Abstract:
There is provided a channel selection device receiving a multi-channel video including plural videos and video configuration information on each video from a head end. The channel selection device includes a first screen display unit editing the multi-channel video based on the video configuration information and searching view configuration information to generate a channel searching view and displaying the channel searching view on a sub-screen of a television; and a second screen display unit displaying on a main screen of the television a video selected by a viewer out of the videos included in the channel searching view.
Abstract:
A method of forming hard mask employs a double patterning technique. A first hard mask layer is formed on a substrate, and a first sacrificial pattern is formed on the first hard mask layer by photolithography. Features of the first sacrificial pattern are spaced from one another by a first pitch. A second hard mask layer is then formed conformally on the first sacrificial pattern and the first hard mask layer so as to delimit recesses between adjacent features of the first sacrificial pattern. Upper portions of the second hard mask layer are removed to expose the first sacrificial pattern, and the exposed first sacrificial pattern and the second sacrificial pattern are removed. The second hard mask layer and the first hard mask layer are then etched to form a hard mask composed of residual portions of the first hard mask layer and the second hard mask layer. A fine pattern of a semiconductor device, such as a trench isolation region or a pattern of contact holes, can be formed using the hard mask as an etch mask.
Abstract:
An image forming apparatus is provided. The image forming apparatus includes a storage unit which stores information regarding the other image forming apparatuses of the same group as the image forming apparatus and quota information of each user which is shared by the other image forming apparatuses, a controller which, if a job command is input, determines whether to perform a job according to whether the number of copies requested by the job command satisfies the quota information of each user, a function unit which performs the job under control of the controller, a quota information administration unit which updates the quota information of each user stored in the storage unit as the job is performed, and a communication interface which transmits the updated quota information of each user to the other image forming apparatuses.
Abstract:
Provided is a Low Noise Amplifier (LNA). Embodiments of the present invention provide LNAs including: a common gate amplifier circuit configure to amplify a signal of an input node to which an Alternating Current (AC) component is provided and transfer the amplified signal to an amplifier node; and a negative-feedback amplifier circuit configured to amplify a signal of the amplifier node, transfer the amplified signal to an output node, wherein the negative-feedback amplifier circuit includes a feedback capacitor and a feedback inductor connected in series between the amplifier node and the output node to form a negative feedback. the LNA of the present invention forms a negative feedback exclusive of a feedback resistance, such that a broad frequency bandwidth is obtained and noise and heat are reduced.
Abstract:
A semiconductor device and method are disclosed in which an interlayer insulating layer is patterned using multiple overlaying masks to define the geometry of contact plugs and corresponding wiring layers separated by fine pitches.
Abstract:
A method of manufacturing a mask includes designing a first mask data pattern, designing a second mask data pattern for forming the first mask data pattern, acquiring a first emulation pattern, which is predicted from the second mask data pattern, using layout-based Self-Aligning Double Patterning (SADP) emulation, comparing the first emulation pattern with the first mask data pattern, and modifying the second mask data pattern according to results of the comparison. The method further includes performing Optical Proximity Correction (OPC) on the modified second mask data pattern, acquiring second emulation patterns, which are predicted from the second mask data pattern on which the OPC has been performed, using image-based SADP emulation, and comparing the second emulation patterns and the first mask data pattern and manufacturing a first mask layer, which corresponds to the second mask data pattern on which the OPC has been performed, according to the results of the comparison.