摘要:
A small commutator motor (1), in particular a blower motor for motor vehicles, has a rotor shaft (2) rotatably mounted in at least one rotor bearing (12) in a motor housing (8, 9). A commutator (18) and an armature winding (21) electrically connected with the commutator (18) are arranged on the rotor shaft (2) so as to be fixed with respect to rotation relative to it. Further, brush guides (11) for receiving brushes (16) held in sliding contact at the commutator (18) and an end shield (10) which fixes the first rotor bearing (12) in place are provided. The end shield (10) and the brush guides (11) are formed as a one-piece structural component part which is a component part of the motor housing (8, 9) as a first motor housing part (8).
摘要:
A brushless direct current motor is energized by a power stage. Switches of the power stage are selectively switched by an electronic control device. In order to determine the correct commutation pattern, without using rotor position indicators, the control device is arranged to tap the power fed to the motor. The samples received by the motor, in an ordered sequence, define an analogue function whose parameters can be determined by vector addition. The computations applied to the sample enable the necessary commutating information and signals to be generated in a particularly rapid manner.
摘要:
An optical position measuring instrument including a scale and a scanning unit, wherein the scanning unit and the scale are movable with respect to one another. The scanning unit includes a detector unit, and a reflector unit that has a first and second wave front correctors and a beam direction inverter. The reflector unit is disposed so that beams first pass through the scale and the first wave front corrector, then a back-reflection of partial beams is effected in a direction of the scale, and the partial beams then pass through the scale and the second wave front corrector before the partial beams then arrive at the detector unit, wherein it is ensured that wave front deformations of the partial beams are converted into wave front deformations that compensate for resultant wave front deformations of the partial beams upon a second diffraction at the scale.
摘要:
An optical position-measuring device includes a measuring standard and a scanning unit. The measuring standard includes an incremental graduation and at least one reference marking at a reference position. The reference marking has two reference-marking subfields disposed in mirror symmetry relative to a reference-marking axis of symmetry, each of the subfields including a grating structure having a locally changeable graduation period. The scanning unit includes a divergently emitting light source, one or more gratings, and a reference-signal detector system. The reference-signal detector system has at least four detector arrays formed and positioned such that, from the scanning of the reference marking via the reference-signal detector system, first and second pairs of partial reference signals result, in each case having a signal pattern in phase opposition. The first pair of partial reference signals is offset by an offset amount relative to the second pair of partial reference signals.
摘要:
An optical position-measuring device includes a scanning bar extending in a first or second direction, and a scale extending in the other direction. The scale is offset by a scanning distance from the scanning bar in a third direction perpendicular to the first and second directions. The device has a light source whose light penetrates the scanning bar at an intersection point of the scanning bar and scale to fall on the scale and arrive back at the scanning bar. At a detector, the light is split by diffraction into different partial beams at optically effective structures of the scanning bar and scale and combined again. A periodic signal is obtained in the detector in response to: a shift between the scanning bar and scale in the first direction due to interference of combined partial beams, and a change in the scanning distance between the scanning bar and scale.
摘要:
A device for interferential distance measurement that includes a light source that emits a light beam along a propagation direction and a scanning plate including a splitter that splits the light beam into a measurement beam and a reference beam. The device further including a reflector disposed spaced-apart in a direction of the propagation direction and a detector element. The measurement beam and the reference beam are propagated from the splitter along different optical paths toward the reflector, where a back reflection of the measurement beam and the reference beam occurs at the reflector toward the scanning plate. In addition, at a combining location the measurement beam and the reference beam attain interfering superposition, and wherein the measurement beam and the reference beam interfering at the combining location are detected by the detector element so that the detector element generates a distance signal regarding a distance between the scanning plate and the reflector.
摘要:
An arrangement for generating phase-shifted incremental signals characterizing relative positions of two objects moving with respect to each other along a measuring direction. The measuring arrangement includes a light source emitting bundles of beams, a measurement grating, a plurality of optional gratings and a scanning unit. The scanning unit includes a grating in a scanning plane, wherein the grating includes a plurality of blocks arranged periodically along the measuring direction with a grating periodicity equaling a fringe pattern periodicity, and each block includes n grating sections arranged along the measuring direction, each of the n grating sections having a periodic grating structure, deflecting the bundles of beams propagated through each of the n grating sections in several different spatial directions. The scanning unit further includes a plurality of detector elements arranged downstream of the grating, wherein the detector elements are arranged in the spatial directions in the detector plane, and wherein the detector plane is located where the bundles of beams coming from the grating are spatially separated. The fringe pattern is formed in the scanning plane by the bundles of beams emitted by the light source interacting with the measurement grating and the optional gratings.
摘要:
A position-measuring device includes a scanning unit and a measuring graduation that is displaceable thereto in at least one measuring direction. The measuring graduation includes two incremental-graduation tracks extending in parallel in the measuring direction, between which a reference-marking track having at least one reference marking at a reference position extends. The scanning unit includes a first scanning device for generating the reference-pulse signal and a second scanning device for generating the incremental signals. To generate the incremental signals, a scanning beam acts at least once upon each incremental graduation in an incremental-signal scanning field.
摘要:
An apparatus and a method that can be used for qualitative or quantitative determination of the three-dimensional location of two bodies relative to one another which can be used, for example, to determine the mutual position of two bodies according to angular or translational coordinates. Furthermore, the apparatus and method can be used in a measurement robot or in a coordinate measurement device. The device composed of a device for emitting a light beam which is fanned in several planes and at least three, preferably four or more, optoelectronic line sensors or linear sensors for determination of the incidence points of the light beam which has been flared in several planes on the line sensors or an upstream target surface.
摘要:
An optical position measuring arrangement for the generation of n>1 phase-shifted incremental signals characterizing relative positions of two objects which are movable with respect to each other along a measuring direction. The optical position measuring arrangement includes a light source that emits bundles of beams, a measurement grating, a plurality of optional gratings and a scanning unit. The scanning unit includes a scanning grating arranged in a scanning plane, wherein the scanning grating includes a plurality of blocks arranged periodically along the measuring direction with a scanning grating periodicity TPAG equaling a fringe pattern periodicity TPS, and each block includes n grating sections (n=1, 2, 3, . . . ) of a width bx=TPAG/n, exclusively arranged along the measuring direction, and each of the n grating sections has a periodic grating structure, which causes a deflection of the bundles of beams propagated through each of the n grating sections in several spatial directions, in which resulting spatial directions of the n grating sections in a block differ. The scanning unit further includes a plurality of detector elements arranged downstream of the scanning grating, wherein the detector elements are arranged in the spatial directions in the detector plane, and wherein the detector plane is located in an area in which the bundles of beams coming from the scanning grating are completely spatially separated. The fringe pattern having a periodicity TPS is formed in the scanning plane by an interaction of the bundles of beams emitted by the light source with the measurement grating and the further optional gratings.