Apparatus for testing integrated circuitry
    2.
    发明授权
    Apparatus for testing integrated circuitry 有权
    集成电路测试装置

    公开(公告)号:US07863890B2

    公开(公告)日:2011-01-04

    申请号:US12193720

    申请日:2008-08-19

    CPC classification number: G01R31/2886

    Abstract: A testing apparatus for testing integrated circuits mounted in a carrier includes a support assembly. A controller is mounted in the support assembly. The controller is programmed to process test signals from the integrated circuits. A retaining assembly is arranged on the support assembly and is configured to receive and retain the carrier during testing. A displacement mechanism is arranged on the support assembly for displacing the retaining assembly relative to the support assembly into and out of an operative condition. Testing circuitry is operatively connected to the controller and has at least test signal generation and measurement circuitry and adaptor circuitry for operative engagement with the integrated circuits being tested, the adaptor circuitry being configured to provide both a physical and an electrical interface with the integrated circuits.

    Abstract translation: 用于测试安装在载体中的集成电路的测试装置包括支撑组件。 控制器安装在支撑组件中。 控制器被编程为处理来自集成电路的测试信号。 保持组件布置在支撑组件上并且构造成在测试期间接收和保持载体。 位移机构布置在支撑组件上,用于使保持组件相对于支撑组件移动和移出操作状态。 测试电路可操作地连接到控制器,并且至少具有测试信号生成和测量电路和适配器电路,用于与被测试的集成电路操作性接合,适配器电路被配置为提供与集成电路的物理和电接口。

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