公开(公告)号：US20140176177A1

公开(公告)日：2014-06-26

申请号：US14140294

申请日：2013-12-24

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  JUN-LIANG LAI

IPC: G01R1/073

CPC classification number: G01R1/06772 ,  G01R31/31716 ,  G01R31/31905

Abstract: A probe card which is capable of transmitting high-frequency signals provided by a DUT, and the DUT includes an output pin group and an input pin group for sending and receiving the high-frequency signals respectively. The probe card includes a first signal pin group, a second signal pin group, and a multiband circuit. The first signal pin group is made of a conductive material, and is used to contact the output pin group; the second signal pin group is made of a conductive material too, and is used to contact the input pin group; the multiband circuit is electrically connected to the first signal pin group and the second signal pin group to allow signals within a first bandwidth and a second bandwidth to pass therethrough.

Abstract translation: 能够发送由DUT提供的高频信号的探针卡，DUT包括分别发送和接收高频信号的输出引脚组和输入引脚组。 探针卡包括第一信号引脚组，第二信号引脚组和多频带电路。 第一个信号引脚组由导电材料制成，用于接触输出引脚组; 第二信号引脚组也由导电材料制成，用于接触输入引脚组; 多频带电路电连接到第一信号引脚组和第二信号引脚组，以允许第一带宽和第二带宽内的信号通过。

公开(公告)号：US20140103948A1

公开(公告)日：2014-04-17

申请号：US14133603

申请日：2013-12-18

Applicant: MPI CORPORATION

Inventor： Chao-Ching Huang ,  Chih-Hao Ho ,  Wei-Cheng Ku

IPC: G01R31/28 ,  G01R1/073

CPC classification number: G01R31/2887 ,  G01R1/07314 ,  G01R31/2889

Abstract: A probe card having a configurable structure for exchanging/swapping electronic components for impedance matching is provided. In the probe card, an applied force is exerted on the electronic component so as to make the electronic component electrically connected with at least one conductive contact pad of a supporting unit. The supporting unit is a circuit board or a space transformer. In order to facilitate the exchange or swap of the electronic component, the applied force can be removed. The probe card includes a pressing plate which can be moved between a pressing position and a non-pressing position. The pressing plate has a pressing surface which is contacted with the top end of the electronic component while the pressing plate is in the pressing position. Therefore, the applied force can be generated or removed by changing the positioning of the pressing plate.

Abstract translation: 提供具有用于交换/交换电子部件用于阻抗匹配的可配置结构的探针卡。 在探针卡中，施加的力施加在电子部件上，以使电子部件与支撑单元的至少一个导电接触垫电连接。 支持单元是电路板或空间变压器。 为了促进电子部件的交换或交换，可以移除施加的力。 探针卡包括能够在按压位置和非按压位置之间移动的按压板。 按压板具有在按压板处于按压位置时与电子部件的顶端接触的按压面。 因此，可以通过改变压板的定位来产生或去除施加的力。

公开(公告)号：US10067163B2

公开(公告)日：2018-09-04

申请号：US15347581

申请日：2016-11-09

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Jun-Liang Lai

IPC: G01R1/067 ,  G01R1/04

Abstract: A probe card which is capable of transmitting high-frequency signals provided by a DUT, and the DUT includes an output pin group and an input pin group for sending and receiving the high-frequency signals respectively. The probe card includes a first signal pin group, a second signal pin group, and a band circuit. The first signal pin group is made of a conductive material, and is used to contact the output pin group; the second signal pin group is made of a conductive material too, and is used to contact the input pin group; the band circuit is electrically connected to the first signal pin group and the second signal pin group to allow signals within a first bandwidth and a second bandwidth to pass therethrough.

公开(公告)号：US09759743B2

公开(公告)日：2017-09-12

申请号：US14552957

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R1/073 ,  G01R1/02 ,  G01R1/04 ,  G01R31/28 ,  G01R35/00

CPC classification number: G01R1/07314 ,  G01R1/025 ,  G01R1/04 ,  G01R1/07392 ,  G01R31/2812 ,  G01R35/005

Abstract: A testing system includes a test machine, a plurality of probe sets, a data input device, a controller, a memory, and a data output device. The test machine has a platform for a DUT to be placed thereon, and a test arm which is movable relative to the platform. The probe sets are provided on the test machine with at least one probe set provided on the test arm to contact the DUT. The data input device is used to input information about the DUT. The controller is electrically connected to the test arm, the probe set on the test arm, and the data input device to move the test arm to a predetermined position according to the inputted information, and to make the probe set contact the DUT for electrical test. The memory saves electrical test result, which is outputted by the data output device.

公开(公告)号：US09645197B2

公开(公告)日：2017-05-09

申请号：US14557181

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R31/28 ,  G01R35/00

CPC classification number: G01R31/2891 ,  G01R35/005

Abstract: A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.

公开(公告)号：US09519010B2

公开(公告)日：2016-12-13

申请号：US14506146

申请日：2014-10-03

Applicant: MPI CORPORATION

Inventor： Chun-Chi Wang ,  Chia-Tai Chang ,  Ya-Yun Cheng ,  Wei-Cheng Ku ,  Chao-Ping Hsieh

IPC: G01R31/02 ,  G01R1/067 ,  G01R31/28

CPC classification number: G01R1/067 ,  G01R1/06772 ,  G01R31/02 ,  G01R31/2851 ,  G01R31/2889 ,  Y10T29/49218

Abstract: An integrated high-speed probe system is provided. The integrated high-speed probe system includes a circuit substrate for transmitting low-frequency testing signals from a tester through a first probe of the probe assembly to a DUT, and a high-speed substrate for transmitting high-frequency testing signals from the tester to the DUT. The high-speed substrate extends from the upper surface of the circuit substrate in the testing area to the lower surface of the circuit substrate in the probe area for being adjacent to the probe assembly and electrically connecting the second probe. In this way, the tester can transmit testing signals of different frequencies through the integrated high-speed probe system.

Abstract translation: 提供集成的高速探头系统。 集成高速探针系统包括用于将来自测试仪器的低频测试信号通过探针组件的第一探头传送到DUT的电路基板，以及用于将来自测试仪的高频测试信号传输到高速基板的高速基板 被测件。 高速基板从测试区域中的电路基板的上表面延伸到探针区域中的电路基板的下表面，用于邻近探针组件并电连接第二探针。 以这种方式，测试仪可以通过集成的高速探头系统传输不同频率的测试信号。

公开(公告)号：US09470716B2

公开(公告)日：2016-10-18

申请号：US14557697

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Hao Wei ,  Chen-Kang Chiu

IPC: G01R31/20 ,  G01R1/067

CPC classification number: G01R1/06772

Abstract: A probe module including a housing, a PCB, three probes, a resonating member, and a signal connector. The housing has a room therein, a first opening, and a second opening at opposite ends thereof. The PCB is received in the room of the housing, and has a substrate, on which a circuit and two groundings are provided. The probes are electrical connected to the circuit and the groundings of the PCB respectively, and then extend out of the housing via the first opening. The resonating member has a chamber, and is attached to the PCB. The signal connector is connected to the PCB, and extends out of the housing via the second opening. The signal connector has a signal transmission portion electrically connected to the circuit of the PCB, and a grounding portion electrically connected to the at least one grounding of the PCB.

Abstract translation: 探针模块，包括壳体，PCB，三个探针，谐振构件和信号连接器。 壳体在其中具有一个房间，第一开口和在其相对端的第二开口。 PCB被容纳在壳体的房间中，并且具有衬底，在衬底上设置电路和两个接地。 探针分别电连接到电路和PCB的接地处，然后经由第一开口延伸出壳体。 谐振构件具有室，并且附接到PCB。 信号连接器连接到PCB，并通过第二个开口延伸出外壳。 信号连接器具有电连接到PCB的电路的信号传输部分和与PCB的至少一个接地电连接的接地部分。

公开(公告)号：US10295567B2

公开(公告)日：2019-05-21

申请号：US15172931

申请日：2016-06-03

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Hao Wei ,  Jun-Liang Lai ,  Chih-Hao Ho

IPC: G01R31/00 ,  G01R1/073 ,  G01R31/319 ,  G01R31/28 ,  G01R31/317

Abstract: A probe module, which supports loopback test and is provided between a PCB and a DUT, includes an adapter, two probes, two inductive components provided at the adapter, and a capacitive component. The adapter has two connecting circuits. An end of each of the probes is connected to one of the connecting circuits, while another end thereof, which is a tip, contacts the DUT. Each of the inductive components has an end electrically connected to one of the connecting circuits, and another end electrically connected to the PCB through a conductive member, which is provided at the adapter, wherein two ends of the capacitive component are electrically connected to one of the connecting circuits, respectively. Whereby, the signal paths are changed by the differences between frequencies of signals, and the transmission path of high-frequency signals is effectively shortened.

公开(公告)号：US10054627B2

公开(公告)日：2018-08-21

申请号：US14558302

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Hao Wei ,  Chia-Nan Chou ,  Chih-Hao Ho

IPC: G01R31/04 ,  G01R1/04

CPC classification number: G01R31/041 ,  G01R1/0466

Abstract: A testing jig includes a substrate and a plurality of conductive elastic pieces, wherein the substrate has a recess and a plurality of circuits; the recess is located on a top surface of the substrate, while the circuits are provided on the top surface of the substrate. The conductive elastic pieces are provided on the substrate, and are respectively electrically connected to the circuits. Each of the conductive elastic pieces has a contact portion located within an orthographic projection range of the recess, wherein each of the contact portions contacts a pad of a DUT. Whereby, attenuation happens while transmitting test signals with high frequency can be effectively reduces by using the conductive elastic pieces to transmit test signals.

公开(公告)号：US09880252B2

公开(公告)日：2018-01-30

申请号：US15401987

申请日：2017-01-09

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R35/00 ,  G01R1/073

CPC classification number: G01R35/005 ,  G01R1/073 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.