Abstract:
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
Abstract:
A magneto-optical device includes a waveguide structure that has at least one cladding region and core region. The cladding region and core region comprise semiconductor alloy materials. Either the at least one cladding region or the core region is doped with ferromagnetic materials so as to increase the magneto-optical activity of the device.
Abstract:
In swept source Raman (SSR) spectroscopy, a swept laser beam illuminates a sample, which inelastically scatters some of the incident light. This inelastically scattered light is shifted in wavelength by an amount called the Raman shift. The Raman-shifted light can be measured with a fixed spectrally selective filter and a detector. The Raman spectrum can be obtained by sweeping the wavelength of the excitation source and, therefore, the Raman shift. The resolution of the Raman spectrum is determined by the filter bandwidth and the frequency resolution of the swept source. An SSR spectrometer can be smaller, more sensitive, and less expensive than a conventional Raman spectrometer because it uses a tunable laser and a fixed filter instead of free-space propagation for spectral separation. Its sensitivity depends on the size of the collection optics. And it can use a nonlinearly swept laser beam thanks to a wavemeter that measures the beam's absolute wavelength during Raman spectrum acquisition.
Abstract:
In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnostic tool for characterizing the devices/circuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplified spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to characterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.
Abstract:
A wavelength division multiplexing (WDM) optical communication system includes an EIT based wavelength converter/switch. EIT, i.e., electromagnetically induced transparency, refers to the elimination of resonant absorption on an otherwise optically allowed transition by the application of a coherent coupling light field. In one embodiment, the EIT converter provides a 1×1 converter for converting a data stream from a first wavelength to a second wavelength. A constant wave probe field and a coherent coupling field, which has a state corresponding to data stream, are applied to the EIT medium. The converter can convert the data stream from a wavelength corresponding to the coupling field to the wavelength of the probe field. In a further embodiment, additional pairs of probe and coupling fields are applied to the EIT medium to provide an N×N converter.