公开(公告)号：US20170287706A1

公开(公告)日：2017-10-05

申请号：US15624603

申请日：2017-06-15

Applicant: Stratio, Inc.

Inventor： Woo-Shik Jung ,  Yeul Na ,  Youngsik Kim ,  Jae Hyung Lee ,  Jin Hyung Lee

IPC: H01L21/02 ,  H01L21/265 ,  H01L21/311

Abstract: Methods for reducing surface roughness of germanium are described herein. In some embodiments, the surface roughness is reduced by thermal oxidation of germanium. In some embodiments, the surface roughness is further reduced by controlling a rate of the thermal oxidation. In some embodiments, the surface roughness is reduced by thermal annealing.

公开(公告)号：US20200256731A1

公开(公告)日：2020-08-13

申请号：US16859941

申请日：2020-04-27

Applicant: Stratio

Inventor： Jae Hyung LEE ,  Youngsik KIM ,  Yeul NA ,  Juhyung KANG

IPC: G01J3/14 ,  G01J3/02 ,  G02B5/04 ,  G01J3/28 ,  G02B27/10

Abstract: An apparatus for analyzing light includes an input aperture for receiving light; a first set of one or more lenses configured to relay light from the input aperture; and a prism assembly configured to disperse light from the first set of one or more lenses. The prism assembly includes a plurality of prisms that includes a first prism, a second prism that is distinct from the first prism, and a third prism that is distinct from the first prism and the second prism. The first prism is mechanically coupled with the second prism and the second prism is mechanically coupled with the third prism. The apparatus also includes a second set of one or more lenses configured to focus the dispersed light from the prism assembly; and an array detector configured for converting the light from the second set of one or more lenses to electrical signals.

公开(公告)号：US10281327B2

公开(公告)日：2019-05-07

申请号：US15821591

申请日：2017-11-22

Applicant: Stratio

Inventor： Jae Hyung Lee ,  Youngsik Kim ,  Yeul Na ,  Juhyung Kang

IPC: G01J3/14 ,  G01J3/02 ,  G02B27/10 ,  G02B5/04 ,  G01J3/28

Abstract: An apparatus for analyzing light includes an input aperture for receiving light; a first set of one or more lenses configured to relay light from the input aperture; and a prism assembly configured to disperse light from the first set of one or more lenses. The prism assembly includes a plurality of prisms that includes a first prism, a second prism that is distinct from the first prism, and a third prism that is distinct from the first prism and the second prism. The first prism is mechanically coupled with the second prism and the second prism is mechanically coupled with the third prism. The apparatus also includes a second set of one or more lenses configured to focus the dispersed light from the prism assembly; and an array detector configured for converting the light from the second set of one or more lenses to electrical signals.

公开(公告)号：US10109662B2

公开(公告)日：2018-10-23

申请号：US14967262

申请日：2015-12-11

Applicant: Stratio Inc.

Inventor： Jae Hyung Lee ,  Yeul Na ,  Youngsik Kim ,  Woo-Shik Jung

IPC: H01L27/146 ,  H01L31/113 ,  H04N5/378 ,  H01L31/18

Abstract: A device for sensing light includes a first semiconductor region doped with a dopant of a first type and a second semiconductor region doped with a dopant of a second type. The second semiconductor region is positioned above the first semiconductor region. The device includes a gate insulation layer; a gate, a source, and a drain. The second semiconductor region has a top surface that is positioned toward the gate insulation layer and a bottom surface that is positioned opposite to the top surface of the second semiconductor region. The second semiconductor region has an upper portion that includes the top surface of the second semiconductor region and a lower portion that includes the bottom surface of the second semiconductor region and is mutually exclusive with the upper portion. The first semiconductor region is in contact with both the upper portion and the lower portion of the second semiconductor region.

公开(公告)号：US20180094976A1

公开(公告)日：2018-04-05

申请号：US15821591

申请日：2017-11-22

Applicant: Stratio

Inventor： Jae Hyung LEE ,  Youngsik Kim ,  Yeul Na ,  Juhyung Kang

IPC: G01J3/14 ,  G01J3/02 ,  G01J3/28 ,  G02B5/04 ,  G02B27/10

CPC classification number: G01J3/14 ,  G01J3/0289 ,  G01J3/2803 ,  G02B5/04 ,  G02B5/045 ,  G02B27/1013

Abstract: An apparatus for analyzing light includes an input aperture for receiving light; a first set of one or more lenses configured to relay light from the input aperture; and a prism assembly configured to disperse light from the first set of one or more lenses. The prism assembly includes a plurality of prisms that includes a first prism, a second prism that is distinct from the first prism, and a third prism that is distinct from the first prism and the second prism. The first prism is mechanically coupled with the second prism and the second prism is mechanically coupled with the third prism. The apparatus also includes a second set of one or more lenses configured to focus the dispersed light from the prism assembly; and an array detector configured for converting the light from the second set of one or more lenses to electrical signals.

公开(公告)号：US20160099372A1

公开(公告)日：2016-04-07

申请号：US14967262

申请日：2015-12-11

Applicant: Stratio Inc.

Inventor： Jae Hyung Lee ,  Yeul Na ,  Youngsik Kim ,  Woo-Shik Jung

IPC: H01L31/113 ,  H01L31/18 ,  H01L27/146

CPC classification number: H01L31/1136 ,  H01L27/14616 ,  H01L31/1804 ,  H04N5/378

Abstract: A device for sensing light includes a first semiconductor region doped with a dopant of a first type and a second semiconductor region doped with a dopant of a second type. The second semiconductor region is positioned above the first semiconductor region. The device includes a gate insulation layer; a gate, a source, and a drain. The second semiconductor region has a top surface that is positioned toward the gate insulation layer and a bottom surface that is positioned opposite to the top surface of the second semiconductor region. The second semiconductor region has an upper portion that includes the top surface of the second semiconductor region and a lower portion that includes the bottom surface of the second semiconductor region and is mutually exclusive with the upper portion. The first semiconductor region is in contact with both the upper portion and the lower portion of the second semiconductor region.

Abstract translation: 用于感测光的装置包括掺杂有第一类型的掺杂剂的第一半导体区域和掺杂有第二类型的掺杂剂的第二半导体区域。 第二半导体区域位于第一半导体区域的上方。 该器件包括栅绝缘层; 一个门，一个源头和一个排水沟。 第二半导体区域具有朝向栅极绝缘层定位的顶表面和与第二半导体区域的顶表面相对定位的底表面。 第二半导体区域具有包括第二半导体区域的顶表面的上部和包括第二半导体区域的底表面并与上部相互排斥的下部。 第一半导体区域与第二半导体区域的上部和下部部分接触。