摘要:
Dynamic sampling systems for fabrication with inspection control are provided. In embodiments of a fabrication system comprising a processing tool, inspection tool, and a controller, the processing tool performs a fabrication process on a workpiece associated with identification information. The inspection tool performs an inspection step on the workpiece. The controller, coupled to the processing and inspection tools, determines whether the processing tool corresponds to an inspection result obtained during a preset time period, and determines whether the workpiece is to be inspected by the inspection tool accordingly.
摘要:
An electroluminescent lamp comprises a substrate, an electroluminescent system printed on the substrate and a protection layer covering the outer surface of the electroluminescent system. The electroluminescent system comprises two electrode layers, where a dielectric layer and electroluminescent layer placed there between. The protection layer and the substrate interconnecting to form an envelope layer sealing the electroluminescent system, isolating the electroluminescent system inside the substrate and the protection layer. There is an adhesive layer beneath the substrate. It is also disclosed here a combination of an electroluminescent lamp and a metal dome sheet. There is a metal dome sheet beneath the adhesive layer. The metal dome sheet comprises a spacer where several receiving-grooves are provided and several metal domes seated respectively within the receiving-grooves. There is a second adhesive layer beneath the spacer. This invention has a simple structure and is easy to assemble.
摘要:
An apparatus and method for automatically offsetting the linear deviation of a V/F converter, the offset adjust pin of which is connected to a fixed resistance, and the frequency output pin of which is connected to a microcontroller unit (MCU) via an opto-isolator, a standard V/F transfer function being pre-stored in the MCU, wherein standard frequencies F1 and F0 (i.e., two coordination points (V1, F1) and (V0, F0)) are output by the V/F converter, when V1 and V0 are input as standard voltages, and the MCU may detect an error status in the V/F converter, when the V/F converter obtains real output frequencies F1′ and F0′ from real input voltages V1 and V2, and standard coordination points (F1, K1) and (F0, K0) will be corrected to (F1′, K1) and (F0′, K0′), from which a transfer function of offsetting frequency down is obtained, when the MCU processes a frequency down procedure.
摘要:
An integrated circuit (IC) has logic and timing circuits that are coupled to discrete circuitry to provide protection and indications whenever an AC adapter that is faulty or has improper voltage levels or polarity are plugged into a system. In particular, the IC device provides over-voltage, under-voltage, and reversed-polarity protections to an electronic system to keep the electronic system from being damaged by an alternating current (AC) adapter having an improper voltage range or voltage polarity. It also provides a protection that prevents an adapter from powering a host system that has a short-circuit fault.