摘要:
The passive optical network includes a master station and slave stations connected via an optical fiber network including an optical splitter and a plurality of optical fibers. The master station includes a bandwidth control unit which decides a volume of a transmission signal to be granted to each slave station in every first period and in accordance with a request from the slave station, and a transmission timing control unit which decides, in one of a plurality of second periods and in accordance with the decided volume of the signal, transmission timing in which the slave station should transmit a signal. When the signal is to be transmitted by division over the plurality of second periods, the bandwidth control unit or the transmission timing control unit is controlled based on a volume of a signal to be attached by division processing, so that the granted signal can be transmitted in the first period.
摘要:
There is provided an abnormal light cut-off system in which even when a high power light is inputted from an optical fiber connected to a user side apparatus by a malicious user or an accident, a trouble rate is low, the abnormal light is cut off at high sensitivity, and security is high. In a network system in which an optical line terminating apparatus and plural optical network apparatuses are connected together via plural optical connection sections and an optical branching section, the optical branching section includes one optical line terminating apparatus side port and plural optical network apparatus side branch ports, an optical line terminating apparatus side optical fiber connects the optical line terminating apparatus and the one optical line terminating apparatus side port, an optical branching section side optical fiber connects the optical network apparatus side branch port and a light cut-off section, and an optical network apparatus side optical fiber connects the light cut-off section and the optical network apparatus. When an abnormal light is inputted from the optical network apparatus side, it is cut off by the light cut-off section.
摘要:
In the case where, in a WDM-PON system, a high-output optical signal or a pseudo signal for illegal access by a hostile user, or an optical signal with a wavelength which is not assigned from an OLT is input to an ONU-side optical fiber, the quality of communications for other users is possibly affected and a receiver on the station side is possibly destroyed. By providing an optical blocking unit at a position near an ONU-side optical splitter of an optical branching unit, in the case where input of an extraordinary optical signal is detected, an optical route into which the extraordinary optical signal is input is blocked, so that the input of the extraordinary optical signal to an OLT and optical lines shared by plural users can be preliminarily blocked.
摘要:
A passive optical network system (PON) has a plurality of OLTs and ONUs with different transmission rates. OLTs with different transmission rates share information of priority frames and destinations, and determine timing for frame transmission to ONUs so that the signal from each of the OLTs does not collide when multiplied in a splitter. OLTs transmit the data to the ONU as a burst signal to prevent the signals with different rates from colliding. ONU acquires the information of the following burst frames. ONU receives only the signal addressed to the own ONU or with the transmission rate of own ONU, therefore errors in ONUs can be avoided. OLT receives only the signal with the transmission rate of own OLT from ONUs based on the transmission timing from the ONUs shared by the line terminators, errors in OLTs can be avoided.
摘要:
When a signal of weak optical power is received immediately after a signal of intense optical power, input of the signal of intense optical power readily causes saturation, and the influence interferes in the signal of weak optical power to deteriorate receiver sensitivity. Moreover, when a reverse-bias voltage of APD is changed, if a difference between the voltages is large, a next optical signal is received until the receiver sensitivity of the APD becomes stable, so that receiver sensitivity deteriorates. A DBA order is determined so that a difference in reverse-bias voltage is small, and reverse-bias voltage is controlled in line with reception timing from ONU.
摘要:
A station-side communication device connected to subscriber-side communication devices via an optical combining device; sending, to the subscriber-side communication devices, a distance measurement request signal; computing transmission delay times of optical signals from the individual subscriber-side communication devices by receiving distance measurement signals, and including: a threshold control part identifying the level of distance measurement signals; a signal detection part detecting breaks in the distance measurement signals from the threshold control part; a transmission granting part determining the timing at which transmission of optical signals is granted, and a reset timing generation part that, there is notification of detection of a break in the distance measurement signal from the signal detection part while it is being notified that distance measurement is carried out to and from the subscriber-side communication devices from the transmission granting part, sends a reset signal indicating that the voltage level is reset to the threshold control part.
摘要:
A plasma display panel and an imaging device realize a high luminous efficiency, a long lifetime and stable driving. The plasma display panel uses a discharge-gas mixture containing at least Xe, Ne and He. A Xe proportion of the discharge-gas mixture is in a range of from 2% to 20%, a He proportion of the discharge-gas mixture is in a range of from 15% to 50%, the He proportion is greater than the Xe proportion, and a total pressure of the discharge-gas mixture is in a range of from 400 Torr to 550 Torr. A width of a voltage pulse to be applied to an electrode serving as an address electrode is 2 μs or less.
摘要:
A plasma display panel has a good productivity of partition formation and air exhaustion process and realizes a bright and stable display. A discharge gas is filled in a gap between two substrates. A mesh-patterned partition is arranged on the inner surface of one of the substrates for dividing the gap into plural squares corresponding to a cell arrangement. The partition has low portions forming a mesh-like air path that travels through all of the gas-filled space enclosed by the partition, in a plan view. A plasma display panel includes two spaced substrates defining a gap therebetween. The gap is divided by intersecting walls into columns and rows of discharge cells. Portions of a wall that are lower in height than remaining portions of the wall define a flow path. The plasma display panel realizes a bright and stable display.
摘要翻译:<?delete-start id =“DEL-S-00001”date =“20080916”?等离子体显示面板具有良好的分区形成和排气过程的生产率,实现明亮稳定的显示。 放电气体填充在两个基板之间的间隙中。 在一个基板的内表面上布置有网格图案的隔板,用于将间隙分成与单元布置相对应的多个正方形。 分区具有形成网状空气路径的低部分,其在平面图中穿过由分隔件包围的所有充气空间。<?delete-end id =“DEL-S-00001”?> <? 插入开始id =“INS-S-00001”date =“20080916”?等离子体显示面板包括两个间隔开的基板,其间形成有间隙。 间隙被交叉的壁分成列和排放电池。 高度低于墙壁部分的墙壁部分限定了流动路径。 等离子显示面板实现了明亮稳定的显示。 <?insert-end id =“INS-S-00001”?>
摘要:
A plasma display panel and an imaging device realize a high luminous efficiency, a long lifetime and stable driving. The plasma display panel uses a discharge-gas mixture containing at least Xe, Ne and He. A Xe proportion of the discharge-gas mixture is in a range of from 2% to 20%, a He proportion of the discharge-gas mixture is in a range of from 15% to 50%, the He proportion is greater than the Xe proportion, and a total pressure of the discharge-gas mixture is in a range of from 400 Torr to 550 Torr. A width of a voltage pulse to be applied to an electrode serving as an address electrode is 2 μs or less.
摘要:
An electron beam (area beam) having a fixed area is irradiated onto the surface of a semiconductor sample, and reflected electrons from the sample surface are imaged by the imaging lens, and images of a plurality of regions of the surface of the semiconductor sample are obtained and stored in the image storage unit, and the stored images of the plurality of regions are compared with each other, and the existence of a defect in the regions and the defect position are measured. By doing this, in an apparatus for testing a pattern defect of the same design, foreign substances, and residuals on a wafer in the manufacturing process of a semiconductor apparatus by an electron beam, speeding-up of the test can be realized.