公开(公告)号：US20110080581A1

公开(公告)日：2011-04-07

申请号：US12900172

申请日：2010-10-07

Applicant: Rohit Bhargava ,  Brian T. Cunningham

Inventor： Rohit Bhargava ,  Brian T. Cunningham

IPC: G01J3/28 ,  G01J3/40

CPC classification number: G01J3/12 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0275 ,  G01J3/0286 ,  G01J3/0289 ,  G01N21/35

Abstract: Described herein are spectrometers comprising one or more wavelength-selective filters, such as guided mode resonance filters. Some of the spectrometers described herein are configured for obtaining absorbance spectra in a discrete fashion by measuring absorbances of a sample at multiple discrete wavelengths or wavelength bands. In another aspect, methods are also provided for obtaining spectra, images and chemical maps of samples in a discrete fashion.

Abstract translation: 这里描述的是包括一个或多个波长选择滤光器的光谱仪，例如导模谐振滤波器。 这里描述的一些光谱仪被配置为通过测量在多个离散波长或波长带上的样品的吸光度以离散的方式获得吸收光谱。 在另一方面，还提供了用于以离散方式获得样品的光谱，图像和化学图谱的方法。

公开(公告)号：US20120116739A1

公开(公告)日：2012-05-10

申请号：US12941159

申请日：2010-11-08

Applicant: Brynmor J. Davis ,  Paul Scott Carney ,  Rohit Bhargava

Inventor： Brynmor J. Davis ,  Paul Scott Carney ,  Rohit Bhargava

IPC: G06G7/48 ,  G01J3/28 ,  G06F19/00

CPC classification number: G01J3/0218 ,  G01J3/0275

Abstract: Methods and a non-transient computer medium embodying computer readable code for extracting bulk spectroscopic properties of a particle. A forward model is built of an optical field focused on, and interacting with, the particle, where the forward model parameterized in terms of at least one geometrical characteristic of the particle. The particle, which may be a filamentary material, is illuminated with an incident optical field having a spectral range. Either a transmitted or scattered optical field is detected in a far-field zone as a function of wavenumber to obtain a measured spectrum. The measured spectrum is inverted to recover the imaginary part of the complex refractive index of the particle.

Abstract translation: 方法和体现计算机可读代码的非瞬态计算机介质，用于提取粒子的体光谱性质。 正向模型由聚焦在粒子上的光场构成，其中前向模型根据粒子的至少一个几何特征参数化。 可以是具有光谱范围的入射光场照射可以是丝状材料的颗粒。 在远场区域中检测到发射或散射的光场作为波数的函数，以获得测量的光谱。 测量的光谱被反转以恢复颗粒的复折射率的虚部。