System and method for X-ray dark-field, phase contrast and attenuation image acquisition

    公开(公告)号:US12004896B2

    公开(公告)日:2024-06-11

    申请号:US17636929

    申请日:2020-08-21

    Inventor: Thomas Koehler

    CPC classification number: A61B6/582 A61B6/4035 A61B6/4291 A61B6/484 A61B6/54

    Abstract: The present invention relates to a system (1010) for X-ray dark field, phase contrast and attenuation image acquisition, the system comprising: an X-ray source (1020); an interferometer arrangement (1030); an X-ray detector (1040); a control unit (1050); at least one vibration transducer (1080); a processing unit (1090); and an output unit (1060). An axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector. An examination region is located between the X-ray source and the X-ray detector, wherein the axis extends through the examination region, and wherein the examination region is configured to enable location of an object to be examined. The interferometer arrangement is located between the X-ray source and the X-ray detector, and wherein the interferometer arrangement comprises a first grating (1032) and a second grating (1034). For a first mode of operation: The control unit is configured to control at least one lateral movement transducer (1070) to move the first grating or move the second grating in a lateral position direction perpendicular to the axis. The control unit is configured to control the X-ray detector to acquire image data whilst the first grating and/or second grating is moving. During an exposure time of the X-ray detector the first grating and/or second grating has moved a distance less than a period of the first grating and/or second grating. The control unit is configured to control movement of the first grating and/or second grating such that the image data is acquired whilst the first grating and/or second grating is moving. The output unit is configured to output one or more of: dark field image data, phase contrast image data, and attenuation image data; For a second mode of operation: The control unit is configured to control the X-ray detector to acquire each image data of a plurality of image data whilst the first grating and/or second grating is moving during an exposure time of the X-ray detector. The control unit is configured to control the at least one vibration transducer to vibrate the first grating and/or second grating. An amplitude of vibration is greater than or equal to the period of the first grating and/or second grating. The processing unit is configured to generate attenuation image data and/or calibration data comprising a determination of a temporal low-pass filtered version of at leas some of the plurality of image data. The output unit is configured to output the attenuation image data and/or the calibration data.

    X-ray imaging data processing device and method

    公开(公告)号:US11529112B2

    公开(公告)日:2022-12-20

    申请号:US16322509

    申请日:2018-03-23

    Abstract: Data in X-ray images of a medical device is processed in order to reduce vibration artifacts in differential phase contrast imaging. A proportionality factor between an object induced phase shift for a first x-ray energy bin and an object induced phase shift for a second x-ray energy bin is provided. At least one of a dark field signal and an object induced phase shift is determined from a detected intensity value of a pixel for the first energy bin and a detected intensity value of the pixel for the second energy bin using the proportionality factor.

    Active gratings position tracking in gratings-based phase-contrast and dark-field imaging

    公开(公告)号:US11506617B2

    公开(公告)日:2022-11-22

    申请号:US17607084

    申请日:2020-11-06

    Abstract: The invention relates to a system and a method for active grating position tracking in X-ray differential phase contrast imaging and dark-field imaging. The alignment of at least one grating positioned in an X-ray imaging device is measured by illuminating a reflection area located on the grating with a light beam, and detecting a reflection pattern of the light beam reflected by the reflection area. The reflection pattern is compared with a reference pattern corresponding to an alignment optimized for X-ray differential phase contrast imaging, and the X-ray imaging device is controlled upon the comparison of the reflection pattern and the reference pattern.

    Spectral imaging
    108.
    发明授权

    公开(公告)号:US11123034B2

    公开(公告)日:2021-09-21

    申请号:US16663824

    申请日:2019-10-25

    Abstract: An imaging system includes radiation source that emits radiation that traverses an examination region and a portion of a subject therein and a detector array that detects radiation that traverses the examination region and the portion of the subject therein and generates a signal indicative thereof. A volume scan parameter recommender recommends at least one spectral scan parameter value for a volume scan of the portion of the subject based on a spectral decomposition of first and second 2D projections acquired by the radiation source and detector array. The first and second 2D projections have different spectral characteristics. A console employs the recommended at least one spectral scan parameter value to perform the volume scan of the portion of the subject.

    Diffraction grating for X-ray phase contrast and/or dark-field imaging

    公开(公告)号:US11107599B2

    公开(公告)日:2021-08-31

    申请号:US16644178

    申请日:2018-08-24

    Inventor: Thomas Koehler

    Abstract: The present invention relates to a grating for X-ray phase contrast and/or dark-field imaging. It is described to form a photo-resist layer on a surface of a substrate. The photo-resist layer is illuminated with radiation using a mask representing a desired grating structure. The photo-resist layer is etched to remove parts of the photo-resist layer, to leave a plurality of trenches that are laterally spaced from one across the surface of the substrate. A plurality of material layers are formed on the surface of the substrate. Each layer is formed in a trench. A material layer comprises a plurality of materials, wherein the plurality of materials are formed one on top of the other in a direction perpendicular to the surface of the substrate. The plurality of materials comprises at least one material that has a k-edge absorption energy that is higher than the k-edge absorption energy of Gold and the plurality of materials comprises Gold.

    Projection data acquisition apparatus and subject support device

    公开(公告)号:US11096639B2

    公开(公告)日:2021-08-24

    申请号:US16466308

    申请日:2017-12-07

    Abstract: The invention relates to a subject support device (1) to be used in a projection data acquisition apparatus (2) for acquiring projection data of a subject (3). The subject support device comprises a support component (4) providing a support surface (5) for supporting the subject while acquiring the projection data, a diffraction grating (6) for diffracting x-rays, and a moving unit (7, 8) for moving the support component and the diffraction grating relative to each other. This relative movement can allow for a movement of the support component such that the subject is moved through x-rays (16) for determining projection data of different parts of the subject, while the diffraction grating can still be traversed by the x-rays. These projection data can be used for generating a relatively large phase-contrast and/or dark-field projection image.

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