VOLTAGE CLAMP
    11.
    发明申请
    VOLTAGE CLAMP 有权
    电压钳

    公开(公告)号:US20160149560A1

    公开(公告)日:2016-05-26

    申请号:US14566534

    申请日:2014-12-10

    Inventor: Wayne C. Goeke

    CPC classification number: H03K3/01 G01R1/36 H02H9/04

    Abstract: A voltage clamp circuit which operates using a voltage controlled current source where the change of the polarity of the voltage controlled current source controls whether it is clamping or not. While clamping, the stability of the control loop uses the capacitance of the output to create and single pole roll-off of the loop gain and while not clamping, uses the capacitance of the circuit which sets the clamping voltage to produce the roll-off. The circuit operates in a linear fashion both while clamping and not clamping, which allows for a faster response when clamping is needed.

    Abstract translation: 一种电压钳位电路,其使用电压控制电流源工作,其中电压控制电流源的极性的变化控制其是否被钳位。 在钳位时,控制回路的稳定性使用输出的电容产生环路增益的单极滚降,同时在不夹紧的情况下,使用设置钳位电压的电路的电容产生滚降。 电路以线性方式工作,同时夹紧和不夹紧,这允许在需要夹紧时更快的响应。

    TRIAXIAL DC-AC CONNECTION SYSTEM
    12.
    发明申请
    TRIAXIAL DC-AC CONNECTION SYSTEM 有权
    三相直流交流连接系统

    公开(公告)号:US20160084878A1

    公开(公告)日:2016-03-24

    申请号:US14846121

    申请日:2015-09-04

    Abstract: Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.

    Abstract translation: 本发明的实施例提供了一种用于将电测试仪器连接到被测器件(DUT)的改进的双电缆连接系统。 在一个实施例中,单对等长三轴电缆各具有期望的特性阻抗。 每个电缆都有一个中心连接器,中间导体和外部导体。 每个电缆的近端连接到测试仪器,并且远端位于DUT。 在远端,中心导体连接到DUT,允许中间导体浮动,外导体彼此连接。 每个电缆的近端使用适当的连接连接到设备,用于要执行的测试。 这允许测试仪器执行不同类型的测试,而不改变与DUT的连接。

    ACTIVE SHUNT SOURCE-MEASURE UNIT (SMU) CIRCUIT
    13.
    发明申请
    ACTIVE SHUNT SOURCE-MEASURE UNIT (SMU) CIRCUIT 有权
    主动分频源测量单元(SMU)电路

    公开(公告)号:US20150212110A1

    公开(公告)日:2015-07-30

    申请号:US14163725

    申请日:2014-01-24

    Inventor: Wayne C. Goeke

    CPC classification number: G01R31/31721 G01R1/203

    Abstract: An active shunt source-measure unit (SMU) circuit can include an SMU or power supply having an active shunt circuit that is integrated with the current measuring sub-circuit of the SMU circuit. The active shunt circuit may be active during voltage sourcing of the SMU circuit and deactivated during current sourcing of the SMU circuit.

    Abstract translation: 主动分流源测量单元(SMU)电路可以包括具有与SMU电路的电流测量子电路集成的有源分流电路的SMU或电源。 在SMU电路的电压源期间,有源分流电路可能有效,并且在SMU电路的电流源期间被禁用。

    Nanovolt amplifier design
    14.
    发明授权
    Nanovolt amplifier design 有权
    Nanovolt放大器设计

    公开(公告)号:US09077301B2

    公开(公告)日:2015-07-07

    申请号:US13906051

    申请日:2013-05-30

    Inventor: Wayne C. Goeke

    CPC classification number: H03F3/45 H03F1/303 H03F3/38 H03F3/45475

    Abstract: A circuit can include operational amplifier having a first input, a second input, and an output, first and second resistors in series between the output of the op-amp and a ground, and multiple switches configurable to toggle the circuit between a positive phase and a negative phase.

    Abstract translation: 电路可以包括运算放大器,其具有第一输入,第二输入和输出,串联在运算放大器的输出和地之间的第一和第二电阻器,以及多个开关,其可配置为在正相和 一个负相。

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