摘要:
The disclosed methodology and apparatus measures the duty cycle of a clock signal. A variable duty cycle circuit receives a clock signal from a clock signal generator. The variable duty cycle circuit adjusts the duty cycle of the clock signal by an amount dependent on a duty cycle index value that it receives. The variable duty cycle circuit supplies a duty-cycle adjusted clock signal to a divider circuit. The apparatus sweeps the frequency of the clock signal from a starting value up to a maximum frequency above which the divider circuit fails. The apparatus then determines the duty cycle of the duty-cycle adjusted clock signal from the maximum frequency.
摘要:
A method, an apparatus, and a computer program are provided to measure and/or correct duty cycles. Duty cycles of various signals, specifically clocking signals, are important. However, measurement of very high frequency signals, off-chip, and in a laboratory environment can be very difficult and present numerous problems. To combat problems associated with making off-chip measurements and adjustments of signal duty cycles, comparisons are made between input signals and divided input signals that allow for easy measurement and adjustment of on-chip signals, including clocking signals.
摘要:
A technology for supplying a power supply voltage to a microprocessor. Before normal arithmetic processing of the microprocessor, duty cycle correction process for adjusting the duty cycle of a clock signal inside the microprocessor is performed. In the duty cycle correction process for adjusting the duty cycle, the duty cycle of the clock signal is adjusted so as to minimize the power voltage at which the microprocessor is still operable.
摘要:
Embodiments of the disclosure provide systems and methods for clock duty cycle measurement. A clock signal and a complement of the clock signal are provided to a charge pump during first and second predetermined timing windows. A charge pump is operable to generate first and second output voltages in response to the clock signal and the complement of the clock signal during the first and second timing windows, respectively. In addition a predetermined positive voltage and a ground voltage are applied to the charge pump during predetermined third and fourth timing windows, respectively. The charge pump is operable to generate third and fourth output voltage signals corresponding to the predetermined positive and ground voltages during the third and fourth timing windows, respectively. The first, second, third and fourth voltages are then used to calculate the duty cycle of the clock.
摘要:
A design structure for an on-chip duty cycle measurement system may be embodied in a machine readable medium for designing, manufacturing or testing an integrated circuit. The design structure may embody an apparatus that measures the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. The design structure may specify that the DCM circuit includes a capacitor driven by a charge pump and that a reference clock signal drives the charge pump. The design structure may specify that the clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The design structure may specify that the DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit may apply a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. The design structure may specify that control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
摘要:
Embodiments of the disclosure provide systems and methods for using a PLL and a high frequency generator outside the loop to obtain the fmax of the divider. The divider in the PLL loop is fed by a VCO and its operation range is characterized by measuring the PLL lock range. An identical copy of the same divider is used outside the PLL loop and it is fed by a higher frequency clock. The high frequency clock is generated by the multiple phase of the VCO. By characterizing the outputs from both dividers, the fmax of the divider is obtained.
摘要:
A frequency synthesizer lock detection system is disclosed that distributes a frequency synthesizer output signal across a distribution network to one or more receptor circuits. The distribution network may exhibit delay and other distortion that may cause the downstream signal arriving at the receptor circuit to lose frequency lock with both the frequency synthesizer output signal and a reference clock signal that controls the frequency of the synthesizer output signal. The lock detection system tests the downstream signal to determine if the downstream signal exhibits a lock with respect to the reference clock that determines the operating frequency of the frequency synthesizer. In this manner, lock of the downstream signal to the reference clock signal may be accurately assessed in one embodiment.
摘要:
A design structure for an on-chip duty cycle measurement system may be embodied in a machine readable medium for designing, manufacturing or testing an integrated circuit. The design structure may embody an apparatus that measures the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. The design structure may specify that the DCM circuit includes a capacitor driven by a charge pump and that a reference clock signal drives the charge pump. The design structure may specify that the clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The design structure may specify that the DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit may apply a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. The design structure may specify that control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
摘要:
The disclosed methodology and apparatus measures the duty cycle of a clock signal. A variable duty cycle circuit receives a clock signal from a clock signal generator. The variable duty cycle circuit adjusts the duty cycle of the clock signal by an amount dependent on a duty cycle index value that it receives. The variable duty cycle circuit supplies a duty-cycle adjusted clock signal to a divider circuit. The apparatus sweeps the frequency of the clock signal from a starting value up to a maximum frequency above which the divider circuit fails. The apparatus then determines the duty cycle of the duty-cycle adjusted clock signal from the maximum frequency.
摘要:
A method, an apparatus, and a computer program are provided to measure and/or correct duty cycles. Duty cycles of various signals, specifically clocking signals, are important. However, measurement of very high frequency signals, off-chip, and in a laboratory environment can be very difficult and present numerous problems. To combat problems associated with making off-chip measurements and adjustments of signal duty cycles, comparisons are made between input signals and divided input signals that allow for easy measurement and adjustment of on-chip signals, including clocking signals.