摘要:
An all solutions automatic test pattern generation (ATPG) engine method uses a decision selection heuristic that makes use of the “connectivity of gates” in the circuit in order to obtain a compact solution-set. The “symmetry in search-states” is analyzed using a “Success-Driven Learning” technique which is extended to prune conflict sub-spaces. A metric is used to determine the use of learnt information a priori, which information is stored and used efficiently during “success driven learning”.
摘要:
According to the present invention, even a user lacking the knowledge of semiconductor testing apparatus can easily generate a test program, and easily perform alternation and correction of the test program. In the present invention, a microprogram of a spreadsheet software being one of the commonly used application software is used to create the test program. Therefore, even a user lacking the knowledge of semiconductor testing apparatus can easily generate a test program, and easily perform alternation and correction of the test program. When the alternation and the correction of the test program are performed, only setting conditions of each sheet are altered and corrected, and the alternation and the correction of the test program are easily performed.
摘要:
A coverage-directed test generation technique for functional design verification relies on events that are clustered according to similarities in the way that the events are stimulated in a simulation environment, not necessarily related to the semantics of the events. The set of directives generated by a coverage-directed test generation engine for each event is analyzed and evaluated for similarities with sets of directives for other events. Identified similarities in the sets of directives provide the basis for defining event clusters. Once clusters have been defined, a common set of directives for the coverage-directed test generation engine is generated that attempts to cover all events in a given cluster.
摘要:
A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.
摘要:
A method for compressing test patterns to be applied to scan chains in a circuit under test. The method includes generating symbolic expressions that are associated with scan cells within the scan chains. The symbolic expressions are created by assigning variables to bits on external input channels supplied to the circuit under test. Using symbolic simulation, the variables are applied to a decompressor to obtain the symbolic expressions. A test cube is created using a deterministic pattern that assigns values to the scan cells to test faults within the integrated circuit. A set of equations is formulated by equating the assigned values in the test cube to the symbolic expressions associated with the corresponding scan cell. The equations are solved to obtain the compressed test pattern.
摘要:
A method for linking compiled pattern data and loading the data into tester hardware includes the steps of generating a composite object that includes a shared resource, determining a local shared resource specific to a test instrument that is associated with the shared resource in the composite object, assigning a local reconciled value or address to the local shared resource, and loading the local shared resource into the test instrument.
摘要:
A verification supporting apparatus includes an acquiring unit that acquires a first verification-item list for a verification target, a functional specification of the verification target, and a sequential specification of the verification target; a keyword extracting unit that extracts a keyword about the verification target from the first verification-item list; a creating unit that creates a second verification-item list in which each of the verification items is formed with the functional description and the sequential description about an output action of the verification target; and a converting unit that converts the first verification-item list into a third verification-item list having a same format as the second verification-item list, based on the second verification-item list and the keyword.
摘要:
IP characterization and for path finding methods, and a computer readable recording medium for storing program are provided. First, an Intellectual Property (IP) component is provided. Then, a plurality of test patterns for all paths in the IP component is automatically generated. The test patterns are then sequentially input into the IP component for simulation, and a plurality of corresponding simulation results is generated. Finally, an IP characteristic library is generated based on the simulation results.
摘要:
Generation of test cases for functional verification of a complex system-under-test is achieved by the use of a probability matrix. The probability matrix represents a non-uniform distribution function of resource combinations used in the transactions, and can be created randomly, or by application of various types of testing knowledge. The matrix is used by a test generator for selecting resources that participate in a transaction involving an interconnect between different types of system components. Applying the inventive principles increases the quality of design verification by stimulation of both the system's resources and its internal interconnects, with almost no knowledge of the structure of the system.
摘要:
A method for enabling bitwise or bit slice constraints to be provided as part of the test generation process, by providing a language structure which enables these constraints to be expressed in a test generation language such as e code for example. The language structure for such bitwise constraints is then handled in a more flexible manner, such that the test generation process does not attempt to rigidly “solve” the expression containing the constraint as a function. Therefore, the propagation of constraints in such a structure do not necessarily need to be propagated from left to right, but instead are generated in a multi-directional manner. The language structure is particularly suitable for such operators as “[: ]”, “|”, “&”, “{circumflex over ( )}”, “˜”, “>>” and “