Method to control introduction of diffracted beam by means of
diffraction element
    91.
    发明授权
    Method to control introduction of diffracted beam by means of diffraction element 失效
    通过衍射元件控制衍射光束引入的方法

    公开(公告)号:US4215924A

    公开(公告)日:1980-08-05

    申请号:US947066

    申请日:1978-09-29

    申请人: Kazuya Matsumoto

    发明人: Kazuya Matsumoto

    摘要: According to the present invention in the image forming light path a direction-selective diffraction element is provided in such a manner that the image forming beam having entered into said diffraction element is diffracted by means of the diffraction grating structure of said diffraction element and devided into a plurality of beams, whereby at least one of the diffracted beams is led to a photo detecting device while the not diffracted beam is made use of as the image forming beam.

    摘要翻译: 根据本发明,在图像形成光路中,设置方向选择性衍射元件,使得已经通过所述衍射元件的衍射光栅结构衍射到所述衍射元件中的图像形成光束被衍射,并且分离成 多个光束,其中至少一个衍射光束被引导到光检测装置,而不衍射光束被用作成像光束。

    Two-dimensional scanning apparatus with constant speed scan
    92.
    发明授权
    Two-dimensional scanning apparatus with constant speed scan 失效
    具有恒速扫描的二维扫描仪

    公开(公告)号:US4180307A

    公开(公告)日:1979-12-25

    申请号:US931927

    申请日:1978-08-08

    CPC分类号: G02B26/12 H04N1/113

    摘要: Two-dimensional scanning apparatus scans a stationary two-dimensional surface with a first deflector and a second deflector which deflects a light beam in a direction perpendicular to the deflecting direction of said first deflector. An afocal optical system is provided between said first and second deflectors, while an imaging lens system is provided between said second deflector and the scanning surface. Said first deflector, afocal optical system and imaging lens system cooperate to displace the light beam at a constant speed in a principal scanning direction on the scanning surface, while said second deflector and imaging lens system cooperate to displace the light beam at a constant speed in an auxiliary scanning direction on said surface.

    摘要翻译: 二维扫描装置用固定的二维表面扫描第一偏转器和第二偏转器,该第一偏转器和第二偏转器使垂直于所述第一偏转器的偏转方向的方向偏转光束。 在所述第一和第二偏转器之间提供无焦光学系统,而在所述第二偏转器和扫描表面之间提供成像透镜系统。 所述第一偏转器,无焦光学系统和成像透镜系统配合以在扫描表面上沿主扫描方向以恒定速度移位光束,而所述第二偏转器和成像透镜系统协调以一定速度移动光束 在所述表面上的辅助扫描方向。

    Scanning optical system including optical system for detecting an
information beam
    93.
    发明授权
    Scanning optical system including optical system for detecting an information beam 失效
    扫描光学系统,包括用于检测信息光束的光学系统

    公开(公告)号:US4130339A

    公开(公告)日:1978-12-19

    申请号:US776894

    申请日:1977-03-11

    IPC分类号: G02B26/12 H04N3/08 G02B27/17

    CPC分类号: H04N3/08 G02B26/127

    摘要: The disclosure describes a scanning optical system in which the scanning beam from a light source is deflected by a beam deflecting device to scan the scanning plane through a scanning beam focusing lens. The scanning optical system comprises a member disposed between the beam deflecting device and the focusing lens for reflecting a part of the scanning beam a plurality of times within the member so as to take up part of the beam as an information beam.

    摘要翻译: 本公开描述了一种扫描光学系统,其中来自光源的扫描光束被光束偏转装置偏转以通过扫描光束聚焦透镜扫描扫描平面。 扫描光学系统包括设置在光束偏转装置和聚焦透镜之间的构件,用于将扫描光束的一部分多次反射在构件内,以便将部分波束作为信息光束。

    Device for measuring light incident on an image forming optical system
    94.
    发明授权
    Device for measuring light incident on an image forming optical system 失效
    用于测量形成光学系统的图像的光线发生的装置

    公开(公告)号:US4103153A

    公开(公告)日:1978-07-25

    申请号:US691628

    申请日:1976-06-01

    IPC分类号: G02B5/32 G03B7/099 G02B5/14

    CPC分类号: G02B5/32 G03B7/09976

    摘要: The present invention relates to a device for measuring light incident on an image forming optical system, making use of a plural number of the diffraction element. The plural number of the diffraction elements are respectively provided in the optical path of the image forming optical system. Further the plural number of the diffraction elements respectively present a certain predetermined area. The plural number of the diffraction elements, seen along the direction of the optical axis of the image forming optical system, are substantially only partially overlapped with respect to each other. The light beam incident on a diffraction element is divided into a non diffracted light beam and a diffracted light beam. Thus diffracted light beam is directed toward the light detecting means so as to be measured while the non diffracted light beam advances along the above mentioned optical axis. Consequently at the part at which the diffraction elements overlap each other, the non diffracted light beam led out of the preceeding diffraction element again enters the following diffraction element. This light beam is again divided into a non diffracted light beam and a diffracted light beam by means of the following diffraction element. The diffracted light beam is measured by a light detecting means in the same way as in the above mentioned case, while the non diffracted light beam advances along the above mentioned optical axis. Thus the light beam which passes through the overlapping parts is measured a plural number of times.

    Method of color image recording
    95.
    发明授权
    Method of color image recording 失效
    彩色图像记录方法

    公开(公告)号:US4019817A

    公开(公告)日:1977-04-26

    申请号:US575245

    申请日:1975-05-07

    申请人: Kazuya Matsumoto

    发明人: Kazuya Matsumoto

    IPC分类号: G02B27/44 G03B27/08

    CPC分类号: G02B27/4238

    摘要: A color image carrier such as positive film is brought into contact with a monochrome recording medium such as silver salt film. The color image carrier is illuminated with red, green and blue beams. These three color beams respectively can project coded information about diffraction gratings or slits which are different in angle or pitch in accordance with the respective colors. Thus, each color image carrier containing the coded information about each diffraction grating or slit is recorded on the monochrome recording medium.

    摘要翻译: 诸如正片的彩色图像载体与银盐膜等单色记录介质接触。 彩色图像载体用红色,绿色和蓝色光束照射。 这三个色光束可分别根据各自的颜色投影关于衍射光栅或狭缝的编码信息,其中角度或间距不同。 因此,包含关于每个衍射光栅或狭缝的编码信息的每个彩色图像载体被记录在单色记录介质上。

    SENSING METHOD AND SENSING DEVICE
    97.
    发明申请
    SENSING METHOD AND SENSING DEVICE 有权
    感应方法和感应装置

    公开(公告)号:US20140017799A1

    公开(公告)日:2014-01-16

    申请号:US14007403

    申请日:2012-03-05

    IPC分类号: G01N21/64

    摘要: This invention relates to a sensing method and a sensing device for quantifying the concentration of an analyte by using the property that interaction between an analyte and a labeled compound changes fluorescence intensity. A fluorescence sensor is used to acquire fluorescence intensity at predetermined quantification time points. Then, the concentration of an analyte is quantified in accordance with a non-steady concentration quantification law comprising the relationship between the acquired fluorescence intensity and the time derivative quantity thereof.

    摘要翻译: 本发明涉及一种用于通过使用分析物和标记化合物之间的相互作用改变荧光强度的性质来定量分析物的浓度的感测方法和感测装置。 荧光传感器用于在预定量化时间点获取荧光强度。 然后,根据包含所获得的荧光强度与其时间衍生量之间的关系的非稳定浓度定量定律来定量分析物的浓度。

    Method of manufacturing semiconductor device and semiconductor device
    99.
    发明授权
    Method of manufacturing semiconductor device and semiconductor device 有权
    制造半导体器件和半导体器件的方法

    公开(公告)号:US08012850B2

    公开(公告)日:2011-09-06

    申请号:US12040447

    申请日:2008-02-29

    IPC分类号: H01L21/46

    摘要: According to a method of manufacturing a semiconductor device, a short-circuit wiring is formed in a region on a wafer including a dicing region, and electrode pads for input and output signals of a plurality of devices disposed in a semiconductor device forming region are electrically short-circuited by the short-circuit wiring, so that occurrence of plasma damage is suppressed even if the wafer is subjected to various plasma processes. When the wafer subjected to the plasma processes is cut along the dicing region to separate a semiconductor device, the electrical short-circuit of the electrode pads by the short-circuit wiring is released, so that the functionally unwanted short-circuit of the devices or the like is appropriately released.

    摘要翻译: 根据制造半导体器件的方法,在包括切割区域的晶片的区域中形成短路布线,并且设置在半导体器件形成区域中的多个器件的输入和输出信号的电极焊盘是电 短路布线短路,即使对晶片进行各种等离子体处理也能够抑制等离子体损伤的发生。 当沿着切割区切割经受等离子体处理的晶片以分离半导体器件时,通过短路布线的电极焊盘的电短路被释放,使得器件或功能上不需要的短路 适当地释放。