SYSTEM FOR TESTING INTEGRATED CIRCUITS
    13.
    发明申请
    SYSTEM FOR TESTING INTEGRATED CIRCUITS 审中-公开
    用于测试集成电路的系统

    公开(公告)号:US20100049464A1

    公开(公告)日:2010-02-25

    申请号:US12193724

    申请日:2008-08-19

    CPC classification number: G01R31/2886 G01R31/2889

    Abstract: The invention provides for a system for testing integrated circuitry. The system includes a local computational device, a communications link connected to the computational device, and testing circuitry operatively connected to the computational device via the communications link and configured to generate integrated circuitry test signals. The system also includes adaptor circuitry connected to the testing circuitry and configured to provide an electrical and physical interface with the integrated circuits, as well as routing circuitry interposed between the testing and adaptor circuitry to rout the test signals to respective dies of the integrated circuits. Also included is a handling mechanism for retaining and manipulating a carrier on which the integrated circuits are positioned, and a controller operatively connected to the handling mechanism for controlling operation thereof and connected to the communications device for supervision by the computational device.

    Abstract translation: 本发明提供了一种用于测试集成电路的系统。 该系统包括本地计算设备,连接到计算设备的通信链路以及经由通信链路可操作地连接到计算设备的测试电路,并且被配置为生成集成电路测试信号。 该系统还包括连接到测试电路并且被配置为提供与集成电路的电和物理接口的适配器电路,以及插入在测试和适配器电路之间的路由电路,以将测试信号排除到集成电路的相应管芯。 还包括用于保持和操纵集成电路所在的载体的处理机构,以及可操作地连接到处理机构的控制器,用于控制其操作并连接到通信设备以进行计算设备的监视。

    APPARATUS FOR TESTING INTEGRATED CIRCUITRY
    14.
    发明申请
    APPARATUS FOR TESTING INTEGRATED CIRCUITRY 有权
    用于测试集成电路的装置

    公开(公告)号:US20100045330A1

    公开(公告)日:2010-02-25

    申请号:US12193720

    申请日:2008-08-19

    CPC classification number: G01R31/2886

    Abstract: A testing apparatus for testing integrated circuits mounted in a carrier includes a support assembly. A controller is mounted in the support assembly. The controller is programmed to process test signals from the integrated circuits. A retaining assembly is arranged on the support assembly and is configured to receive and retain the carrier during testing. A displacement mechanism is arranged on the support assembly for displacing the retaining assembly relative to the support assembly into and out of an operative condition. Testing circuitry is operatively connected to the controller and has at least test signal generation and measurement circuitry and adaptor circuitry for operative engagement with the integrated circuits being tested, the adaptor circuitry being configured to provide both a physical and an electrical interface with the integrated circuits.

    Abstract translation: 用于测试安装在载体中的集成电路的测试装置包括支撑组件。 控制器安装在支撑组件中。 控制器被编程为处理来自集成电路的测试信号。 保持组件布置在支撑组件上并且构造成在测试期间接收和保持载体。 位移机构布置在支撑组件上,用于使保持组件相对于支撑组件移动和移出操作状态。 测试电路可操作地连接到控制器,并且至少具有测试信号生成和测量电路和适配器电路,用于与被测试的集成电路操作性地接合,适配器电路被配置为提供与集成电路的物理和电接口。

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