公开(公告)号：US11579784B2

公开(公告)日：2023-02-14

申请号：US17090630

申请日：2020-11-05

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm

IPC: G06F3/06

Abstract: Methods, systems, and devices for refresh counters in a memory system are described. In some examples, a memory device may include two or more counters configured to increment a respective count based on refresh operations performed on a memory array. A comparison may be made between two or more of the respective counts, which may include determining a difference between the respective counts or a difference in rate of incrementing. A memory device may transmit an indication to a host device based on determining a difference between counters, and the memory device, the host device, or both, may perform various operations or enter various operational modes based on the determined difference.

公开(公告)号：US20220342604A1

公开(公告)日：2022-10-27

申请号：US17724216

申请日：2022-04-19

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Mark D. Ingram ,  Scott E. Schaefer ,  Scott D. Van De Graaff ,  Todd J. Plum

IPC: G06F3/06

Abstract: Methods, systems, and devices for memory device health evaluation at a host device are described. The health evaluation relates to a host device that is associated with a memory device that monitors and reports health information, such as one or more parameters associated with a status of the memory device. The memory device may transmit the health information to the host device, which may perform one or more operations and may transmit the health information to a device of another entity of a system (e.g., ecosystem) including the host device. The host device may include one or more circuits for transmitting and processing the health information, such as a system health engine, a safety engine, a communication component, or a combination thereof. Based on a determination by the host device or information received from an external device, the host device may transmit a command to the memory device.

公开(公告)号：US20220317916A1

公开(公告)日：2022-10-06

申请号：US17695364

申请日：2022-03-15

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Mark D. Ingram ,  Scott E. Schaefer ,  Scott D. Van De Graaff ,  Todd J. Plum

IPC: G06F3/06

Abstract: Methods, systems, and devices for inter-device communications for memory health monitoring are described. These communications relate to a host device that is associated with a memory device that monitors and reports health information (e.g., one or more parameters associated with a status of the memory device). The memory device may transmit the health information to the host device (e.g., a vehicle or a computer of the vehicle), which may perform one or more operations and transmit the health information to another entity of a system (e.g., ecosystem) including the host device. The host device may additionally or alternatively use the health information. In some cases, the other entity may receive the health information and transmit a signal back to the host device based on the health information. The other entity of the ecosystem may receive the health information and may make a determination based on the health information.

公开(公告)号：US20220238174A1

公开(公告)日：2022-07-28

申请号：US17648393

申请日：2022-01-19

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm

IPC: G11C29/42 ,  G11C29/44 ,  G11C29/12 ,  H03K19/173

Abstract: Methods, systems, and devices for metadata storage at a memory device are described to support storage of metadata information and error control information at a memory device. The metadata information and error control information may be received at the memory device via a sideband channel and corresponding pin. For example, a set of bits received via the pin may include a subset of error control bits and a subset of metadata bits. Circuitry at the memory device may receive the set of bits via the pin and may identify metadata information and error control information within the set of bits. The circuitry may route the metadata information to a corresponding subset of memory cells and the error control information to an error control circuit, where the error control circuit may route the error control information to a corresponding subset of memory cells.

公开(公告)号：US20220188186A1

公开(公告)日：2022-06-16

申请号：US17559531

申请日：2021-12-22

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm

IPC: G06F11/10 ,  G06F11/07 ,  G06F13/28

Abstract: Methods, systems, and devices are described herein for using codewords to detect or correct errors in data (e.g., data stored in a memory device). A host device may generate one or more codewords associated with data to be stored in the memory device. In some cases, the host device may generate one or more codewords for error detection and correction (e.g., corresponding to data transmitted by the host device to the memory device). In some cases, the host device may transmit the codewords and the associated data using an extended (e.g., adjustable) burst length such that the one or more codewords may be included in the burst along with the data. Additionally or alternatively, the host device may transmit one or more of the codewords over one or more channels different than the one or more channels used to transmit the data.

公开(公告)号：US11334435B2

公开(公告)日：2022-05-17

申请号：US16839438

申请日：2020-04-03

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Scott E. Schaefer

IPC: G06F11/14 ,  G06F13/16 ,  G11C11/406 ,  G06F3/06 ,  G11C11/401

Abstract: Methods, systems, and devices for performing safety event detection for a memory device are described. For example, a memory array of a memory device may operate in a first mode of operation (e.g., a normal mode of operation). An event associated with a reduction of data integrity for the memory array may be detected. In some cases, the event may be associated with a temperature of the memory device, a voltage level detected at the memory device, an error event at the memory device, or the like. Based on the detected event, it may be determined whether to adjust the operation of the memory device to a second mode of operation (e.g., a safe mode of operation). The second mode of operation may correspond to a mode of operation that increases data retention characteristics.

公开(公告)号：US20220137827A1

公开(公告)日：2022-05-05

申请号：US17505028

申请日：2021-10-19

Applicant: Micron Technology, Inc.

Inventor： Scott E. Schaefer ,  Aaron P. Boehm ,  Scott Van De Graaff ,  Todd Jackson Plum ,  Mark D. Ingram

IPC: G06F3/06

Abstract: Methods, systems, and devices for life expectancy monitoring for memory devices are described. A memory device may monitor a parameter of a component of the memory device or the memory device overall, and may determine whether the parameter satisfies a threshold. The parameter may represent or be associated with a lifetime of the component, a level of wear of the component, or an operating parameter violation of the component, or any combination thereof. The memory device may communicate, to a host device, an indication of the parameter satisfying the threshold, and the host device may use the information in the indication to adjust one or more parameters associated with operating the memory device, among other example operations.

公开(公告)号：US20220058084A1

公开(公告)日：2022-02-24

申请号：US17518160

申请日：2021-11-03

Applicant: Micron Technology, Inc.

Inventor： Aaron P. Boehm ,  Scott E. Schaefer

IPC: G06F11/10 ,  G11C11/409 ,  G06F12/14

Abstract: Methods, systems, and devices for error correction management are described. A system may include a memory device that supports internal detection and correction of corrupted data, and whether such detection and correction functionality is operating properly may be evaluated. A known error may be included (e.g., intentionally introduced) into either data stored at the memory device or an associated error correction codeword, among other options, and data or other indications subsequently generated by the memory device may be evaluated for correctness in view of the error. Thus, either the memory device or a host device coupled with the memory device, among other devices, may determine whether error detection and correction functionality internal to the memory device is operating properly.

公开(公告)号：US20220035535A1

公开(公告)日：2022-02-03

申请号：US17365013

申请日：2021-07-01

Applicant: Micron Technology, Inc.

Inventor： Scott D. Van De Graaff ,  Todd Jackson Plum ,  Scott E. Schaefer ,  Aaron P. Boehm ,  Mark D. Ingram

IPC: G06F3/06

Abstract: Methods, systems, and devices for life expectancy monitoring for memory devices are described. Some memory devices may degrade over time, and this degradation may include or refer to a reduction of an ability of the memory device to reliably store, read, process, or communicate information, among other degradation. In accordance with examples as disclosed herein, a system may include components configured for monitoring health or life expectancy of the memory device, such as components that perform comparisons between signals or other operating characteristics resulting from operating at the memory device and one or more threshold values that may be indicative of a life expectancy of the memory device. In various examples, a memory device may perform a subsequent operation based on such a comparison, or may provide an indication of a life expectancy to a host device based on one or more comparisons or determinations about health or life expectancy.

公开(公告)号：US20220012148A1

公开(公告)日：2022-01-13

申请号：US17354690

申请日：2021-06-22

Applicant: Micron Technology, Inc.

Inventor： Todd Jackson Plum ,  Scott D. Van De Graaff ,  Scott E. Schaefer ,  Aaron P. Boehm ,  Mark D. Ingram

IPC: G06F11/30 ,  G06F11/07 ,  G06F11/14

Abstract: Methods, systems, and devices for monitoring and reporting a status of a memory device are described. A memory device may include monitoring circuitry that may be configured to monitor health and wear information for the memory device. A host device may write to a dedicated register of the memory device, to configure the memory device with health status information reporting parameters. The memory device may monitor and report the health status information of the memory device based on the received reporting configuration or based on a default configuration, and may write one or more values indicative of the health status information to a dedicated register. The host device may perform a read on the readout register to obtain the health status information, as indicated by the one or more values, and may adjust operating procedures or take other actions based on the received health status information.