SYSTEM AND METHODS FOR IMPROVED SHEET METAL CUTTING

    公开(公告)号:US20240227056A1

    公开(公告)日:2024-07-11

    申请号:US18408378

    申请日:2024-01-09

    摘要: A plasma cutting system for measuring or monitoring the voltage between a plasma torch and the material being cut to determine a voltage or voltage signature and comparing that measurement against predetermined values to indicate that an initial pierce of the material is complete, and based on the measurement, moving the torch or the material to a different location for additional cutting. The system further provides a Fix Drawing Tool, which will automatically detect and fix gaps or overlaps in a drawing that are very difficult to find visually. These gaps and overlaps become a problem when trying to make a proper toolpath because a CAM program requires a clean, closed shape. The system also provides a Dynamic Corner Looping system, which automatically adjusts with the feed-rate and accelerations of the toolpath and plasma machine, eliminates unwanted dross, sharpens corners and minimizes material loss. A pendant tethering system is also disclosed for managing control of a CNC machine remotely. Additional disclosed functionality includes a data collection system, a manual hand wheel with 3D simulation and a multiple fabrication head management system.

    PLASMA DEVICE CONSUMABLE PART CHANGE DETECTION

    公开(公告)号:US20190223281A1

    公开(公告)日:2019-07-18

    申请号:US16244470

    申请日:2019-01-10

    IPC分类号: H05H1/36 B23K10/02

    摘要: Approaches herein provide a system for determining whether a consumable part of a plasma device has been removed or replaced while the plasma device and associated sensors lie dormant or are no longer receiving data, e.g., when the plasma device is power-off. The approaches herein determine whether certain types of data stored in a controller's memory are still valid, for example, for the purposes of determining degradation and/or end-of-life of the consumable parts. In the case that one or more consumable parts has been serviced or replaced, the data stored in the controller memory may no longer be considered valid for the consumable set. In one approach, the controller determines a status of an indicator in the device following start-up, and determines, based on the status of the indicator, whether the consumable part has been removed or replaced.

    Failure event detection in a plasma arc torch

    公开(公告)号:US10039178B2

    公开(公告)日:2018-07-31

    申请号:US13183907

    申请日:2011-07-15

    IPC分类号: B23K10/00 H05H1/34

    摘要: A method of determining a failure event of consumable for a plasma torch is provided. The method includes monitoring at least one of an operating current or an operating voltage during a transfer arc mode of the plasma arc torch. The method also includes determining when at least one parameter associated with the operating current or the operating voltage exceeds a tolerance threshold for a time period indicative of the failure event. The method further includes shutting off at least one of the operating current or the operating voltage of the plasma arc torch when the at least one parameter exceeds the tolerance threshold for the time period.

    Plasma torch power circuit and cooling system

    公开(公告)号:US09950387B2

    公开(公告)日:2018-04-24

    申请号:US14057104

    申请日:2013-10-18

    申请人: Hypertherm, Inc.

    IPC分类号: B23K10/00 H05H1/36

    CPC分类号: B23K10/006 B23K10/00 H05H1/36

    摘要: A plasma arc cutting system includes a power supply comprising a multi-pulse transformer and a plurality of semiconductor switches directly connected to a bank of capacitors, and a thermal regulation system connected to the power supply and configured to cool the multi-pulse transformer. The thermal regulation system includes a cold plate in direct contact with the semiconductor switches; a fluid conduit disposed within the cold plate; and a pump connected to the conduit and configured to direct a coolant fluid through the conduit. The power supply has at least one of the following operating requirements: (i) a weight to power ratio of approximately 22.4 pounds per kilowatt; (ii) a volume to power ratio of approximately 1366 cubic inches per kilowatt; (iii) an average semiconductor device case temperature of approximately 100 degrees Centigrade during a cutting operation; (iv) a maximum transformer temperature of about 133 degrees Centigrade during a cutting operation.