense impedance for use in a measurement instrument includes a sense impedance adapted to have a spatially distributed electrical potential and at least one guard structure adapted to have the spatially distributed electrical potential. The guard structure is arranged to provide a spatially distributed guard potential for the sense impedance.

摘要翻译： 用于测量仪器的防护感测阻抗包括适于具有空间分布的电势的感测阻抗和适于具有空间分布的电势的至少一个保护结构。 保护结构被布置成为感测阻抗提供空间分布的保护电位。