摘要:
A layout design system of a semiconductor integrated circuit, comprising: a library information storage unit configured to register a basic via shape list; a technology database storage unit configured to register a list expressing an optimum wire terminating process for each via shape of said basic via shape list registered in said library information storage unit; and a central processing control unit configured to refer to the lists respectively registered in said library information storage unit and said technology database storage unit, select an optimum line processing, and execute a line design.
摘要:
A layout design system of a semiconductor integrated circuit, comprising: a library information storage unit configured to register a basic via shape list; a technology database storage unit configured to register a list expressing an optimum wire terminating process for each via shape of said basic via shape list registered in said library information storage unit; and a central processing control unit configured to refer to the lists respectively registered in said library information storage unit and said technology database storage unit, select an optimum line processing, and execute a line design.
摘要:
An automated wiring pattern layout method is provided. With this method, a first wiring pattern is generated with width W and extending in a first direction, and a second wiring pattern is generated with width W and extending in a direction perpendicular to the first wiring pattern in a manner such that the end thereof ends at the end portion of the first wiring pattern. Moreover, an overlapping region is generated by bending an end of either one of the first or the second wiring pattern at a right angle to produce an L-shaped extension and overlaying the first and the second wiring pattern, and a rectangular-shaped VIA pattern is generated at the overlapping region.
摘要:
An automated wiring pattern layout method is provided. With this method, a first wiring pattern is generated with width W and extending in a first direction, and a second wiring pattern is generated with width W and extending in a direction perpendicular to the first wiring pattern in a manner such that the end thereof ends at the end portion of the first wiring pattern. Moreover, an overlapping region is generated by bending an end of either one of the first or the second wiring pattern at a right angle to produce an L-shaped extension and overlaying the first and the second wiring pattern, and a rectangular-shaped VIA pattern is generated at the overlapping region.
摘要:
In a pattern correction method, design layout data of a pattern designed by an automated layout unit is entered. An environmental profile is determined based on whether or not another graphics pattern exists at the surroundings of each correction target cell included in the entered design layout data. A target cell name is replaced with a prescribed cell name of correction pattern corresponding to the determined environmental profile by referencing a cell replacement table. An OPC correction pattern corresponding to the replaced cell name is imported from a cell library.
摘要:
A semiconductor integrated circuit, a supply method of supplying multiple supply voltages therefor, and a record medium for storing a program of the supply method for supplying multiple voltages therefore in which a first cell to which multiple supply voltages are supplied is extracted (Step S1), the extracted cells are divided into groups (Step S2), cells for voltage supply are added and arranged according to the number of the groups (Step S3), and the cell for the voltage supply are connected to the first cell for supplying the plurality of voltages through a net for a power source supply (Step S4).
摘要:
A reticle set includes a first reticle including a first wiring pattern having a first termination pattern; a second reticle including a plurality of via patterns; and a third reticle including a second wiring pattern having a second termination pattern and a second line pattern connected to an end of the second termination pattern.
摘要:
A computer-implemented method for designing a semiconductor integrated circuit, which optimizes the propagation delay of a path from a signal input terminal (source) to a signal output terminal (sink) on the same net, includes: calculating the ratio of the total sum of a gate input load capacitance to the wiring capacitance of the path from the source to the sink as a process variation sensitivity relating to the capacitance component of the path to be designed from the source to the sink, based on a circuit design information of a gate level of the semiconductor integrated circuit to be designed; and optimizing the process variation sensitivity relating to the capacitance component of each path in order that the process variation sensitivities relating to the capacitance components of all the paths are smaller than a reference value.
摘要:
A semiconductor integrated circuit of a low power consumption type has modules (1) to which various supply voltages are provided. In each module (1), cells (3) are grouped into cell rows or cell columns. Only one of a wire (7) of a high supply voltage and a wire (5) of a low supply voltage is formed on each cell row or cell column in the module (1). Various supply voltages are provided into the target cell (3) through the electrical wires (5, 7).
摘要:
A method for arranging a group of logical cells through which a signal is transmitted within an allowable delay time, consisting of the steps of determining signal lines interconnecting the logical cells of the equipotential net, defining a critical path consisting of the signal lines of all the equipotential nets, classifying the logical cells positioned between the equipotential nets as path core cells and classifying the other logical cells as path branch cells, positioning the path core cells to shorten the length of a main signal route passing through the path core cells, positioning the path branch cells to shorten the distance between the main signal route and the path branch cell for each equipotential net, and decreasing the delay time of the critical path formed by the replaced path core cells and the replaced path branch cells within the allowable delay time.