摘要:
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要:
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要:
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要:
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
摘要:
A system and method for storing, within an image transfer medium, an image and image-specific data associated with the image includes obtaining the image-specific data from a probe such as a borescope or endoscope, obtaining the corresponding image, choosing a specific image transfer medium, writing the image to the medium, and writing the image-specific data to a marker in the medium. In this manner, storing a combination of image data and one or more of system calibration data, overlay replacement data, and audio comment data in a single file of either a non-standard file format or a standard file format that does not explicitly support the inclusion of these data types is possible.
摘要:
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
摘要:
Methods and apparatus are provided for adapting the operation of a remote viewing device to compensate for at least one potentially misaligned optical lens by identifying, within a pixel matrix, one or more optical defects that are suggestive of one or more misaligned optical lenses and, in response, adjusting the position of an active display area in order to seek to correct the optical misalignment.
摘要:
Remote viewing devices and methods are provided to communicate audio information to and/or from a user of the remote viewing device. The audio information can serve an entertainment purpose, and/or can be instructional in order to provide training, guidance and/or feedback to the user prior to or during the inspection process. The audio information can be stored onto physical media such as a CD/DVD disk or a tape, or can be stored as data, such as MP3 data stored within memory accessible to the device. Outputted audio information can be generated by one or more speakers located within the body of the device or located within a headset having a wire line or wireless connection with the remote viewing device.
摘要:
An inspection device for inspecting the interior of an enclosed volume. The inspection device includes a display and an imaging probe coupled to the display. The imaging probe includes a first end having imaging optics. A protective sleeve is removably engageable with the imaging probe, wherein the first end of the imaging probe is movable with respect to a distal end of the protective sleeve.