Sensor apparatus
    111.
    发明授权
    Sensor apparatus 有权
    传感器装置

    公开(公告)号:US07956917B2

    公开(公告)日:2011-06-07

    申请号:US12857312

    申请日:2010-08-16

    摘要: The present invention relates to a sensor apparatus having a structure capable of obtaining digital values of signal components with a high accuracy using an A/D conversing circuit with the outputted digital value thereof having a small number of expressive bits. In the sensor apparatus, a voltage value corresponding to the amount of incident light to a photodiode is held by a holding circuit through an integrating circuit and a CDS circuit. Meanwhile, a voltage value corresponding to the amount of incident light to an adjacent photodiode is held by another holding circuit through an integrating circuit and a CDS circuit. The voltage values held by the respective different holding circuits are inputted to a subtracting circuit through different paths. The subtracting circuit outputs a voltage value corresponding to the difference between the two inputted voltage values. In an A/D converting section, the difference voltage outputted from the subtracting circuit is converted into a digital value.

    摘要翻译: 传感器装置技术领域本发明涉及一种传感器装置,其具有能够使用具有少量表示位的输出数字值的A / D转换电路以高精度获得信号分量的数字值的结构。 在传感器装置中,通过积分电路和CDS电路由保持电路保持与光电二极管的入射光量相对应的电压值。 同时,与通过积分电路和CDS电路的另一个保持电路保持与相邻光电二极管的入射光量相对应的电压值。 由各个不同的保持电路保持的电压值通过不同的路径输入到减法电路。 减法电路输出与两个输入电压值之间的差对应的电压值。 在A / D转换部分中,将从减法电路输出的差分电压转换为数字值。

    AD converter circuit and optical sensor
    112.
    发明授权
    AD converter circuit and optical sensor 有权
    AD转换器电路和光学传感器

    公开(公告)号:US07834798B2

    公开(公告)日:2010-11-16

    申请号:US12440167

    申请日:2007-09-05

    IPC分类号: H03M1/12

    摘要: The A/D converting circuit 20 is provided with a differential amplifying portion 21, a first variable capacitance portion 22A, a second variable capacitance portion 22B, a comparing portion 23, a connection controlling portion 24, a first feedback portion 25A and a second feedback portion 25B. Voltage values output as a differential signal from the first output terminal and the second output terminal of the differential amplifying portion 21 are converted to 6-bit digital values by a successive approximation type A/D converting circuit (made up of a first variable capacitance portion 22A, a second variable capacitance portion 22B, a comparing portion 23 and a connection controlling portion 24) and output. A difference in potential between the first common point P1 and the second common point P2 is fed back to the differential amplifying portion 21 by the first feedback portion 25A and the second feedback portion 25B, and again converted to a 6-bit digital value by the successive approximation type A/D converting circuit and output.

    摘要翻译: A / D转换电路20具有差分放大部分21,第一可变电容部分22A,第二可变电容部分22B,比较部分23,连接控制部分24,第一反馈部分25A和第二反馈 部分25B。 从差分放大部分21的第一输出端和第二输出端输出的差分信号的电压值通过逐次逼近型A / D转换电路(由第一可变电容部分 22A,第二可变电容部分22B,比较部分23和连接控制部分24)并输出。 第一公共点P1和第二公共点P2之间的电位差通过第一反馈部分25A和第二反馈部分25B被反馈到差分放大部分21,并且由第一反馈部分25A和第二反馈部分25B再次转换成6位数字值 逐次逼近型A / D转换电路和输出。

    Image sensor
    113.
    发明授权
    Image sensor 有权
    图像传感器

    公开(公告)号:US07800791B2

    公开(公告)日:2010-09-21

    申请号:US11455218

    申请日:2006-06-19

    IPC分类号: H04N1/04

    CPC分类号: G01J3/2803

    摘要: An image sensor 20A contains a photodiode array portion 21, a signal processor 22, a switching instruction part 23A and a control part 24A. Each switch SWn is provided between the corresponding photodiode PDn and the common output line L, and instructed to carry out the switching operation by the switching instruction part 23A so as to be closed, whereby the charges accumulated in the junction capacitance portion of the photodiode PDn are output to the common output line L. On the basis of the instruction from the switching instruction part 23A, the N switches SW1 to SWN carry out the switching operation so that the N switches SW1 to SWN are set to the close state in the different periods and the interval at which each switch SWn is set to the close state is equal to an integral multiple of a base period. As described above, the charge accumulation time of each of the N photodiodes PD1 to PDN is set to an integral multiple of the base period.

    摘要翻译: 图像传感器20A包含光电二极管阵列部分21,信号处理器22,切换指令部分23A和控制部分24A。 每个开关SWn设置在相应的光电二极管PDn和公共输出线L之间,并且指示由开关指令部分23A执行切换操作以便闭合,由此累积在光电二极管PDn的结电容部分中的电荷 输出到公共输出线L.根据来自开关指令部分23A的指令,N个开关SW1至SWN进行开关操作,使得N个开关SW1至SWN在不同的状态下被设置为闭合状态 每个开关SWn被设置为接近状态的时间间隔等于基准周期的整数倍。 如上所述,将N个光电二极管PD1〜PDN中的每一个的电荷累积时间设定为基本周期的整数倍。

    AD CONVERTER CIRCUIT AND OPTICAL SENSOR
    114.
    发明申请
    AD CONVERTER CIRCUIT AND OPTICAL SENSOR 有权
    AD转换器电路和光学传感器

    公开(公告)号:US20100194621A1

    公开(公告)日:2010-08-05

    申请号:US12440167

    申请日:2007-09-05

    IPC分类号: H03M1/12

    摘要: The A/D converting circuit 20 is provided with a differential amplifying portion 21, a first variable capacitance portion 22A, a second variable capacitance portion 22B, a comparing portion 23, a connection controlling portion 24, a first feedback portion 25A and a second feedback portion 25B. Voltage values output as a differential signal from the first output terminal and the second output terminal of the differential amplifying portion 21 are converted to 6-bit digital values by a successive approximation type A/D converting circuit (made up of a first variable capacitance portion 22A, a second variable capacitance portion 22B, a comparing portion 23 and a connection controlling portion 24) and output. A difference in potential between the first common point P1 and the second common point P2 is fed back to the differential amplifying portion 21 by the first feedback portion 25A and the second feedback portion 25B, and again converted to a 6-bit digital value by the successive approximation type A/D converting circuit and output.

    摘要翻译: A / D转换电路20具有差分放大部分21,第一可变电容部分22A,第二可变电容部分22B,比较部分23,连接控制部分24,第一反馈部分25A和第二反馈 部分25B。 从差分放大部分21的第一输出端和第二输出端输出的差分信号的电压值通过逐次逼近型A / D转换电路(由第一可变电容部分 22A,第二可变电容部分22B,比较部分23和连接控制部分24)并输出。 第一公共点P1和第二公共点P2之间的电位差通过第一反馈部分25A和第二反馈部分25B被反馈到差分放大部分21,并且由第一反馈部分25A和第二反馈部分25B再次转换成6位数字值 逐次逼近型A / D转换电路和输出。

    ENCODER AND PHOTODETECTOR FOR ENCODER
    115.
    发明申请
    ENCODER AND PHOTODETECTOR FOR ENCODER 审中-公开
    编码器和编码器的编码器

    公开(公告)号:US20100006748A1

    公开(公告)日:2010-01-14

    申请号:US12444959

    申请日:2007-09-18

    IPC分类号: H01J40/02

    CPC分类号: G01D5/3473 G01D5/34784

    摘要: An encoder includes a first rotating body and a second rotating body which have slits formed therein and rotate interlockingly with each other; a light source device which emits to-be-detected light to the slits; and a photodetecting device which includes a first scale and a second scale having a plurality of photodetectors aligned along annular alignment lines, and an output part which outputs output signals based on light intensities of the to-be-detected light made incident on the photodetectors of the first scale and the second scale through the slit. The rotation ratio of the second rotating body is different from that of the first rotating body, and to the photodetectors, attributes are assigned every predetermined phase angle.

    摘要翻译: 编码器包括:第一旋转体和第二旋转体,其具有形成在其中的狭缝并彼此互锁地旋转; 向所述狭缝发出被检测光的光源装置; 以及光检测装置,其包括具有沿着环形对准线排列的多个光电检测器的第一标尺和第二标尺,以及输出部,其输出基于入射到光检测器的被检测光的光强度的输出信号 第一个刻度和第二个刻度通过狭缝。 第二旋转体的旋转比与第一旋转体的旋转比不同,对于光电检测器,每个预定的相位角分配属性。

    Photodector including photodiodes having improved dynamic range, s/n ratio and speed of light detection
    116.
    发明授权
    Photodector including photodiodes having improved dynamic range, s/n ratio and speed of light detection 有权
    光电二极管包括具有改善的动态范围,s / n比和光检测速度的光电二极管

    公开(公告)号:US07442911B2

    公开(公告)日:2008-10-28

    申请号:US10540748

    申请日:2003-12-25

    IPC分类号: G01T1/24

    摘要: The present invention aims at providing a photodetector which can improve each of the dynamic range, S/N ratio, and speed of light detection. A photodiode PDm,n generates electric charges by an amount corresponding to the incident light intensity, and accumulates thus generated electric charges into a junction capacitance part. An electric charge amount level determining circuit 10m,n determines the level of amount of electric charges generated by the photodiode PDm,n and accumulated in the junction capacitance part. In an integrating circuit 20m, the capacitance value of an integral capacitance part 21 is set according to the result of electric charge amount level determination, the electric charges inputted from the photodiode PDm,n by way of a switch SW1m,n are accumulated into the integral capacitance part 21, and a voltage V20 corresponding to the amount of thus accumulated electric charges is outputted. The voltage Vinp fed to a non-inverting input terminal of an amplifier A in the integrating circuit 20m is set greater in a second period during which the integral capacitance part 21 of the integrating circuit 20m accumulates electric charges than in a first period during which the junction capacitance part of the photodiode PDm,n accumulates electric charges.

    摘要翻译: 本发明的目的在于提供一种可以改善动态范围,S / N比和光检测速度的每个光检测器。 光电二极管PD< m> m< n>产生与入射光强度相对应的量的电荷,并将由此产生的电荷累积到结电容部分中。 电荷量水平确定电路10 m,n N确定由结合电容部分中累积的光电二极管PD m m n n产生的电荷量。 在积分电路20中,积分电容部分21的电容值根据电荷量水平确定的结果设定,从光电二极管PD m m输入的电荷 通过开关SW 1 m,n n累积到积分电容部分21中,并且与由此累积的电量相对应的电压V 20 输出费用。 馈送到积分电路20中的放大器A的非反相输入端子的电压V in in 在第二周期内被设定得更大,在该周期期间,积分电容部分21 积分电路20< m>累积电荷比在光电二极管PD< m> m的结电容部分累积电荷的第一周期。

    Solid State Image Pickup Device
    117.
    发明申请
    Solid State Image Pickup Device 有权
    固态图像拾取装置

    公开(公告)号:US20070242151A1

    公开(公告)日:2007-10-18

    申请号:US10586971

    申请日:2005-01-21

    IPC分类号: G02B13/16

    摘要: The present invention relates to a solid-state image pickup apparatus which allows, when being applied as an element of a solid-state image pickup array, to reduce a non-sensitive region between the adjacent devices, and can thus obtain more accurate imaging results. The solid-state image pickup apparatus comprises a photodetecting section, an output section, a row selecting section, and a column selecting section, and further comprises M waveform shaping circuits as waveform shaping means for shaping the waveforms of row selecting signals. A row selecting signal outputted from the row selecting section is shaped by the waveform shaping circuit and is then inputted into N pixels that constitute an mth row of the photodetecting section.

    摘要翻译: 固态摄像装置技术领域本发明涉及一种固态摄像装置,其能够作为固体摄像阵列的元件而被使用,以减少相邻装置之间的非敏感区域,从而可以获得更准确的成像结果 。 固体摄像装置包括光检测部分,输出部分,行选择部分和列选择部分,并且还包括M个波形整形电路,作为对行选择信号的波形进行整形的波形整形装置。 从行选择部分输出的行选择信号由波形整形电路整形,然后被输入到构成光电检测部分第m行的N个像素中。

    Photo-detection device
    118.
    发明申请
    Photo-detection device 失效
    光检测装置

    公开(公告)号:US20070181780A1

    公开(公告)日:2007-08-09

    申请号:US10557547

    申请日:2004-05-21

    IPC分类号: H01H47/26

    摘要: The present invention relates to a photo-detecting apparatus having a structure which can accurately detect light by restraining noises from occurring. The photo-detecting apparatus comprises a first substrate having a surface provided with M×N photodiodes and switches; a second substrate having a surface provided with signal processing parts for processing output signals of the photodiodes; and a third substrate arranged between the first and second substrates. The third substrate has a first surface opposing the first substrate and a second surface opposing the second substrate. In the third substrate, M common wires for connecting the photodiodes to the signal processing parts are arranged on the first surface, whereas bonding pads connected to the respective common wires are arranged on the second surface. The photodiodes on the first substrate are electrically connected to their corresponding common wires in the third substrate by way of first bumps, whereas the signal processing parts on the second substrate are electrically connected to their corresponding bonding pads in the third substrate by way of second bumps.

    摘要翻译: 本发明涉及具有能够通过抑制噪声发生而能够精确地检测光的结构的光检测装置。 光检测装置包括具有设置有M×N个光电二极管和开关的表面的第一基板; 具有设置有用于处理所述光电二极管的输出信号的信号处理部的表面的第二基板; 以及布置在所述第一和第二基板之间的第三基板。 第三基板具有与第一基板相对的第一表面和与第二基板相对的第二表面。 在第三基板中,用于将光电二极管连接到信号处理部分的M根公共布线布置在第一表面上,而连接到各个公共布线的焊盘布置在第二表面上。 第一基板上的光电二极管通过第一凸块与第三基板中的相应公共电线电连接,而第二基板上的信号处理部分通过第二凸块电连接到第三基板中的相应接合焊盘 。

    Optical sensor
    119.
    发明申请
    Optical sensor 有权
    光学传感器

    公开(公告)号:US20060231748A1

    公开(公告)日:2006-10-19

    申请号:US10539067

    申请日:2003-12-16

    IPC分类号: G02B26/00

    CPC分类号: H04N5/335

    摘要: The present invention aims at providing a photodetector capable of fast operation with inclusion of A/D converting circuits. With a photodetector 1, (K×M×N) photodiodes PDk,m,n are arranged in M rows and (K×N) columns in a photodetection unit 10, and processes (electric charge accumulation, CDS, filtering, and A/D conversion) regarding each of the (K×N) photodiodes PDk,m,n (k=1 to K, n=1 to N) of each row are carried out successively at each time T. Meanwhile, each of an electric charge accumulation operation in an integrating circuit 20m,n, a CDS operation in a CDS 30m,n, a filterng operation in a filter circuit 40m,n, and an A/D conversion oepration in an A/D converter 50m,n, is carried out at each time N×T).

    摘要翻译: 本发明的目的在于提供一种能够在包含A / D转换电路的情况下快速操作的光检测器。 在光检测器1中,光检测单元10中的(KxM×N)个光电二极管PD< k,m,n>以M行和(K×N)列排列,并且处理(电荷积累,CDS,滤波和 对于每行的(KxN)光电二​​极管PD N,k,m,n(k = 1〜K,n = 1〜N),关于每一行的A / D转换, 同时,积分电路20中的电荷积累操作,nS,CDS 30中的CDS操作,n滤波器中的滤波运算, 在每次NxT时执行A / D转换器50 m,n N中的电路40,m,n A和A / D转换。

    Photodetector including integration capacitance section and A/D converter circuit
    120.
    发明授权
    Photodetector including integration capacitance section and A/D converter circuit 有权
    光电检测器,包括积分电容部分和A / D转换电路

    公开(公告)号:US07075050B2

    公开(公告)日:2006-07-11

    申请号:US10481084

    申请日:2002-06-14

    申请人: Seiichiro Mizuno

    发明人: Seiichiro Mizuno

    IPC分类号: G01T1/24

    摘要: An integration circuit 10 comprises: an amplifier and an integration capacitance section arranged in parallel to each other between an input terminal and an output terminal; and capacitance value switching means for switching the capacitance value of the integration capacitance section into any one of Cf1 through CfK; and inputs electric charge output from a photodiode PD, so as to accumulate the electric charge into the integration capacitance section, so as to output an integration voltage having a value corresponding to the amount of the accumulated electric charge. An A/D converter circuit 20 comprises reference voltage switching means for switching a reference voltage used in A/D conversion, into any one of Vref,1 through Vref,L, and inputs the integration voltage output from the integration circuit 10, so as to A/D-convert the integration voltage on the basis of the reference voltage switched and set to be by the reference voltage switching means, so as to output a digital value corresponding to the integration voltage.

    摘要翻译: 积分电路10包括:在输入端子和输出端子之间并联布置的放大器和积分电容部分; 以及电容值切换装置,用于将积分电容部分的电容值切换成Cf1至Cf中的任何一个; 并且输入从光电二极管PD输出的电荷,以便将积分电荷积分到积分电容部分中,以输出具有与累积电荷量对应的值的积分电压。 A / D转换电路20包括用于将A / D转换中使用的参考电压切换为V ref,1至V ref,L ,并且输入从积分电路10输出的积分电压,以便基于切换并由参考电压切换装置设置的参考电压对积分电压进行A / D转换,以便输出数字 值对应于积分电压。