摘要:
An image forming apparatus has an apparatus housing having a releasible and movable side frame, and stationary side frame, a photosensitive unit having a photosensitive member and which is detachably mounted on the movable side frame, and an intermediate transfer unit having an intermediate transfer member for temporarily receiving a transferred toner image formed on the surface of the photosensitive member in a primary transfer, and transferring the temporarily transfer toner image to a recording sheet in secondary transfer, the intermediate transfer unit being detachably mounted on the movable side frame.
摘要:
An electrophotographic apparatus having a first frame accommodating an exposure head which emits a light according to digital image data and a second frame accommodating a photosensitive member on which an electrostatic latent image is formed with a light emitted from the exposure head to the photosensitive member at an exposure portion. The first frame is openably supported by the second frame. When the first frame is opened relative to the second frame, the exposure head is released from the photosensitive member and thereby a document exposing unit including a transport system for transporting a document and an exposure optical system for exposing the photosensitive member to an optical image of the document being transported by the transport system is mountable at the exposure portion.
摘要:
An electric printer is capable of printing images on a large size sheet. The electric printer is provided with a print head to output images on a photoconductive member based on image data and a plurality of process units each of which integrally accommodates therein at least a photoconductive member, a developing device and a cleaner for forming the images on the sheet transported along a transport path within the printer. The process units are disposed in a direction orthogonally intersecting a transport direction of the sheets so as to form the images thereby on the sheet as it is being transported.
摘要:
A high-gloss, impact-resistant rubber-modified polystyrene composition, characterized in that said rubber-modified polystyrene consists essentially of(i) a polystyrene,(ii) dispersed particles of elastomeric polymers, and optionally polydimethylsiloxane and at least one member selected from the group consisting of mineral oil, and metallic salts or amides of higher fatty acids based on the total weight of the composition.
摘要:
A data processing unit acquires a review image including a pattern defect on a substrate, compares the review image with a reference image thereby to extract a defect image, the reference image including no pattern defect, and performs an alignment between the review image and a self-layer design pattern image which is generated from design data belonging to the identical layer in a region corresponding to the review image. The data processing unit, then, based on result of the alignment, generates an another-layer design pattern image which is generated from design data belonging to another layer in the region corresponding to the review image, and, based on a synthesized image of the defect image and the another-layer design pattern image, determines the relative position relationship between the pattern defect and a pattern belonging to another layer, and judges the criticality based on the relative position relationship.
摘要:
According to one embodiment, an interface device including a decoding module configured to decode received data, a storage module configured to store data obtained after the decoding module performs decoding, a CRC module configured to detect a CRC error included in the data obtained after the decoding module performs the decoding, an error detection module configured to detect a decoding error included in the data obtained after the decoding module performs the decoding, and a data processing module configured to process, as valid data, the data that is obtained after the decoding module performs the decoding and stored in the storage module when the decoding error detected by the error detection module is non-user data and the CRC module does not detect any CRC error.
摘要:
When a racing form speculating a race is selected, a bet is automatically made on a speculated possible finish place. A racing form speculated information indication region K1 is provided on the right side of a speculation indication region H5. A speculation racing form indication region K2 is provided on the right side of the racing form speculated information indication region K1. A game player selects a racing form to be used as speculated information. When an all bets button K5 below a racing form release button K4, bets are made maximum 8 sets of horse number combinations speculated by the racing forms. The bet control method can permit game players to easily and quickly bet.
摘要:
An electron beam inspection apparatus in which the order of inspection is determined to shorten the inspection time is disclosed. The order of inspection is determined by minimizing the total of the moving time and the inspection time as well as by simply optimizing the covered distance. At the time of preparing a recipe to determine the inspection points and the order of inspection, the sequence of a series of inspection points sequentially inspected is changed to optimize the order of inspection. Not only the sequence which minimizes the covered distance is determined but also the order of inspection of the inspection points is optimized in accordance with the charged state, warping of the wafer, the delivery position and other situations.
摘要:
This SEM has a capability of preventing shift of a view field of the foreign matters at a stage where no sufficient correction is carried out when obtaining the SEM coordinate values used for transforming the coordinate values of the foreign matters on the sample sent from another device into the SEM coordinate values. The SEM selects the foreign matters closer to the center of the sample at first and then the foreign matters spirally from the center of the sample to the outer periphery.
摘要:
An electron beam inspection apparatus in which the order of inspection is determined to shorten the inspection time is disclosed. The order of inspection is determined by minimizing the total of the moving time and the inspection time as well as by simply optimizing the covered distance. At the time of preparing a recipe to determine the inspection points and the order of inspection, the sequence of a series of inspection points sequentially inspected is changed to optimize the order of inspection. Not only the sequence which minimizes the covered distance is determined but also the order of inspection of the inspection points is optimized in accordance with the charged state, warping of the wafer, the delivery position and other situations.