摘要:
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要:
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
摘要:
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要:
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要:
A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
摘要:
A probe includes an insertion tube and a plurality of light emitters disposed on the distal end of the insertion tube. The probe further includes at least one intensity modulating element through which light from the plurality of light emitters is passed to project a plurality of fringe sets onto a surface. Each of the plurality of fringe sets intern have a structured-light pattern that is projected when one emitter group of at least one of the plurality of light emitters is emitting. The probe further includes an imager for obtaining at least one image of the surface and a processing unit that is configured to perform phase-shift analysis on the at least one image. A method for projecting a plurality of fringe sets suitable for phase-shift analysis on a surface using a probe is also presented.
摘要:
An apparatus for storing at least one elongated and flexible object, such as an insertion tube that functions as a portion of an endoscope or a borescope device. The apparatus includes a rotating storage carousel having a base and a peripheral barrier. An elongated and flexible object, such as an insertion tube, is stored along the inner side of the peripheral barrier and the base. The storage cavity of the carousel rotates while accepting the transfer of the elongated and flexible object for storage.
摘要:
Systems and methods for making and using handheld data readers comprising one or more fluid lenses. One or more fluid lenses are provided to allow a handheld data reader to perform such operations as reading indicia, including such additional operations as zooming, reorienting a viewing direction, focusing, adjusting an optical axis, and correcting for the effects of motion such as hand jitter. The fluid lens or lenses can be operated for example by applying electrical signals to fluid lenses comprising a plurality of fluids including at least one that is conductive and at least one that is non-conductive.
摘要:
A modular remote video inspection system for inspecting the interior of a living thing or of an inanimate object, such as a machine. The system comprises a base module connected by way of an interconnection module to a handset comprising a unitary display module and control module. The system makes observations by generating light that is caused to impinge on a surface of the interior of the object of interest. An inspection module attached to the handset comprises both a light guide for providing the light to the area of interest, and a selected one of a sensor and a light receiver. The inspection module comprises a steerable tip configured to be located adjacent the area of interest. The handset includes both controls for operating the system, and a display for providing a view of the region being inspected, as well as status information for the user of an operator.
摘要:
An inspection apparatus is provided that can include at least one probe receiving unit. The at least one probe receiving unit can be capable of processing data corresponding to one or more of image information of the type that can be generated by a visual inspection probe, eddy current information of the type that can be generated by a eddy current probe, and ultrasound information of the type that can be generated by a ultrasound probe.