System aspects for a probe system that utilizes structured-light
    1.
    发明授权
    System aspects for a probe system that utilizes structured-light 有权
    利用结构光的探针系统的系统方面

    公开(公告)号:US08107083B2

    公开(公告)日:2012-01-31

    申请号:US12249513

    申请日:2008-10-10

    IPC分类号: G01B9/02

    摘要: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.

    摘要翻译: 探针系统包括成像器和检查光源。 探针系统被配置为在检查模式和测量模式下操作。 在检查模式下,检查光源被使能。 在测量模式期间,检查光源被禁用,并且结构化光图案被投影。 探测系统还被配置成捕获至少一个测量模式图像。 在至少一个测量模式图像中,将结构光图案投影到对象上。 探测系统被配置为利用来自至少一个测量模式图像的像素值来确定对象的至少一个几何尺寸。 还提供了一种探测系统,其被配置为在多个图像中的两个或更多个图像的捕获之间检测探测器与物体之间的相对运动。

    Fringe projection system and method for a probe suitable for phase-shift analysis
    2.
    发明授权
    Fringe projection system and method for a probe suitable for phase-shift analysis 有权
    边缘投影系统和适用于相移分析的探头的方法

    公开(公告)号:US07821649B2

    公开(公告)日:2010-10-26

    申请号:US12042821

    申请日:2008-03-05

    IPC分类号: G01B11/24 G01B11/14 G01N21/55

    CPC分类号: G01B11/2527

    摘要: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.

    摘要翻译: 探针包括插入管和设置在插入管的远端上的多个发光体。 探针还包括至少一个强度调制元件,来自多个发光体的光通过该强度调制元件通过,以将多个边缘组投影到表面上。 多个边缘组实体中的每一个具有当多个发光体中的至少一个发光体的一个发射极组发射时投影的结构光图案。 探头还包括用于获得表面的至少一个图像的成像器和被配置为对至少一个图像执行相移分析的处理单元。 还提出了一种用于使用探针在表面上投影适用于相移分析的多个边缘组的方法。

    System aspects for a probe system that utilizes structured-light
    3.
    发明授权
    System aspects for a probe system that utilizes structured-light 有权
    利用结构光的探针系统的系统方面

    公开(公告)号:US08976363B2

    公开(公告)日:2015-03-10

    申请号:US13334239

    申请日:2011-12-22

    摘要: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.

    摘要翻译: 探针系统包括成像器和检查光源。 探针系统被配置为在检查模式和测量模式下操作。 在检查模式下,检查光源被使能。 在测量模式期间,检查光源被禁用,并且结构化光图案被投影。 探测系统还被配置成捕获至少一个测量模式图像。 在至少一个测量模式图像中,将结构光图案投影到对象上。 探测系统被配置为利用来自至少一个测量模式图像的像素值来确定对象的至少一个几何尺寸。 还提供了一种探测系统,其被配置为在多个图像中的两个或更多个图像的捕获之间检测探测器与物体之间的相对运动。

    SYSTEM ASPECTS FOR A PROBE SYSTEM THAT UTILIZES STRUCTURED-LIGHT
    4.
    发明申请
    SYSTEM ASPECTS FOR A PROBE SYSTEM THAT UTILIZES STRUCTURED-LIGHT 有权
    用于采用结构光的探测系统的系统方案

    公开(公告)号:US20120188560A1

    公开(公告)日:2012-07-26

    申请号:US13334239

    申请日:2011-12-22

    IPC分类号: G01B11/14

    摘要: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.

    摘要翻译: 探针系统包括成像器和检查光源。 探针系统被配置为在检查模式和测量模式下操作。 在检查模式下,检查光源被使能。 在测量模式期间,检查光源被禁用,并且结构化光图案被投影。 探测系统还被配置成捕获至少一个测量模式图像。 在至少一个测量模式图像中,将结构光图案投影到对象上。 探测系统被配置为利用来自至少一个测量模式图像的像素值来确定对象的至少一个几何尺寸。 还提供了一种探测系统,其被配置为在多个图像中的两个或更多个图像的捕获之间检测探测器与物体之间的相对运动。

    SYSTEM ASPECTS FOR A PROBE SYSTEM THAT UTILIZES STRUCTURED-LIGHT
    5.
    发明申请
    SYSTEM ASPECTS FOR A PROBE SYSTEM THAT UTILIZES STRUCTURED-LIGHT 有权
    用于采用结构光的探测系统的系统方案

    公开(公告)号:US20090225333A1

    公开(公告)日:2009-09-10

    申请号:US12249513

    申请日:2008-10-10

    IPC分类号: G01B11/02

    摘要: A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.

    摘要翻译: 探针系统包括成像器和检查光源。 探针系统配置为在检查模式和测量模式下运行。 在检查模式下,检查光源被使能。 在测量模式期间,检查光源被禁用,并且结构化光图案被投影。 探测系统还被配置成捕获至少一个测量模式图像。 在至少一个测量模式图像中,将结构光图案投影到对象上。 探测系统被配置为利用来自至少一个测量模式图像的像素值来确定对象的至少一个几何尺寸。 还提供了一种探测系统,其被配置为在多个图像中的两个或更多个图像的捕获之间检测探测器与物体之间的相对运动。

    FRINGE PROJECTION SYSTEM AND METHOD FOR A PROBE SUITABLE FOR PHASE-SHIFT ANALYSIS
    6.
    发明申请
    FRINGE PROJECTION SYSTEM AND METHOD FOR A PROBE SUITABLE FOR PHASE-SHIFT ANALYSIS 有权
    FRINGE投影系统和适用于相位分析的探针的方法

    公开(公告)号:US20090225321A1

    公开(公告)日:2009-09-10

    申请号:US12042821

    申请日:2008-03-05

    IPC分类号: G01N21/55

    CPC分类号: G01B11/2527

    摘要: A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.

    摘要翻译: 探针包括插入管和设置在插入管的远端上的多个发光体。 探针还包括至少一个强度调制元件,来自多个发光体的光通过该强度调制元件通过,以将多个边缘组投影到表面上。 多个边缘组实体中的每一个具有当多个发光体中的至少一个发光体的一个发射极组发射时投影的结构光图案。 探头还包括用于获得表面的至少一个图像的成像器和被配置为对至少一个图像执行相移分析的处理单元。 还提出了一种用于使用探针在表面上投影适用于相移分析的多个边缘组的方法。

    Insertion tube storage carousel
    7.
    发明申请
    Insertion tube storage carousel 有权
    插管储存转盘

    公开(公告)号:US20070156018A1

    公开(公告)日:2007-07-05

    申请号:US11474142

    申请日:2006-06-23

    IPC分类号: A61B1/00

    摘要: An apparatus for storing at least one elongated and flexible object, such as an insertion tube that functions as a portion of an endoscope or a borescope device. The apparatus includes a rotating storage carousel having a base and a peripheral barrier. An elongated and flexible object, such as an insertion tube, is stored along the inner side of the peripheral barrier and the base. The storage cavity of the carousel rotates while accepting the transfer of the elongated and flexible object for storage.

    摘要翻译: 一种用于存储至少一个细长且柔性的物体的装置,例如用作内窥镜或管道镜装置的一部分的插入管。 该设备包括具有基座和外围障碍物的旋转存储转盘。 细长的柔性物体(例如插入管)沿周边屏障和底座的内侧被储存。 圆盘传送带的储存腔旋转,同时接受细长和柔性物体的转移以进行储存。

    Inspection apparatus for performing inspections
    10.
    发明授权
    Inspection apparatus for performing inspections 有权
    进行检查的检查装置

    公开(公告)号:US08217646B2

    公开(公告)日:2012-07-10

    申请号:US12253548

    申请日:2008-10-17

    申请人: Thomas Karpen

    发明人: Thomas Karpen

    IPC分类号: G01N27/72

    摘要: An inspection apparatus is provided that can include at least one probe receiving unit. The at least one probe receiving unit can be capable of processing data corresponding to one or more of image information of the type that can be generated by a visual inspection probe, eddy current information of the type that can be generated by a eddy current probe, and ultrasound information of the type that can be generated by a ultrasound probe.

    摘要翻译: 提供一种可以包括至少一个探针接收单元的检查装置。 所述至少一个探头接收单元能够处理对应于由目视检查探针产生的类型的图像信息中的一个或多个的数据的数据,可以由涡流探针产生的类型的涡流信息, 以及可以由超声波探头产生的类型的超声信息。