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公开(公告)号:US20180328863A1
公开(公告)日:2018-11-15
申请号:US15591926
申请日:2017-05-10
Applicant: General Electric Company
Inventor: Xue Rui , Yannan Jin , Biju Jacob , Brian David Yanoff , Uwe Wiedmann
CPC classification number: G01N23/046 , A61B6/032 , A61B6/4291 , G01T1/242 , G21K1/025
Abstract: The present approach relates to scatter correction of signals acquired using radiation detectors on a pixel-by-pixel basis. In certain implementations, the systems and methods disclosed herein facilitate scatter correction for signals generated using a detector having segmented detector elements, such as may be present in an energy-resolving, photon-counting CT imaging system.
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公开(公告)号:US10121817B2
公开(公告)日:2018-11-06
申请号:US14973417
申请日:2015-12-17
Applicant: General Electric Company
Inventor: Biju Jacob , James Zhengshe Liu
IPC: G01N23/04 , H05G1/64 , H01L27/146 , G01T1/24
Abstract: A flat panel detector is provided having a circular active area. The flat panel detector is built using complementary metal-oxide-semiconductor (CMOS) tiles. In one implementation, the flat panel detector having a circular active area can be used as a replacement for a conventional image intensifier, including an image intensifier used in a fluoroscopy system.
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公开(公告)号:US09871073B1
公开(公告)日:2018-01-16
申请号:US15358352
申请日:2016-11-22
Applicant: General Electric Company
Inventor: Nicholas Konkle , Biju Jacob , Douglas Albagli , William Andrew Hennessy
IPC: G01T1/20 , H01L27/146 , G01T1/24
CPC classification number: H01L27/14663 , G01T1/2018 , G01T1/24 , H01L27/14618 , H01L27/14683
Abstract: An x-ray detector may comprise: a moisture-impermeable substrate including a non-monolithic conductive portion integrated with a monolithic dielectric portion; a scintillator and an array of CMOS tiles positioned between the scintillator and the substrate; a cover positioned on the substrate and forming a seal therebetween that semi-hermetically encloses the scintillator and the array of CMOS tiles in a covered sealed region; and analog-to-digital electronics conductively coupled to the array of CMOS tiles and to the conductive portion, wherein the conductive portion transmits signals from the covered sealed region to beyond the seal without disrupting a semi-hermeticity of the seal. In this way, sealing of multiply-tiled CMOS image array detectors within a single x-ray detector can be more simply and reliably achieved.
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公开(公告)号:US20170179186A1
公开(公告)日:2017-06-22
申请号:US14973417
申请日:2015-12-17
Applicant: General Electric Company
Inventor: Biju Jacob , James Zhengshe Liu
IPC: H01L27/146 , G01N23/04 , G01T1/24
CPC classification number: H01L27/14663 , G01N23/043 , G01N2223/501 , G01T1/247
Abstract: A flat panel detector is provided having a circular active area. The flat panel detector is built using complementary metal-oxide-semiconductor (CMOS) tiles. In one implementation, the flat panel detector having a circular active area can be used as a replacement for a conventional image intensifier, including an image intensifier used in a fluoroscopy system.
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公开(公告)号:US20210177372A1
公开(公告)日:2021-06-17
申请号:US16714291
申请日:2019-12-13
Applicant: General Electric Company
Inventor: Biju Jacob , Mingye Wu , Mark Allen Adamak
Abstract: The techniques disclosed may be used to detect and correct channel gain errors resulting from X-ray focal spot mis-alignment during the course of a scan. One benefit of the present invention relative to conventional techniques is that additional hardware is not required for detection of focal spot drift. Instead, the static mis-alignment of each blade is taken into account as part of estimating and correcting X-ray focal spot drift or mis-alignment. In this manner, the risk of image artefacts due to focal spot motion is reduced and the need for costly hardware solutions to detect focal spot motion is avoided.
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公开(公告)号:US10898159B2
公开(公告)日:2021-01-26
申请号:US16245938
申请日:2019-01-11
Applicant: General Electric Company
Inventor: Peter Michael Edic , Biju Jacob
IPC: A61B6/00 , G01N23/046 , A61B6/03
Abstract: The present disclosure relates to determining the position of an X-ray focal spot in real time during an imaging process and using the focal spot position to ensure alignment of the focal spot and high-aspect detector elements or to correct for focal spot misalignment, thereby mitigating image artifacts. For example, the focal spot position may be monitored and may be adjusted in real-time using electromagnetic electron beam steering during a scan. Alternatively, previously determined functional relationships between focal spot position and measured data may be applied to address or correct for focal spot misalignment in the acquired data.
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公开(公告)号:US10686003B2
公开(公告)日:2020-06-16
申请号:US14985739
申请日:2015-12-31
Applicant: General Electric Company
Inventor: Biju Jacob , Habib Vafi , Brian David Yanoff , Jeffery Jon Shaw , Jianjun Guo
IPC: G01T1/24 , H01L27/146 , H04N5/378
Abstract: Various approaches are discussed for using four-side buttable CMOS tiles to fabricate detector panels, including large-area detector panels. Fabrication may utilize pads and interconnect structures formed on the top or bottom of the CMOS tiles. Electrical connection and readout may utilize readout and digitization circuitry provided on the CMOS tiles themselves such that readout of groups or sub-arrays of pixels occurs at the tile level, while tiles are then readout at the detector level such that readout operations are tiered or multi-level.
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公开(公告)号:US20190282194A1
公开(公告)日:2019-09-19
申请号:US15923497
申请日:2018-03-16
Applicant: GENERAL ELECTRIC COMPANY
Inventor: John Eric Tkaczyk , David Allen Langan , Peter William Lorraine , Biju Jacob , Feng Pan , Hao Lai
IPC: A61B6/00
Abstract: A method for X-ray imaging includes determining one or more pre-shot parameters corresponding to a region of interest in a subject based on an optical image of the region of interest obtained from an optical sensor. The method further includes controlling an X-ray device to generate a pre-shot X-ray image using a first X-ray dosage, based on the one or more-pre-shot parameters. The method also includes determining at least one main-shot parameter based on the pre-shot X-ray image. The method includes controlling the X-ray device to generate a main-shot X-ray image using a second X-ray dosage greater than the first X-ray dosage, based on the at least one main-shot parameter.
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公开(公告)号:US20190069871A1
公开(公告)日:2019-03-07
申请号:US15697269
申请日:2017-09-06
Applicant: General Electric Company
Inventor: John Eric Tkaczyk , Biju Jacob , Feng Pan
CPC classification number: A61B6/584 , A61B6/04 , A61B6/0407 , A61B6/4283 , A61B6/4405 , A61B6/4452 , A61B6/5294 , A61B6/547
Abstract: The present approach relates to the use of augmented or enhanced reality to facilitate positioning of one or more of a patient, X-ray source, or detector during an image acquisition. In certain implementations, sensors and/or cameras provide quantitative information about the position of system components and the patient, which may be used to generate a positioning image based upon reference to an anatomic atlas.
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公开(公告)号:US20180177481A1
公开(公告)日:2018-06-28
申请号:US15591932
申请日:2017-05-10
Applicant: General Electric Company
Inventor: Biju Jacob , Brian David Yanoff , Xue Rui
CPC classification number: A61B6/585 , A61B6/032 , A61B6/4233 , A61B6/4241 , G01N23/046 , G01N2223/303 , G01N2223/33
Abstract: The present approach relates to self-calibration of CT detectors based on detected misalignment of the detector and X-ray source. The present approach make the detector more robust to changes against temperature and focal spot movements. The diagnostic image generated by energy resolving calibrated response signals is able to present enhanced features compared to conventional CT based diagnostic images.
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