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公开(公告)号:US20220178027A1
公开(公告)日:2022-06-09
申请号:US17448787
申请日:2021-09-24
Applicant: ASM IP HOLDING B.V.
Inventor: Sean T. Barry , Yamile A.M. Wasslen , Antti H. Rahtu
IPC: C23C16/455 , C23C16/32 , C23C16/34 , C23C16/18 , C23C16/513
Abstract: Atomic layer deposition (ALD) type processes for producing metal containing thin films comprise feeding into a reaction space vapor phase pulses of metal containing cyclopentadienyl precursors as a metal source material. In preferred embodiments the metal containing cyclopentadienyl reactant comprises a metal atom that is not directly bonded to an oxygen or halide atom. In other embodiments the metal atom is bonded to a cyclopentadienyl compound and separately bonded to at least one ligand via a nitrogen atom. In still other embodiments the metal containing cyclopentadienyl compound comprises a nitrogen-bridged ligand.
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公开(公告)号:US11155919B2
公开(公告)日:2021-10-26
申请号:US16411964
申请日:2019-05-14
Applicant: ASM IP HOLDING B.V.
Inventor: Sean T. Barry , Yamile A. M. Wasslen , Antti H. Rahtu
IPC: C23C16/455 , C23C16/32 , C23C16/34 , C23C16/18 , C23C16/513
Abstract: Atomic layer deposition (ALD) type processes for producing metal containing thin films comprise feeding into a reaction space vapor phase pulses of metal containing cyclopentadienyl precursors as a metal source material. In preferred embodiments the metal containing cyclopentadienyl reactant comprises a metal atom that is not directly bonded to an oxygen or halide atom. In other embodiments the metal atom is bonded to a cyclopentadienyl compound and separately bonded to at least one ligand via a nitrogen atom. In still other embodiments the metal containing cyclopentadienyl compound comprises a nitrogen-bridged ligand.
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公开(公告)号:US20170369997A1
公开(公告)日:2017-12-28
申请号:US15700494
申请日:2017-09-11
Applicant: ASM IP HOLDING B.V.
Inventor: Sean T. Barry , Yamile A.M. Wasslen , Antti H. Rahtu
IPC: C23C16/455 , C23C16/32 , C23C16/34 , C23C16/513 , C23C16/18
CPC classification number: C23C16/45553 , C23C16/18 , C23C16/32 , C23C16/34 , C23C16/45525 , C23C16/45527 , C23C16/45536 , C23C16/513
Abstract: Atomic layer deposition (ALD) type processes for producing metal containing thin films comprise feeding into a reaction space vapor phase pulses of metal containing cyclopentadienyl precursors as a metal source material. In preferred embodiments the metal containing cyclopentadienyl reactant comprises a metal atom that is not directly bonded to an oxygen or halide atom. In other embodiments the metal atom is bonded to a cyclopentadienyl compound and separately bonded to at least one ligand via a nitrogen atom. In still other embodiments the metal containing cyclopentadienyl compound comprises a nitrogen-bridged ligand.
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