-
公开(公告)号:US10580491B2
公开(公告)日:2020-03-03
申请号:US16015020
申请日:2018-06-21
Applicant: Silicon Storage Technology, Inc.
Inventor: Vipin Tiwari , Hieu Van Tran , Nhan Do , Mark Reiten
IPC: G11C5/08 , G11C16/04 , H01L27/11521 , H01L29/788 , H01L29/423
Abstract: A memory device includes rows and columns of memory cells, word lines each connected to a memory cell row, bit lines each connected to a memory cell column, a word line driver connected to the word lines, a bit line driver connected to the bit lines, word line switches each disposed on one of the word lines for selectively connecting one memory cell row to the word line driver, and bit line switches each disposed on one of the bit lines for selectively connecting one memory cell column to the bit line driver. A controller controls the word line switches to connect only some of the rows of memory cells to the word line driver at a first point in time, and controls the bit line switches to connect only some of the columns of memory cells to the bit line driver at a second point in time.
-
92.
公开(公告)号:US20200051636A1
公开(公告)日:2020-02-13
申请号:US16550253
申请日:2019-08-25
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Thuan Vu , Stanley Hong , Anh Ly , Vipin Tiwari , Nhan Do
IPC: G11C16/04 , H01L27/11521 , H01L29/788 , G06N3/08
Abstract: Numerous embodiments are disclosed for a high voltage generation algorithm and system for generating high voltages necessary for a particular programming operation in analog neural memory used in a deep learning artificial neural network. Different calibration algorithms and systems are also disclosed. Optionally, compensation measures can be utilized that compensate for changes in voltage or current as the number of cells being programmed changes.
-
公开(公告)号:US20190355424A1
公开(公告)日:2019-11-21
申请号:US16042000
申请日:2018-07-23
Applicant: Silicon Storage Technology, Inc.
Inventor: Hsuan Liang , Jeng-Wei Yang , Man-Tang Wu , Nhan Do , Hieu Van Tran
Abstract: A memory device with memory cells in rows and columns, word lines connecting together the control gates for the memory cell rows, bit lines electrically connecting together the drain regions for the memory cell columns, first sub source lines each electrically connecting together the source regions in one of the memory cell rows and in a first plurality of memory cell columns, second sub source lines each electrically connecting together the source regions in one of the memory cell rows and in a second plurality of memory cell columns, first and second source lines, first select transistors each connected between one of first sub source lines and the first source line, second select transistors each connected between one of second sub source lines and the second source line, and select transistor lines each connected to gates of one of the first select transistors and one of the second select transistors.
-
94.
公开(公告)号:US10446246B2
公开(公告)日:2019-10-15
申请号:US15990220
申请日:2018-05-25
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Vipin Tiwari , Nhan Do
Abstract: Numerous embodiments of a data refresh method and apparatus for use with a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. Various embodiments of a data drift detector suitable for detecting data drift in flash memory cells within the VMM array are disclosed.
-
95.
公开(公告)号:US20190205729A1
公开(公告)日:2019-07-04
申请号:US15936983
申请日:2018-03-27
Applicant: Silicon Storage Technology, Inc.
Inventor: Hieu Van Tran , Stanley Hong , Anh Ly , Thuan Vu , Hien Pham , Kha Nguyen , Han Tran
CPC classification number: G06N3/04 , G06F17/16 , G06N3/063 , G06N3/0635 , G06N3/08 , G11C16/0425 , H03F3/45269
Abstract: Numerous embodiments for processing the current output of a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. The embodiments comprise a summer circuit and an activation function circuit. The summer circuit and/or the activation function circuit comprise circuit elements that can be adjusted in response to the total possible current received from the VMM to optimize power consumption.
-
公开(公告)号:US20190164984A1
公开(公告)日:2019-05-30
申请号:US16264349
申请日:2019-01-31
Applicant: Silicon Storage Technology, Inc
Inventor: Hieu Van Tran , Hung Quoc Nguyen , Nhan Do
IPC: H01L27/11526 , H01L29/788 , H01L29/423 , G11C16/14 , G11C16/04 , G11C16/26 , H01L27/11521 , H01L27/11519
Abstract: A memory device with memory cell pairs each having a single continuous channel region, first and second floating gates over first and second portions of the channel region, an erase gate over a third portion of the channel region between the first and second channel region portions, and first and second control gates over the first and second floating gates. For each of the pairs of memory cells, the first region is electrically connected to the second region of an adjacent pair of memory cells in the same active region, and the second region is electrically connected to the first region of an adjacent pair of the memory cells in the same active region.
-
公开(公告)号:US10276236B2
公开(公告)日:2019-04-30
申请号:US15597709
申请日:2017-05-17
Inventor: Santosh Hariharan , Hieu Van Tran , Feng Zhou , Xian Liu , Steven Lemke , Nhan Do , Zhixian Chen , Xinpeng Wang
Abstract: A memory device includes a metal oxide material disposed between and in electrical contact with first and second conductive electrodes, and an electrical current source configured to apply one or more electrical current pulses through the metal oxide material. For each of the one or more electrical current pulses, an amplitude of the electrical current increases over time during the electrical current pulse to form a conductive filament in metal oxide material.
-
公开(公告)号:US10269440B2
公开(公告)日:2019-04-23
申请号:US15374588
申请日:2016-12-09
Inventor: Xinjie Guo , Farnood Merrikh Bayat , Dmitri Strukov , Nhan Do , Hieu Van Tran , Vipin Tiwari
IPC: G11C16/14 , G11C16/34 , G11C16/10 , G11C16/26 , H01L27/11521 , H01L27/11558 , G11C7/18 , G11C8/14 , G11C16/04 , H01L29/788 , H01L27/11524
Abstract: A memory device that provides individual memory cell read, write and erase. In an array of memory cells arranged in rows and columns, each column of memory cells includes a column bit line, a first column control gate line for even row cells and a second column control gate line for odd row cells. Each row of memory cells includes a row source line. In another embodiment, each column of memory cells includes a column bit line and a column source line. Each row of memory cells includes a row control gate line. In yet another embodiment, each column of memory cells includes a column bit line and a column erase gate line. Each row of memory cells includes a row source line, a row control gate line, and a row select gate line.
-
公开(公告)号:US20190115088A1
公开(公告)日:2019-04-18
申请号:US16218398
申请日:2018-12-12
Applicant: Silicon STorage Technology, Inc.
Inventor: Hieu Van Tran , Anh Ly , Thuan Vu , Hung Quoc Nguyen
IPC: G11C16/30 , G11C16/08 , G11C16/04 , G11C16/14 , H01L27/11521 , G11C16/26 , G11C16/16 , G11C5/14 , G11C16/10 , G11C8/08
Abstract: During a program, read, or erase operation of one or more non-volatile flash memory cells in an array of non-volatile flash memory cells, a negative voltage can be applied to the word lines and/or coupling gates of the selected or unselected non-volatile flash memory cells. The negative voltage is generated by a negative high voltage level shifter using one of several embodiments disclosed herein.
-
公开(公告)号:US10249375B2
公开(公告)日:2019-04-02
申请号:US15987735
申请日:2018-05-23
Inventor: Xinjie Guo , Farnood Merrikh Bayat , Dmitri Strukov , Nhan Do , Hieu Van Tran , Vipin Tiwari
IPC: G11C16/14 , G11C16/34 , G11C16/10 , G11C16/26 , H01L27/11521 , H01L27/11558 , G11C7/18 , G11C8/14 , G11C16/04 , H01L29/788 , H01L27/11524
Abstract: A memory device that provides individual memory cell read, write and erase. In an array of memory cells arranged in rows and columns, each column of memory cells includes a column bit line, a first column control gate line for even row cells and a second column control gate line for odd row cells. Each row of memory cells includes a row source line. In another embodiment, each column of memory cells includes a column bit line and a column source line. Each row of memory cells includes a row control gate line. In yet another embodiment, each column of memory cells includes a column bit line and a column erase gate line. Each row of memory cells includes a row source line, a row control gate line, and a row select gate line.
-
-
-
-
-
-
-
-
-