摘要:
An antifuse device (120) that includes a bias element (124) and an programmable antifuse element (128) arranged in series with one another so as to form a voltage divider having an output node (F) located between the bias and antifuse elements. When the antifuse device is in its unprogrammed state, each of the bias element and antifuse element is non-conductive. When the antifuse device is in its programmed state, the bias element remains non-conductive, but the antifuse element is conductive. The difference in the resistance of the antifuse element between its unprogrammed state and programmed state causes the difference in voltages seen at the output node to be on the order of hundreds of mili-volts when a voltage of 1 V is applied across the antifuse device. This voltage difference is so high that it can be readily sensed using a simple sensing circuit (228).
摘要:
A system to evaluate charge pump output may include a comparator to compare a charge pump output voltage to a reference voltage to generate a comparison result. The system may also include a divider to divide down a clock signal. The system may further include a logical conjunction unit to operate on the comparison result and the divided down clock signal.
摘要:
An integrated circuit that includes a gate control voltage generator that supplies a current control gate voltage to a plurality of current control devices of a corresponding plurality of dynamic logic circuits each having a keeper circuit. The gate control voltage generator provides, via current control gate voltage, global control of the amount of keeper current flowing through the keeper circuits so as to enhance the performance of the dynamic logic circuits.
摘要:
A circuit containing a parallel connection of a first sub-circuit and a second sub-circuit is provided. The first sub-circuit comprises a serial connection of a first field effect transistor having a first threshold voltage and a first voltage dividing device. The second sub-circuit comprises a serial connection of a second field effect transistor having a second threshold voltage, which is different from the first threshold voltage, and a second voltage dividing device. The voltage between the first field effect transistor and the first voltage dividing device is compared with the voltage between the second field effect transistor and the second voltage dividing device so that a signal may be generated at a temperature at which the ratio of a performance parameter such as on-current between the first and second field effect transistors crosses over a predefined value. The signal may be advantageously employed to actively control circuit characteristics.
摘要:
A voltage pump circuit that has an oxide stress control mechanism is disclosed. In particular, the oxide stress control mechanism of the voltage pump circuit ensures a safe transistor gate-to-source voltage in high-voltage applications in an integrated circuit. In particular, the down level of the gate voltage of the output transistor may be conditionally limited. For example, an offset in the down level of the gate voltage is created by conditionally developing an offset voltage in the lower rail voltage of the gate driver. The offset voltage is created by directing a predetermined current through a resistance. The current is conditional such that the current is about zero when the power supply voltage is less than or equal to a predetermined level, and the current is greater than zero when the power supply voltage is greater than a predetermined level.
摘要:
A design structure for an integrated circuit that includes a gate control voltage generator that supplies a current control gate voltage to a plurality of current control devices of a corresponding plurality of dynamic logic circuits each having a keeper circuit. The gate control voltage generator provides, via current control gate voltage, global control of the amount of keeper current flowing through the keeper circuits so as to enhance the performance of the dynamic logic circuits.
摘要:
Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).
摘要:
A programmable locking mechanism for use in an integrated circuit is disclosed. In particular, the programmable locking mechanism may include an access code storage circuit for storing a security access code and a code input register whose outputs feed a comparator circuit that generates a locking signal. The state of the locking signal depends on whether the contents of the access code storage circuit and the code input register match. Additionally, a blocking circuit is provided that interrupts a programming input to the access code storage circuit and, thus, allows or denies access via the programming input to the access code storage circuit depending on the state of the locking signal. Additionally, the locking signal is distributed to sensitive logic circuits within the integrated circuit for preventing and/or allowing (depending on state) access thereto.
摘要:
A voltage reference system that generates a stable reference voltage at varying supply voltages. The system receiving an input voltage and having a voltage pumping circuit that provides a power supply, regulated by a regulator circuit, to a bandgap reference circuit. The bandgap reference circuit generating a first output as a stable voltage value and delivering the first output to a clamping circuit which outputs the lesser of the stable voltage value and a fraction of the input voltage.
摘要:
The invention includes an error correcting logic system that allows critical circuits to be hardened with only one redundant unit and without loss of circuit performance. The system provides an interconnecting gate that suppresses a fault in one of at least two redundant dynamic logic gates that feed to the interconnecting gate. The system is applicable to dynamic or static logic systems. The system prevents propagation of a fault, and addresses not only soft errors, but noise-induced errors.