Patent search cpc:"H01J41/04" Page 17

161.

发明授权
Gas analysis apparatus comprising plural ionization chambers with different ionizing electron beam energy levels in the chambers 失效
Title translation: 气体分析装置包括在室内具有不同电离电子束能级的多个电离室

公开(公告)号：US3355587A

公开(公告)日：1967-11-28

申请号：US53139766

申请日：1966-03-03

Applicant: LUDOLF JENCKEL

Inventor： LUDOLF JENCKEL

IPC: G01N27/66 , G01N30/70 , H01J41/04

CPC classification number: G01N30/70 , G01N27/66 , H01J41/04

162.

发明授权
Miniature ionization gage including a grid having multitudinous discrete openings 失效
Title translation: 微型电离计包括具有多个离散开口的网格

公开(公告)号：US3350590A

公开(公告)日：1967-10-31

申请号：US56387066

申请日：1966-07-08

Applicant: GEN ELECTRIC

Inventor： YOUNG JAMES R

IPC: H01J41/04

CPC classification number: H01J41/04

163.

发明授权
Multiple evaporation rate monitor and control 失效
Title translation: 多重蒸发速率监测和控制

公开(公告)号：US3316386A

公开(公告)日：1967-04-25

申请号：US36897564

申请日：1964-05-20

Applicant: BENDIX CORP

Inventor： YAFFE THEODORE H , VERGARA WILLIAM C , GREENHOUSE HAROLD M

IPC: C23C14/54 , G01B7/06 , H01J41/04

CPC classification number: G01B7/06 , C23C14/548 , H01J41/04

164.

发明授权
Ion gauge system having overload protection 失效
Title translation: 离子量规系统具有过载保护

公开(公告)号：US3292090A

公开(公告)日：1966-12-13

申请号：US37963364

申请日：1964-07-01

Applicant: GEN ELECTRIC

Inventor： WATTERS ROBERT L

IPC: G01L21/32 , H01J41/04 , H03F1/54

CPC classification number: H03F1/544 , G01L21/32 , H01J41/04

165.

发明授权
Electron vacuum tube employing orbiting electrons 失效
Title translation: 使用轨道电子的电子真空管

公开(公告)号：US3244990A

公开(公告)日：1966-04-05

申请号：US26110463

申请日：1963-02-26

Applicant: WISCONSIN ALUMNI RES FOUND

Inventor： HERB RAYMOND G , PAULY THEODORE E

IPC: H01J9/38 , H01J41/04 , H01J41/14 , H01J41/16 , H03F3/02

CPC classification number: H01J41/04 , H01J9/38 , H01J41/14 , H01J41/16 , H03F3/02

166.

发明授权
Universal stroboscopic electron schlieren detector having beam-pulse synchronizing means 失效
Title translation: 具有波束脉冲同步装置的通用频闪电子schlieren检测器

公开(公告)号：US3230366A

公开(公告)日：1966-01-18

申请号：US31509263

申请日：1963-10-09

Applicant: MIELCZAREK STANLEY R , SCHUBERT DAVID C , MARTON LADISLAUS L

Inventor： MIELCZAREK STANLEY R , SCHUBERT DAVID C , MARTON LADISLAUS L

IPC: G01N21/45 , H01J41/04

CPC classification number: G01N21/455 , H01J41/04

167.

发明授权
Magnetron type ionization gauges 失效
Title translation: 磁控管式电离计

公开(公告)号：US3109115A

公开(公告)日：1963-10-29

申请号：US14445361

申请日：1961-10-11

Applicant: GEN ELECTRIC

Inventor： LAFFERTY JAMES M

IPC: G01L21/00 , H01J41/04

CPC classification number: H01J41/04 , G01L21/00

168.

发明授权
Ionization vacuum gauge 失效
Title translation: 电离真空计

公开(公告)号：US3067346A

公开(公告)日：1962-12-04

申请号：US85785559

申请日：1959-12-07

Applicant: SYLVANIA ELECTRIC PROD

Inventor： PENNINGTON EDGAR T

IPC: H01J41/04

CPC classification number: H01J41/04

169.

发明授权
Electron test tube 失效
Title translation: 电子试管

公开(公告)号：US2997613A

公开(公告)日：1961-08-22

申请号：US84612059

申请日：1959-10-13

Applicant: SYLVANIA ELECTRIC PROD

Inventor： KINGSLEY WAYNE H

IPC: H01J41/04

CPC classification number: H01J41/04

170.

发明授权
Mean free path vacuum gage 失效
Title translation: 平均自由通道真空计

公开(公告)号：US2961601A

公开(公告)日：1960-11-22

申请号：US70555757

申请日：1957-12-27

Applicant: GEN ELECTRIC

Inventor： BAUGHMAN HOWARD B

IPC: G01L21/00 , H01J41/04 , H01J41/06

CPC classification number: H01J41/06 , G01L21/00 , H01J41/04

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