摘要:
Wafer inspection with stable nuisance rates and defect of interest capture rates are disclosed. This technique can be used for discovery of newly appearing defects that occur during the manufacturing process. Based on a first wafer, defects of interest are identified based on the classified filtered inspection results. For each remaining wafer, the defect classifier is updated and defects of interest in the next wafer are identified based on the classified filtered inspection results.
摘要:
Operator and quality information can be traced during manufacturing processes. It can be determined whether an operator requesting access to the manufacturing process is authorized. If authorized, the operator can be granted access to the manufacturing process. Quality information including one or more quality checks associated with the operator can be received. It can be determined whether the one or more quality checks pass predetermined quality requirements. If the quality checks pass the predetermined quality requirements, identification information can be generated. The identification information can be used to apply a traceable output on a part associated with the manufacturing process. Traceability reports can be generated that include the operator identification and the quality information and that can be reviewed by external computing systems.
摘要:
A digital checklist system includes an electronic calibration and measurement device and a computer-readable medium having computer-executable instructions stored thereon that, if executed by one or more processors of a computing device, cause the computing device to perform actions for managing a digital checklist The actions include creating a digital checklist having at least one unique prompt, selecting the digital checklist for uploading onto the electronic calibration and measurement device, and downloading data input into the electronic calibration and measurement device in response to the at least one unique prompt. The system further includes a network location for facilitating communication between the electronic calibration and measurement device and the computing device.
摘要:
Electronic supervision may be provided. First, a stock number may be sent to a database server. The stock number may correspond to a product comprising, for example, an electrical cable. In response to sending the database server the stock number, specification information corresponding to the product may be received from a database stored on the database server. The specification information may comprise, for an electrical cable, a number of wires, a weight per thousand feet, and a diameter. Next, product production may be monitored to determine faults occurring during production. Monitoring the production may comprise displaying a data monitoring screen to production personnel. The data monitoring screen may provide data regarding the product and product comparison against a standard maintained within the database for the product. Fault data corresponding to the determined faults occurring during the production may be saved to the database.
摘要:
A method for monitoring the manufacture of molded ophthalmic lenses is disclosed. The method monitors the occurrence of predetermined events and records such events in a device history record and a shadow table.
摘要:
A process is disclosed for operating an industrial plant by means of a guidance system that controls processes in the industrial plant, in which process operation-relevant data such as states, malfunctions and/or degradation of devices of the industrial plant are acquired by an operator; the operation-relevant data are acquired in an operation monitoring system and stored in electronic, preferably standardized form, and operation-relevant data on events which can affect process control, such as malfunctions of devices, are electronically transmitted to the guidance system. Operation-relevant data and events can thus be reliably archived, documented and made available to the operators of the industrial plant, it being ensured that process-relevant data are taken into account in the guidance system even when said data relate to devices which are not connected to the guidance system
摘要:
Disclosed is a test data analyzing method and system for use in estimation of a defect cause of a product, such as, an integrated circuit, a liquid crystal display, an optical transceiver, a thin film magnetic head, etc., which is fabricated through plural processes. The estimation of a defect cause is achieved by selecting a wafer number to be analyzed, reading test data, reading fabrication line data, counting frequency of machine codes by wafers, grouping test data by machine codes or frequencies, comparing test data distributions between groups by machine codes, and comparing results between machine codes.
摘要:
A aerospace machine element product (1) to be managed comprises a plurality of assembled components (2) ((1) to (3)). Each of the plurality of components (2) ((1) to (3)) is manufactured through a material purchase process (S1), a forging process (S2), a heat treatment process (S3), a grinding process (S4), surface treatment process (S5), and inspection process (S6). The information of the processes (S1) to (S2) is recorded on an IC tag (4) together with the lot numbers of the processes. After the components (2) have been assembled in the aerospace machine element product (1), the recorded information regarding the components (2) on the IC tag (4) is recorded in a management computer system (11) so as to be related to a manufacturing number or a manufacturing lot number. Another IC tag (10) is attached to the aerospace machine element product (1) and the manufacturing number or the lot number is recorded on the IC tag (10). In addition, processing condition information about the forging, heat treatment, grinding, surface treatment processes is recorded on this IC tag (10).
摘要:
Autonomous non-destructive inspection equipment provides automatic and/or continuous inspection and evaluation of a material under inspection. The inspection equipment preferably comprises at least one detection sensor and at least one detection sensor interface for a computer. The autonomous non-destructive inspection system may also be retrofitted into conventional inspection systems by extracting pertinent features through spectral frequency analysis and sensor compensation and utilizing those features in the autonomous non-destructive inspection system.
摘要:
Inspection items of inspection steps performed in processes 40 to 70, namely, in the processes of parts incoming, production, outgoing and market, and quality defect information items generated in connection with these inspections, are registered in advance in a code master database 17 as systematized codes. A part ID unique to a given part and a product ID unique to a given product are correlatively recorded in a part bar code label 81 and in a product bar code label 82 respectively. These bar code labels 81 and 82 are affixed to each part and product. In each of the processes 40 to 70, the part IDs or the product IDs are read, inspection results and quality defect information are input, and information is stored in databases 7, 9, 12, 14 and 16, whereby the quality history of each product is managed.