Abstract:
A multilayer ceramic electronic component in which an interface of an edge region of an external electrode that extends around to a side surface of a ceramic body and the ceramic configuring a surface of the ceramic body, an inorganic matter is present containing 26 mol % or more and less than 45 mol % of SiO2 and having a molar ratio (TiO2+ZrO2)/(SiO2+TiO2+ZrO2) of 0.154 or more, or an inorganic matter is present containing 45 mol % or more of SiO2 and having a molar ratio (TiO2+ZrO2)/(SiO2+TiO2+ZrO2) of 0.022 or more. Furthermore, the inorganic matter may contain B2O3 having a molar ratio relative to SiO2 within 0.25≤B2O3/SiO2≤0.5.
Abstract:
A multilayer ceramic electronic component includes a ceramic body having an end surface and a side surface adjacent to thereto such that the end surface and the side surface meet at an edge. The ceramic body has a plurality of internal electrodes with adjacent pairs of the internal electrodes being separated by a respective ceramic layer. An external electrode containing a metal, an inorganic component and voids is electrically connected to at least some of the internal electrodes and both covers the end surface and extends over the edge onto the side surface to form an extending-around portion which extends at least 50 μm onto the side surface as measured in a direction perpendicular to the edge and ends at a leading edge remote from the edge. A portion of the extending-around area which extends 50 μm from the leading edge towards the edge has an average occupancy area ratio which is at least 25 but not greater than 75. The occupancy area ratio is the ratio between the area of the conductive component and an area of the inorganic component on the one hand to the area of the conductive component, the area of the inorganic component and the area of the voids on the other.
Abstract:
In a multilayer ceramic capacitor, an inner ceramic layer includes a perovskite-type compound containing Ba and Ti. A region within an electrically effective portion of the inner ceramic layers sandwiched between inner electrodes, which is near an area where inner and outer electrodes connect to each other, is subjected to a mapping analysis using EDS. ((L2−L3)/L1)×100≧50 is satisfied, L1 denotes a total length of ceramic grain boundaries detected from a TEM transmission image, L2 denotes a total length of grain boundaries, detected from a mapping image and the TEM transmission image, where the rare earth element is present, and L3 denotes a total length of portions, detected from a mapping image and the TEM transmission image, in which the grain boundaries where the rare earth element is present and grain boundaries where at least one of Mn, Mg, and Si is present are overlapped.
Abstract:
A monolithic ceramic electronic component having outer electrodes that include an inorganic substance containing at least Si, a crystal phase C containing at least Si, Ti, and Ba at the interfaces to a ceramic layer in peripheral end portions of the outer electrodes. A value of the crystal phase area ratio indicating the relationship between the area of the crystal phase C and the area of a glass phase G, which are formed at the interface to the ceramic layer, in a region within 5 μm from the peripheral end portion of the outer electrode is within a range of 75% to 98%.