Abstract:
A magnetoresistive memory has first and second magnetic tunnel junction (MTJ) elements operated differentially, each with a pinned magnetic layer and a free magnetic layer that can have field alignments that are parallel or anti-parallel, producing differential high and low resistance states representing a bit cell value. Writing a high resistance state to an element requires an opposite write current polarity through the pinned and free layers, and differential operation requires that the two MTJ elements be written to different resistance states. One aspect is to arrange or connect the layers in normal and reverse order relative to a current bias source, thereby achieving opposite write current polarities relative to the layers using the same current polarity relative to the current bias source. The differentially operated MTJ elements can supplement or replace single MTJ elements in a nonvolatile memory bit cell array.
Abstract:
Magneto-resistive memory bit cells in an array have high or low resistance states storing logic values. During read operations, a bias source is coupled to an addressed memory word, coupling a parameter related to cell resistance to a sense amplifier at each bit position. The sense amplifiers determine whether the parameter value is greater or less than a reference value between the high and low resistance states. The reference value is derived by averaging or splitting a difference of resistances of reference cells at high and/or low resistance states. Bias current is conducted over address lines with varying resistance, due to different distances between the sense amplifiers and addressed memory words, which is canceled by inserting into the comparison circuit a resistance from a dummy addressing array, equal to the resistance of the conductor addressing the selected word line and bit position.
Abstract:
A magnetoresistive random access memory (MRAM) cell includes a magnetic tunnel junction (MTJ), a top electrode disposed over the MTJ, a bottom electrode disposed below the MTJ, and an induction line disposed above or below the MTJ. The induction line is configured to induce a magnetic field at the MTJ.
Abstract:
The embodiments disclose a method of using a molecular self-assembly of a predetermined spherical or cylindrical block copolymer (BCP) to create a nano-scale dot array pattern, transferring the BCP pattern into a chromium (Cr) hard mask layer, and then into a substrate. The patterned substrate is chemically modified with a predetermined self-assembled monolayer (SAM) with a hydrophobic functional group to form a super-hydrophobic surface.
Abstract:
A magnetoresistive memory has first and second magnetic tunnel junction (MTJ) elements operated differentially, each with a pinned magnetic layer and a free magnetic layer that can have field alignments that are parallel or anti-parallel, producing differential high and low resistance states representing a bit cell value. Writing a high resistance state to an element requires an opposite write current polarity through the pinned and free layers, and differential operation requires that the two MTJ elements be written to different resistance states. One aspect is to arrange or connect the layers in normal and reverse order relative to a current bias source, thereby achieving opposite write current polarities relative to the layers using the same current polarity relative to the current bias source. The differentially operated MTJ elements can supplement or replace single MTJ elements in a nonvolatile memory bit cell array.
Abstract:
A word line driver of a semiconductor memory includes logic circuitry for coupling a word line to a first node set at a first voltage level when the word line driver is in a first state or to a second node set at a second voltage level when the word line driver is in a second state. A capacitor is configured to be charged to a third voltage level that is greater than the first and second voltage levels. First and second transistors are configured to selectively couple the word line to the capacitor and to a third node set at a fourth voltage level when the word line driver is in a third state. The fourth voltage level is greater than the first voltage level and less than the second voltage level.
Abstract:
A word line driver of a semiconductor memory includes logic circuitry for coupling a word line to a first node set at a first voltage level when the word line driver is in a first state or to a second node set at a second voltage level when the word line driver is in a second state. A capacitor is configured to be charged to a third voltage level that is greater than the first and second voltage levels. First and second transistors are configured to selectively couple the word line to the capacitor and to a third node set at a fourth voltage level when the word line driver is in a third state. The fourth voltage level is greater than the first voltage level and less than the second voltage level.
Abstract:
A magnetoresistive memory stores logic values in high and low resistance states of magnetic tunnel junction elements. Instead of comparing the resistance of elements to a fixed threshold to discern a logic state, the resistances of elements are self-compared before and after imposing a low resistance state. A measure of the resistance of an element in its unknown resistance state is stored, for example by charging a capacitor to a voltage produced when read current bias is applied. Then the element is written into its low resistance state and read current bias is applied again to develop another voltage, representing the low resistance state. A comparison circuit using current summing and an offset providing a minimum difference tolerance determines whether the resistance of the element was changed or remained the same. This determines the logic state of the element.