Multi-angle colorimeter
    91.
    发明授权
    Multi-angle colorimeter 有权
    多角度比色计

    公开(公告)号:US09222835B2

    公开(公告)日:2015-12-29

    申请号:US14660543

    申请日:2015-03-17

    Abstract: A multi-angle colorimeter employs a multi-angle mode and a symmetrical arrangement mode in an optical arrangement. Light detection on both sides of the symmetrical arrangement is performed by a single photodetector unit. The photodetector unit is used on both sides, and thus, the device becomes simpler, without any impact on individual difference in characteristics of multiple photodetector units. Conversely, elements for illumination can be used on both sides. Also in a case where multiple photodetector units are used, the size and cost of the device can be reduced with the use of a photodetector unit having a relatively low wavelength resolution as a photodetector unit to be used on one side. This enables to reduce an attitude error due to relative tilting of a measurement surface while reducing the size and cost of the device.

    Abstract translation: 多角度比色计在光学装置中采用多角度模式和对称排列模式。 对称布置的两侧的光检测由单个光电检测器单元执行。 光检测器单元用于两侧,因此,器件变得更简单,而不会对多个光电检测器单元的特性的个体差异产生任何影响。 相反,用于照明的元件可以在两侧使用。 此外,在使用多个光检测器单元的情况下,可以通过使用具有相对较低波长分辨率的光电检测器单元作为一侧使用的光电检测器单元来减小器件的尺寸和成本。 这能够减少由于测量表面的相对倾斜导致的姿态误差,同时减小了装置的尺寸和成本。

    Spectrophotometer
    93.
    发明授权
    Spectrophotometer 有权
    分光光度计

    公开(公告)号:US08767204B2

    公开(公告)日:2014-07-01

    申请号:US13493736

    申请日:2012-06-11

    CPC classification number: G01J3/08 G01J3/027 G01J3/42

    Abstract: A spectrophotometer 10 includes built-in detector 24 and external detector 32. When a mountable/removable optical path switcher 23a is installed in a specimen chamber 23, measurement based on detection signals from built-in detector 24 is replaced by measurement based on detection signals from external detector 32. The spectrophotometer further includes a measurement data threshold-value storage unit 51 that stores threshold value T for measurement data from built-in detector 24 or external detector 32, and a light-receiving detector recognition unit 52 that recognizes which detector is able to receive the measuring light beam based on the results of a comparison between threshold value T and measurement data from built-in detector 24 or external detector 32 while the measuring light beam is being introduced into specimen chamber 23.

    Abstract translation: 分光光度计10包括内置检测器24和外部检测器32.当将可安装/可拆卸光路切换器23a安装在样本室23中时,基于来自内置检测器24的检测信号的测量被基于检测信号 分光光度计还包括测量数据阈值存储单元51,其存储来自内置检测器24或外部检测器32的测量数据的阈值T,以及光接收检测器识别单元52,其识别哪个检测器 能够基于来自内置检测器24或外部检测器32的阈值T与测量数据之间的比较结果同时测量光束被引入到样本室23中而接收测量光束。

    Atomic absorption spectrophotometer
    94.
    发明授权
    Atomic absorption spectrophotometer 有权
    原子吸收分光光度计

    公开(公告)号:US08107072B2

    公开(公告)日:2012-01-31

    申请号:US12574213

    申请日:2009-10-06

    Applicant: Kazuo Yamauchi

    Inventor: Kazuo Yamauchi

    Abstract: The present invention has been accomplished to provide an atomic absorption spectrophotometer capable of obtaining measurement data always in the state where the lowest detection limit performance is optimized, without depending on the frequency of the power supply. In a control program which runs on the microcomputer chip 42 mounted on the atomic absorption spectrophotometer 110, a plurality of lighting periods of the light sources 11 and 12 and extraction periods of the sampling data are memorized, whose lowest detection limit performance are optimized for the frequencies (50 Hz and 60 Hz) of the AC power source for driving the AC motor 22. In using the apparatus, by the control program, the frequency of the power source used in this apparatus is identified, the lighting period and sampling data extraction period corresponding to the identified frequency and the measurement mode that a user of the apparatus has previously set are selected from among a plurality of memorized values, and the appropriate lighting period is set to the hardware (PLD 43). Accordingly, without depending on the frequency, it is possible to obtain measurement data always in the state where the lowest detection limit performance is optimized.

    Abstract translation: 本发明的目的是提供一种原子吸收分光光度计,其能够在不依赖于电源的频率的情况下始终以最低检测极限性能优化的状态获得测量数据。 在安装在原子吸收分光光度计110上的微计算机芯片42上运行的控制程序中,存储光源11和12的多个点亮周期和采样数据的提取周期,其最低检测限性能针对 用于驱动AC电动机22的AC电源的频率(50Hz和60Hz)。在使用该装置时,通过控制程序识别在该装置中使用的电源的频率,照明周期和采样数据提取 从多个存储值中选择对应于所识别的频率和装置的用户预先设置的测量模式的周期,并且将适当的发光周期设置到硬件(PLD 43)。 因此,在不依赖于频率的情况下,可以在最低检测极限性能优化的状态下始终获得测量数据。

    Variable high speed shutter for spectroradiometry
    95.
    发明申请
    Variable high speed shutter for spectroradiometry 失效
    可变高速快门用于光谱辐射测量

    公开(公告)号:US20050285028A1

    公开(公告)日:2005-12-29

    申请号:US10876207

    申请日:2004-06-23

    CPC classification number: G01J3/02 G01J3/021 G01J3/0232 G01J5/62 G02B26/0825

    Abstract: A radiation pulse, such as from a solar simulator, is spectrally analyzed over a selected sampling pulse that is shorter in duration than the radiation pulse and is timed to begin after the start of the radiation pulse. A deformable membrane mirror is controlled to function as a high speed shutter in the path of the radiation pulse. When not deformed, the mirror reflects the radiation pulse into an optical instrument, such as a spectroradiometer. A sampling pulse is generated for a selected time after the start of the radiation pulse and is applied to the mirror to ensure total reflection of the radiation pulse only for the duration of the sampling pulse. Controls are provided to adjust the start time and duration of the sampling pulse, and to adjust the sensitivity of sensing the start of the radiation pulse.

    Abstract translation: 诸如来自太阳模拟器的辐射脉冲在所选择的采样脉冲上进行光谱分析,该采样脉冲的持续时间比辐射脉冲短,并且被定时以在辐射脉冲开始之后开始。 控制可变形膜反射镜用作辐射脉冲路​​径中的高速快门。 当不变形时,反射镜将辐射脉冲反射成光学仪器,例如光谱仪。 在开始辐射脉冲之后的选定时间产生采样脉冲,并将其施加到反射镜,以确保仅在采样脉冲的持续时间内的辐射脉冲的全反射。 提供控制以调整采样脉冲的开始时间和持续时间,并调整感测辐射脉冲开始的灵敏度。

    Optical cell measurement apparatus
    96.
    发明申请
    Optical cell measurement apparatus 失效
    光电池测量装置

    公开(公告)号:US20050280825A1

    公开(公告)日:2005-12-22

    申请号:US11134296

    申请日:2005-05-23

    CPC classification number: G01N21/031 G01N21/3504

    Abstract: An inventive optical cell measurement apparatus comprises a light source (S) which emits light having a predetermined wavelength range, a first mirror (M1) which reflects the light emitted from the light source (S), a long light path gas cell (1) to which the light reflected on the first mirror (M1) is introduced, a second mirror (M2) which reflects light outputted from the long light path gas cell (1), a sensor (D) which detects the light reflected on the second mirror (M2), and optical elements (21,22) disposed in a light path extending from the light source (S) to the sensor (D) and each having a bifocal property with different focal lengths as measured in two directions (X,Y) perpendicular to the light path. With this arrangement, the aberration of spherical mirrors (6,7) disposed in the gas cell (1) is corrected, thereby preventing reduction of the transmittance of the gas cell (1).

    Abstract translation: 本发明的光电池测量装置包括发射具有预定波长范围的光的光源(S),反射从光源(S)发射的光的第一反射镜(M 1),长光通道气室(1) )引导在第一反射镜(M 1)上反射的光的第二反射镜(M 2),反射从长光通道气室(1)输出的光的第二反射镜(M 2),检测在 第二反射镜(M 2)和设置在从光源(S)延伸到传感器(D)的光路中的光学元件(21,22),并且每个具有在两个方向上测量的具有不同焦距的双焦点特性 (X,Y)垂直于光路。 通过这种布置,校正设置在气室(1)中的球面镜(6,7)的像差,从而防止气室(1)的透射率的降低。

    Surface state inspecting method and substrate inspecting apparatus
    97.
    发明授权
    Surface state inspecting method and substrate inspecting apparatus 失效
    表面状态检查方法和基板检查装置

    公开(公告)号:US06947151B2

    公开(公告)日:2005-09-20

    申请号:US10338020

    申请日:2003-01-08

    CPC classification number: G01N21/8806 G01N21/95684

    Abstract: In a substrate inspecting apparatus comprising a projecting section (4) in which light sources (8), (9) and (10) are provided for emitting colored lights of R, G and B in directions having different elevation angles, one or two color components which is/are greater than the mean value of the intensities of color components is/are extracted for an inspecting region including a soldered portion. Inclined surfaces adapted to the light sources (8), (9) and (10) are converted into monochromatic shaded images by the extraction processing. A boundary position between the inclined surfaces adapted to the light sources (8) and (9) are converted into one shaded image having a mixed color of red and green and the boundary position between the inclined surfaces adapted to the light sources (9) and (10) is converted into a different shaded image.

    Abstract translation: 在包括其中设置有光源(8),(9)和(10)的投影部分(4)的基板检查装置中,用于沿着具有不同仰角的方向发射R,G和B的彩色光,一个或两个颜色 对于包括焊接部分的检查区域,提取/大于颜色分量的强度的平均值的分量。 适于光源(8),(9)和(10)的倾斜表面通过提取处理被转换为单色阴影图像。 适合于光源(8)和(9)的倾斜表面之间的边界位置被转换为具有红色和绿色混合颜色的一个阴影图像,以及适合于光源(9)和 (10)被转换成不同的阴影图像。

    Optical system for measurement of optical constant
    98.
    发明授权
    Optical system for measurement of optical constant 失效
    用于测量光学常数的光学系统

    公开(公告)号:US06914680B2

    公开(公告)日:2005-07-05

    申请号:US10255940

    申请日:2002-09-27

    Applicant: Etsuo Kawate

    Inventor: Etsuo Kawate

    Abstract: An optical system for determining an optical constant by measuring the absolute reflectance and the absolute transmittance of a substance by using an incoming side beam switching mirror for selectively switching the direction of a light from a light source to first or second converged light reflecting units. The first and second converged light reflecting units project the light from the beam switching mirror so as to be converged in an intersecting manner at the position of a sample holder that can be positioned to present a sample fitting hole or a through hole for measuring the reflectance/transmittance by providing the light to an exit side beam switching mirror and detector.

    Abstract translation: 一种用于通过使用入射侧光束切换镜测量物体的绝对反射率和绝对透射率来确定光学常数的光学系统,用于选择性地将来自光源的光的方向切换到第一或第二会聚光反射单元。 第一和第二会聚光反射单元投射来自光束切换镜的光,以便在可定位的样本保持器的位置处以交叉的方式会聚,以提供用于测量反射率的样本装配孔或通孔 通过向出射侧光束切换镜和检测器提供光来进行透射。

    Dual beam spectrophotometer modular sample system
    99.
    发明授权
    Dual beam spectrophotometer modular sample system 失效
    双光束分光光度计模块化样品系统

    公开(公告)号:US06870615B2

    公开(公告)日:2005-03-22

    申请号:US10390817

    申请日:2003-03-17

    CPC classification number: G01J3/02 G01J3/0208 G01J3/0254 G01J3/08

    Abstract: A modular dual-beam source, sample compartment and beam-combining system are provided when used with a monochromator and detector to form a spectrophotometer consisting of: (a) a source module where two ellipsoidal mirrors each produce an image of the light source, and (b) a reflecting sample-compartment module, wherein each side has two plane-mirrors, of the four plane mirrors, three are reference and one is the sample, or (c) a transmission sample-compartment module, wherein each side has two plane-mirrors, and a sample is placed between one pair of plane-mirrors, and (d) a beam-combining module wherein the source images are imaged by a second pair of ellipsoidal mirrors on a reflective chopper that combines the images at a single location that is imaged, external to the module, by another mirror, each module being kinematically located with respect to each other so the system remains optically aligned as modules are interchanged.

    Abstract translation: 当与单色仪和检测器一起使用时,提供模块化双光束源,样品室和光束组合系统,以形成分光光度计,其由以下组成:(a)源模块,其中两个椭圆面镜各自产生光源的图像,以及 (b)反射样品室模块,其中每个侧面具有两个平面镜,四个平面镜中的三个是参考的,一个是样品,或者(c)透射样品室模块,其中每个侧面具有两个 平面镜,并且将样品放置在一对平面镜之间,和(d)光束组合模块,其中源图像由反射斩波器上的第二对椭球镜成像,其将单个图像组合在一起 通过另一个镜子在模块外部成像的位置,每个模块相对于彼此被运动地定位,使得当模块互换时,系统保持光学对准。

    Spectrometer with dynamically coded components
    100.
    发明授权
    Spectrometer with dynamically coded components 失效
    光谱仪具有动态编码的组件

    公开(公告)号:US5557544A

    公开(公告)日:1996-09-17

    申请号:US164390

    申请日:1993-12-09

    CPC classification number: G01J3/02 G01J3/0275 G01J3/08 G01J2003/2866

    Abstract: In an analytic spectrometer (50) having a central computer (9), permanently installed and exchangeable components (5), such as a radiation source, a detector, a beam splitter, a filter, external measurement probes and the like, each of which exhibiting a readable data carrier (7) with encoded data of parameters characterizing the respective component (5), the data media (7) can be written to and contains changeable time dependent data concerning the history and/or the actual properties of the corresponding component (5) for example length of operation, performance deterioration parameters or calibration curves of the component (5). These data can be continuously adjusted by the central computer (9) to the current state of the component (5) so that the data medium (7) connected to the component (5) can immediately supply information concerning the current actual properties of the component (5) when installing the component (5) in another spectrometer.

    Abstract translation: 在具有中央计算机(9)的分析光谱仪(50)中,永久安装和可交换的部件(5),例如辐射源,检测器,分束器,过滤器,外部测量探针等,其中每个 展示具有表征相应组件(5)的参数的编码数据的可读数据载体(7),数据介质(7)可被写入并包含关于相应组件的历史和/或实际属性的可变时间相关数据 (5)例如组件(5)的操作长度,性能劣化参数或校准曲线。 这些数据可以由中央计算机(9)连续调整到组件(5)的当前状态,使得连接到组件(5)的数据介质(7)可以立即提供关于组件的当前实际属性的信息 (5)将组件(5)安装在另一个光谱仪中时。

Patent Agency Ranking