公开(公告)号：US20210249787A1

公开(公告)日：2021-08-12

申请号：US16786880

申请日：2020-02-10

Applicant: RAYTHEON COMPANY

Inventor： Jack J. Schuss ,  Phillip W. Thiessen ,  Thomas V. Sikina

IPC: H01Q21/06 ,  H01Q5/307 ,  G01S7/03

Abstract: A dual band dipole radiator array includes a high band radiator array disposed on a dielectric layer for transmitting and receiving high band radar signals; a low band radiator array disposed on a front side of the high band radiator array for transmitting and receiving low band radar signals; a foam material between the low band radiator array and the high band radiator array for support; and a single aperture for both the low band radiator array and the high band radiator array for transmitting and receiving the radar signals, where the low band radiator array is comprised of a plurality of dipole structures disposed within the foam material and tuned to pass through high band radar signals to or from the high band radiator array.

公开(公告)号：US09979084B2

公开(公告)日：2018-05-22

申请号：US14557803

申请日：2014-12-02

Applicant: Raytheon Company

Inventor： Thomas V. Sikina ,  Jack J. Schuss ,  Joseph C. Yeh ,  Patrick J. Makridakis

IPC: H01Q3/26 ,  H01Q1/28 ,  H04B7/145 ,  H04B17/12 ,  H04B17/14 ,  H01Q3/00

CPC classification number: H01Q3/267 ,  H01Q1/288 ,  H04B7/145 ,  H04B17/12 ,  H04B17/14

Abstract: Methods and apparatus to calibrate an array by sequentially calibrating elements in a subarray with respect to each other using a satellite. The satellite is repeatedly illuminated for calibrating the elements using reference elements to determine plane fronts from which active elements can be calibrated with respect to each other.

公开(公告)号：US09373888B1

公开(公告)日：2016-06-21

申请号：US13945197

申请日：2013-07-18

Applicant: Raytheon Company

Inventor： Jack J. Schuss ,  Kaichiang Chang ,  Jeffrey C. Upton

IPC: H01Q3/00 ,  H01Q3/26

CPC classification number: H01Q21/005

Abstract: Methods and apparatus for a phased array radar system including an array comprising columns of super-elements containing radiator elements located along a length of the super-element, wherein the super-elements form the columns such that super-elements are arranged end-to-end, wherein the super-elements are arranged in the column at randomized locations to reduce sidelobes. In a further embodiment, super element lengths can be randomized.

Abstract translation: 一种相控阵列雷达系统的方法和装置，包括阵列，该阵列包括沿着超级元件的长度定位的包含辐射元件的超级元件列，其中超级元件形成列，使得超级元件被端对端布置， 其中超级元件在随机位置排列在列中以减少旁瓣。 在另一实施例中，超级元件长度可以被随机化。

公开(公告)号：US09331751B2

公开(公告)日：2016-05-03

申请号：US14451466

申请日：2014-08-05

Applicant: Raytheon Company

Inventor： Thomas V. Sikina ,  Jack J. Schuss ,  Joseph E. Hilliard, Jr.

IPC: H04B5/00 ,  G01D18/00

CPC classification number: H04B5/0043 ,  G01D18/00 ,  H01Q3/267 ,  H04B7/0865 ,  H04B17/0085 ,  H04B17/21

Abstract: Described embodiments calibrate an array antenna using near-field antenna measurements individually for each antenna element in an antenna under test (AUT). A signal is received at a first AUT antenna element from an antenna probe assembly by transmitting from the antenna probe assembly at each of multiple known probe locations in a near-field of the AUT. A signal is received at each probe location by transmitting from the first antenna element of the AUT to the antenna probe assembly. The received signals are combined into a combined signal for the first antenna element that de-correlates multi-path in the combination result. The combined signal is processed to generate a calibration coefficient for the first AUT antenna element. Remote boundary condition (RBC) testing is performed to reduce temporal instability. The multiple known probe locations lie on one of the following: a planar surface, a cylindrical surface, and a spherical surface.

Abstract translation: 所描述的实施例使用对于被测天线（AUT）中的每个天线元件单独使用近场天线测量来校准阵列天线。 在天线探头组件的第一AUT天线元件处，通过在天线探头组件中在AUT的近场中的多个已知探测位置的每一个处发送信号。 通过从AUT的第一天线元件发送到天线探针组件，在每个探测位置处接收信号。 接收到的信号被组合成用于第一天线元件的组合信号，该组合信号使组合结果中的多路径不相关。 处理组合信号以产生第一AUT天线元件的校准系数。 进行远程边界条件（RBC）测试以减少时间不稳定性。 多个已知的探针位置位于以下之一：平坦表面，圆柱形表面和球形表面。

公开(公告)号：US20160043778A1

公开(公告)日：2016-02-11

申请号：US14451466

申请日：2014-08-05

Applicant: Raytheon Company

Inventor： Thomas V. Sikina ,  Jack J. Schuss ,  Joseph E. Hilliard, JR.

IPC: H04B5/00 ,  G01D18/00

CPC classification number: H04B5/0043 ,  G01D18/00 ,  H01Q3/267 ,  H04B7/0865 ,  H04B17/0085 ,  H04B17/21

Abstract: Near field array antenna calibration is performed using multiple probe element locations within the near field of an array antenna for each element of the array.

Abstract translation: 使用阵列天线的近场内的多个探针元件位置对阵列的每个元件执行近场阵列天线校准。