Abstract:
A multi-angle colorimeter employs a multi-angle mode and a symmetrical arrangement mode in an optical arrangement. Light detection on both sides of the symmetrical arrangement is performed by a single photodetector unit. The photodetector unit is used on both sides, and thus, the device becomes simpler, without any impact on individual difference in characteristics of multiple photodetector units. Conversely, elements for illumination can be used on both sides. Also in a case where multiple photodetector units are used, the size and cost of the device can be reduced with the use of a photodetector unit having a relatively low wavelength resolution as a photodetector unit to be used on one side. This enables to reduce an attitude error due to relative tilting of a measurement surface while reducing the size and cost of the device.
Abstract:
A multi-angle colorimeter employs a multi-angle mode and a symmetrical arrangement mode in an optical arrangement. Light detection on both sides of the symmetrical arrangement is performed by a single photodetector unit. The photodetector unit is used on both sides, and thus, the device becomes simpler, without any impact on individual difference in characteristics of multiple photodetector units. Conversely, elements for illumination can be used on both sides. Also in a case where multiple photodetector units are used, the size and cost of the device can be reduced with the use of a photodetector unit having a relatively low wavelength resolution as a photodetector unit to be used on one side. This enables to reduce an attitude error due to relative tilting of a measurement surface while reducing the size and cost of the device.
Abstract:
A spectrophotometer 10 includes built-in detector 24 and external detector 32. When a mountable/removable optical path switcher 23a is installed in a specimen chamber 23, measurement based on detection signals from built-in detector 24 is replaced by measurement based on detection signals from external detector 32. The spectrophotometer further includes a measurement data threshold-value storage unit 51 that stores threshold value T for measurement data from built-in detector 24 or external detector 32, and a light-receiving detector recognition unit 52 that recognizes which detector is able to receive the measuring light beam based on the results of a comparison between threshold value T and measurement data from built-in detector 24 or external detector 32 while the measuring light beam is being introduced into specimen chamber 23.
Abstract:
The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22. In using the apparatus, by the control program, the frequency of the power source used in this apparatus is identified, the lighting period and sampling data extraction period corresponding to the identified frequency and the measurement mode that a user of the apparatus has previously set are selected from among a plurality of memorized values, and the appropriate lighting period is set to the hardware (PLD 43). Accordingly, without depending on the frequency, it is possible to obtain measurement data always in the state where the lowest detection limit performance is optimized.
Abstract:
A radiation pulse, such as from a solar simulator, is spectrally analyzed over a selected sampling pulse that is shorter in duration than the radiation pulse and is timed to begin after the start of the radiation pulse. A deformable membrane mirror is controlled to function as a high speed shutter in the path of the radiation pulse. When not deformed, the mirror reflects the radiation pulse into an optical instrument, such as a spectroradiometer. A sampling pulse is generated for a selected time after the start of the radiation pulse and is applied to the mirror to ensure total reflection of the radiation pulse only for the duration of the sampling pulse. Controls are provided to adjust the start time and duration of the sampling pulse, and to adjust the sensitivity of sensing the start of the radiation pulse.
Abstract:
An inventive optical cell measurement apparatus comprises a light source (S) which emits light having a predetermined wavelength range, a first mirror (M1) which reflects the light emitted from the light source (S), a long light path gas cell (1) to which the light reflected on the first mirror (M1) is introduced, a second mirror (M2) which reflects light outputted from the long light path gas cell (1), a sensor (D) which detects the light reflected on the second mirror (M2), and optical elements (21,22) disposed in a light path extending from the light source (S) to the sensor (D) and each having a bifocal property with different focal lengths as measured in two directions (X,Y) perpendicular to the light path. With this arrangement, the aberration of spherical mirrors (6,7) disposed in the gas cell (1) is corrected, thereby preventing reduction of the transmittance of the gas cell (1).
Abstract:
In a substrate inspecting apparatus comprising a projecting section (4) in which light sources (8), (9) and (10) are provided for emitting colored lights of R, G and B in directions having different elevation angles, one or two color components which is/are greater than the mean value of the intensities of color components is/are extracted for an inspecting region including a soldered portion. Inclined surfaces adapted to the light sources (8), (9) and (10) are converted into monochromatic shaded images by the extraction processing. A boundary position between the inclined surfaces adapted to the light sources (8) and (9) are converted into one shaded image having a mixed color of red and green and the boundary position between the inclined surfaces adapted to the light sources (9) and (10) is converted into a different shaded image.
Abstract:
An optical system for determining an optical constant by measuring the absolute reflectance and the absolute transmittance of a substance by using an incoming side beam switching mirror for selectively switching the direction of a light from a light source to first or second converged light reflecting units. The first and second converged light reflecting units project the light from the beam switching mirror so as to be converged in an intersecting manner at the position of a sample holder that can be positioned to present a sample fitting hole or a through hole for measuring the reflectance/transmittance by providing the light to an exit side beam switching mirror and detector.
Abstract:
A modular dual-beam source, sample compartment and beam-combining system are provided when used with a monochromator and detector to form a spectrophotometer consisting of: (a) a source module where two ellipsoidal mirrors each produce an image of the light source, and (b) a reflecting sample-compartment module, wherein each side has two plane-mirrors, of the four plane mirrors, three are reference and one is the sample, or (c) a transmission sample-compartment module, wherein each side has two plane-mirrors, and a sample is placed between one pair of plane-mirrors, and (d) a beam-combining module wherein the source images are imaged by a second pair of ellipsoidal mirrors on a reflective chopper that combines the images at a single location that is imaged, external to the module, by another mirror, each module being kinematically located with respect to each other so the system remains optically aligned as modules are interchanged.
Abstract:
In an analytic spectrometer (50) having a central computer (9), permanently installed and exchangeable components (5), such as a radiation source, a detector, a beam splitter, a filter, external measurement probes and the like, each of which exhibiting a readable data carrier (7) with encoded data of parameters characterizing the respective component (5), the data media (7) can be written to and contains changeable time dependent data concerning the history and/or the actual properties of the corresponding component (5) for example length of operation, performance deterioration parameters or calibration curves of the component (5). These data can be continuously adjusted by the central computer (9) to the current state of the component (5) so that the data medium (7) connected to the component (5) can immediately supply information concerning the current actual properties of the component (5) when installing the component (5) in another spectrometer.