公开(公告)号：US11967371B2

公开(公告)日：2024-04-23

申请号：US17806346

申请日：2022-06-10

Applicant: Kioxia Corporation

Inventor： Rieko Funatsuki ,  Takashi Maeda ,  Hidehiro Shiga

IPC: G11C11/56 ,  G11C16/04 ,  G11C16/08 ,  G11C16/10 ,  G11C16/26 ,  G11C16/34

CPC classification number: G11C11/5642 ,  G11C11/5628 ,  G11C11/5671 ,  G11C16/0483 ,  G11C16/08 ,  G11C16/10 ,  G11C16/26 ,  G11C16/3459

Abstract: A semiconductor memory device includes i first word lines connected to the i first memory cells, i second word lines connected to the i second memory cells, a driver capable of supplying voltage to each of the i first word lines and each of the i second word lines, and a logic control circuit controlling both a write operation including a verify operation and a read operation including a verify operation. In the semiconductor memory device, when an order of performing a sense operation for determining whether or not a threshold voltage of the k-th first memory cell has reached a j-th threshold voltage in the verify operation is different from that of in the read operation, a voltage applied to the k-th first word line in the verify operation is different from a voltage applied to the k-th first word line in the read operation.