Method and apparatus for characterization of devices and circuits
    11.
    发明授权
    Method and apparatus for characterization of devices and circuits 失效
    用于表征器件和电路的方法和装置

    公开(公告)号:US07249881B2

    公开(公告)日:2007-07-31

    申请号:US11119093

    申请日:2005-04-29

    CPC classification number: G01K3/00 G01N25/18

    Abstract: A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.

    Abstract translation: 提出了一种用于执行设备表征的方法和装置。 通过在器件的第一位置获得第一温度测量值,获得第二温度测量值,计算温度测量值之间的差值,并使用温度和/或温度差异来确定器件的特性来确定器件的特性 设备确定。

    OPTICAL CHARACTERIZATION OF PHOTONIC INTEGRATED CIRCUITS
    14.
    发明申请
    OPTICAL CHARACTERIZATION OF PHOTONIC INTEGRATED CIRCUITS 有权
    光电集成电路的光学特性

    公开(公告)号:US20090245322A1

    公开(公告)日:2009-10-01

    申请号:US12115201

    申请日:2008-05-05

    CPC classification number: G01K11/125

    Abstract: In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnostic tool for characterizing the devices/circuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplified spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to characterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.

    Abstract translation: 一方面,本发明提供了用于光子器件和/或电路的光学表征的技术和装置。 作为示例,这些技术可用于识别光子集成电路中的损坏设备。 在一些实施例中,热成像被用作诊断工具,用于表征所研究的装置/电路。 例如,在一个实施例中,可以使用来自一个放大器的放大的自发发射作为热调制输入到另一个放大器来表征集成级联半导体放大器。 第二放大器的反射反射图像可以显示缺陷(如果存在)。 此外,在一些实施例中,可以采用结合总能量模型的热成像来光学地表征光子电路的元件和/或映射整个电路中的光功率分布。

    EIT based optical switch/wavelength converter
    15.
    发明授权
    EIT based optical switch/wavelength converter 失效
    基于EIT的光开关/波长转换器

    公开(公告)号:US06426831B1

    公开(公告)日:2002-07-30

    申请号:US09552914

    申请日:2000-04-20

    CPC classification number: G02F2/004

    Abstract: A wavelength division multiplexing (WDM) optical communication system includes an EIT based wavelength converter/switch. EIT, i.e., electromagnetically induced transparency, refers to the elimination of resonant absorption on an otherwise optically allowed transition by the application of a coherent coupling light field. In one embodiment, the EIT converter provides a 1×1 converter for converting a data stream from a first wavelength to a second wavelength. A constant wave probe field and a coherent coupling field, which has a state corresponding to data stream, are applied to the EIT medium. The converter can convert the data stream from a wavelength corresponding to the coupling field to the wavelength of the probe field. In a further embodiment, additional pairs of probe and coupling fields are applied to the EIT medium to provide an N×N converter.

    Abstract translation: 波分复用(WDM)光通信系统包括基于EIT的波长转换器/开关。 EIT,即电磁感应透明度,是指通过施加相干耦合光场消除光学允许的转换上的谐振吸收。 在一个实施例中,EIT转换器提供1x1转换器,用于将数据流从第一波长转换成第二波长。 具有对应于数据流的状态的恒定波探测场和相干耦合场应用于EIT介质。 转换器可以将来自与耦合场相对应的波长的数据流转换为探测场的波长。 在另一实施例中,附加的探针和耦合场对被应用于EIT介质以提供N×N转换器。

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