Application cooperation method and apparatus
    11.
    发明授权
    Application cooperation method and apparatus 失效
    应用协作方法及装置

    公开(公告)号:US06275977B1

    公开(公告)日:2001-08-14

    申请号:US09206408

    申请日:1998-12-07

    IPC分类号: G06F9445

    CPC分类号: G06F8/30 G06F8/24

    摘要: In an application cooperation apparatus for supporting configuration/reconfiguration of a business process support system, node class object information defining a logical AP object as an object class for each common process item and attribute and defining an inheritance relationship between object classes as a tree structure is provided to define interactively with a user a logical process model having logical AP objects as business components. Next, by referring to logical-physical object correspondence relationship information, an implementation process model for the logical process model is developed to generate execution control scripts in a definition language of this model.

    摘要翻译: 在用于支持业务处理支持系统的配置/重新配置的应用协作装置中,将每个公共处理项目和属性定义为对象类的逻辑AP对象的节点类对象信息和将对象类之间的继承关系定义为树结构的是 被提供用于与用户交互地定义具有逻辑AP对象作为业务组件的逻辑过程模型。 接下来,通过参考逻辑物理对象关系信息,开发用于逻辑处理模型的实现过程模型,以生成该模型的定义语言中的执行控制脚本。

    Temperature measuring apparatus
    12.
    发明授权
    Temperature measuring apparatus 有权
    温度测量仪

    公开(公告)号:US08608378B2

    公开(公告)日:2013-12-17

    申请号:US13516916

    申请日:2010-12-06

    IPC分类号: G01K7/00

    摘要: Disclosed is a temperature measuring apparatus which is provided with: a substrate (2); a temperature sensor (3) disposed on one surface of the substrate (2); and a wire (8) disposed to electrically connect together a circuit, which detects a temperature using the temperature sensor (3), and the temperature sensor (3). In said surface of the substrate (2), a recessed section (7) having a heat capacity smaller than that of the material of the substrate (2) is formed on the periphery of the temperature sensor (3). The recessed section (7) is formed at a predetermined interval from the temperature sensor (3) such that the recessed section surrounds the temperature sensor (3) and has predetermined width and depth. Preferably, the low heat capacity zone is the recessed section (7), i.e., the groove having a recessed cross-section.

    摘要翻译: 公开了一种温度测量装置,其设置有:基板(2); 设置在所述基板(2)的一个表面上的温度传感器(3); 以及布置成将使用温度传感器(3)检测温度的电路和温度传感器(3)电连接在一起的线(8)。 在基板(2)的所述表面中,在温度传感器(3)的周围形成有具有小于基板(2)的材料的热容的凹部(7)。 凹部(7)从温度传感器(3)以预定的间隔形成,使得凹部包围温度传感器(3)并且具有预定的宽度和深度。 优选地,低热容区是凹部(7),即凹槽具有凹入的横截面。

    BATTERY MODULE CHARGING SYSTEM
    13.
    发明申请
    BATTERY MODULE CHARGING SYSTEM 审中-公开
    电池模块充电系统

    公开(公告)号:US20130257371A1

    公开(公告)日:2013-10-03

    申请号:US13994360

    申请日:2011-12-26

    IPC分类号: H02J7/02

    摘要: A battery module charging system includes a power transmitting device, including a primary coil configured to transmit AC power, and a power receiving unit, including a secondary coil configured to receive the AC power transmitted from the primary coil by electromagnetic induction. The power receiving unit is configured to convert the received AC power into DC power. A positioning mechanism is configured to allow the power transmitting device to be detachably attached to the power receiving unit and to position the primary and secondary coils such that the coils are allowed to be electromagnetically coupled to each other when the power transmitting device is attached to the power receiving unit. Further, a selection circuitry is configured to selectively charge a plurality of cells in a battery module with the DC power. The plurality of cells, the cells being secondary batteries, are connected to each other in a series.

    摘要翻译: 电池模块充电系统包括:电力传输装置,包括被配置为传送AC电力的初级线圈;以及受电单元,包括被配置为通过电磁感应接收从初级线圈发送的AC电力的次级线圈。 受电单元被配置为将接收的AC电力转换为DC电力。 定位机构被配置为允许动力传递装置可拆卸地附接到受电单元并且定位主和次级线圈,使得当电力传输装置附接到电力传输装置时,允许线圈彼此电磁耦合 受电单元 此外,选择电路被配置为以DC电力选择性地对电池模块中的多个单元进行充电。 多个电池,作为二次电池的电池串联连接。

    WAFER-TYPE TEMPERATURE SENSOR AND MANUFACTURING METHOD THEREOF
    15.
    发明申请
    WAFER-TYPE TEMPERATURE SENSOR AND MANUFACTURING METHOD THEREOF 审中-公开
    WAFER型温度传感器及其制造方法

    公开(公告)号:US20110233546A1

    公开(公告)日:2011-09-29

    申请号:US13053473

    申请日:2011-03-22

    IPC分类号: H01L29/66 H01L21/50

    摘要: A wafer-type temperature sensor may include a wafer for temperature detection; a circuit board bonded to one surface of the wafer for temperature detection; at least one temperature data detector provided on the one surface of the wafer for temperature detection and capable of detecting temperature data; and a temperature detecting unit mounted on the circuit board and capable of detecting a temperature of the wafer for temperature detection from the temperature data detected by the temperature data detector. Here, a difference between a linear expansion coefficient of the circuit board and a linear expansion coefficient of the wafer for temperature detection may be equal to or less than a predetermined value.

    摘要翻译: 晶片型温度传感器可以包括用于温度检测的晶片; 结合到晶片的一个表面用于温度检测的电路板; 至少一个温度数据检测器,设置在晶片的一个表面上用于温度检测并且能够检测温度数据; 以及温度检测单元,其安装在电路板上,并能够根据由温度数据检测器检测到的温度数据检测用于温度检测的晶片的温度。 这里,电路板的线膨胀系数与用于温度检测的晶片的线膨胀系数之间的差可以等于或小于预定值。

    MICROSTRUCTURE INSPECTING APPARATUS, MICROSTRUCTURE INSPECTING METHOD AND SUBSTRATE HOLDING APPARATUS
    16.
    发明申请
    MICROSTRUCTURE INSPECTING APPARATUS, MICROSTRUCTURE INSPECTING METHOD AND SUBSTRATE HOLDING APPARATUS 审中-公开
    微结构检查装置,微结构检查方法和基板保持装置

    公开(公告)号:US20090095095A1

    公开(公告)日:2009-04-16

    申请号:US12298359

    申请日:2007-10-31

    IPC分类号: G01M19/00

    摘要: An inspecting apparatus of a microstructure having a movable section 16a with its both sides supported includes a chuck top 9 for holding a wafer 8 in which the microstructure is formed so as to make a main surface of the wafer 8 into a convexly or concavely curved shape having a nearly uniform curvature radius. The apparatus includes a shape changing unit for changing the curvature radius of the shape of the main surface of the wafer 8. The shape changing unit is a temperature controlling unit for changing a shape of a top surface of a chuck top 9, on which the substrate is mounted, according to a temperature. A transfer tray whose top surface, on which the wafer 8 is mounted, formed into a convexly or concavely curved shape may be interposed between the wafer 8 and the chuck top 9 whose top surface is flat.

    摘要翻译: 微结构的检查装置具有其两侧被支撑的可移动部分16a,包括用于保持其中形成有微结构的晶片8的卡盘顶部9,以使晶片8的主表面成凸形或凹形弯曲形状 具有近似均匀的曲率半径。 该装置包括用于改变晶片8的主表面的形状的曲率半径的形状改变单元。形状改变单元是用于改变卡盘顶部9的顶表面的形状的温度控制单元, 根据温度安装基板。 安装了晶片8的顶表面形成为凸形或凹形弯曲形状的转印托盘可以插入在晶片8和顶表面平坦的卡盘顶部9之间。

    Low voltage electron beam display apparatus having brightness increased
by reducing an oxide inevitably formed on a surface of an oxisulfide
phosphor on manufacture
    19.
    发明授权
    Low voltage electron beam display apparatus having brightness increased by reducing an oxide inevitably formed on a surface of an oxisulfide phosphor on manufacture 失效
    低压电子束显示装置,其制造时通过减少不可避免地形成在氧硫化物荧光体的表面上的氧化物而具有增加的亮度

    公开(公告)号:US5861713A

    公开(公告)日:1999-01-19

    申请号:US883105

    申请日:1997-06-26

    CPC分类号: C09K11/7771 C09K11/025

    摘要: On manufacturing a low voltage electron beam excitation phosphor display apparatus (10) which includes an anode (6) having a principal surface and enclosed in a vacuum chamber (1, 2, and 3), a phosphor film (7) formed on the principal surface, and a cathode (9) enclosed in the vacuum chamber opposite to the phosphor film, a phosphor is prepared which consists essentially of an oxisulfide and an oxide which is inevitably formed on a surface of the oxisulfide on preparing the phosphor. The oxisulfide is represented by Ln.sub.2 O.sub.2 S:R, where Ln is at least one selected from a group consisting of Gd, La, Y, and Lu and where R is a rare-earth element. The oxide is removed from the phosphor to produce an oxide-removed phosphor. A pasts comprising a mixture of the oxide-removed phosphor, a conductive material, and an autolytic type binder is coated on the principal surface of the anode which is formed on an insulating substrate (1) constituting the vacuum chamber. The binder of the paste is heated in a nonoxidizing atmosphere to form, on the principal surface of the anode, the phosphor film which has the oxide-removed phosphor and the conductive material. The anode and the cathode are enclosed in the vacuum chamber to obtain a manufactured low voltage electron beam excitation phosphor display apparatus. The oxide may be Ln.sub.2 O.sub.3 into which a component Ln.sub.2 O.sub.2 S of the oxisulfide is changed.

    摘要翻译: 在制造低压电子束激发荧光体显示装置(10)时,包括具有主表面并被包围在真空室(1,2和3)中的阳极(6),形成在主体上的荧光膜(7) 表面和封闭在与荧光膜相对的真空室中的阴极(9),制备荧光体,其基本上由氧硫化物和氧化物组成,在制备荧光体时不可避免地在氧硫化物的表面上形成氧化物。 氧硫化物由Ln2O2S:R表示,其中Ln是选自Gd,La,Y和Lu中的至少一种,其中R是稀土元素。 从磷光体中去除氧化物以产生除去氧化物的荧光体。 包含氧化物去除的荧光体,导电材料和自溶型粘合剂的混合物的过滤体涂覆在形成在构成真空室的绝缘基板(1)上的阳极的主表面上。 将糊状物的粘合剂在非氧化气氛中加热,在阳极的主面上形成具有氧化物去除的荧光体和导电性材料的荧光体膜。 将阳极和阴极封装在真空室中以获得制造的低电压电子束激发荧光体显示装置。 氧化物可以是氧化硫的成分Ln 2 O 2 S发生变化的Ln 2 O 3。

    Microstructure inspecting device, and microstructure inspecting method
    20.
    发明授权
    Microstructure inspecting device, and microstructure inspecting method 失效
    微观结构检查装置和微结构检查方法

    公开(公告)号:US08333114B2

    公开(公告)日:2012-12-18

    申请号:US12744873

    申请日:2008-11-26

    申请人: Masato Hayashi

    发明人: Masato Hayashi

    IPC分类号: G01N29/12

    CPC分类号: G01N29/12 G01N29/14

    摘要: A microstructure inspecting device 10 which measures a damping characteristic value of a moving portion of a microstructure includes a pressure wave generating device 1 and a pulse generating device 2 which apply an impact to the moving portion without directly contacting the microstructure, and a vibrometer 4 which measures a displacement of the moving portion for a predetermined period of time after the start of free vibration of the moving portion without contacting the moving portion. The pressure wave generating device 1 is a sound wave generating element of thermal excitation type, a piezoelectric sound wave generating element, or an electromagnetic vibration element, and is driven by a pulse signal of the pulse generating device 2. The pressure wave generating device 1 using the sound wave generating element of thermal excitation type may include a thermally conductive substrate, a heat-insulating layer formed of nano-crystal silicon in one principal surface of the substrate, an insulating layer formed on the heat-insulating layer, and a conductive layer formed on the insulating layer and emitting heat when being supplied with current containing alternating current components.

    摘要翻译: 测量微结构的移动部分的阻尼特性值的微结构检查装置10包括压力波产生装置1和脉冲发生装置2,该压力波产生装置1和脉冲产生装置2对移动部分施加冲击而不直接接触微结构;以及振动计4 在移动部分的自由振动开始后,在不接触移动部分的情况下,测量移动部分的位移达预定时间段。 压力波产生装置1是热激发型的声波发生元件,压电声波发生元件或电磁振动元件,并由脉冲发生装置2的脉冲信号驱动。压力波产生装置1 使用热激发型的声波发生元件可以包括导热衬底,在衬底的一个主表面中由纳米晶体硅形成的绝热层,形成在绝热层上的绝缘层和导电 层,形成在绝缘层上并在被供给含有交流电流成分的电流时发热。