公开(公告)号：US20230168699A1

公开(公告)日：2023-06-01

申请号：US17967498

申请日：2022-10-17

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Mayankkumar Hareshbhai Niranjani ,  Dhulipalla Phaneendra Kumar ,  Gourav Garg ,  Sourabh Banzal

IPC: G05F1/46 ,  H03K19/20

CPC classification number: G05F1/46 ,  H03K19/20

Abstract: An electric device includes: a first power domain; a second power domain; a third power domain, where during power-up, the third, the second, and the first power domains are configured to be powered up sequentially, where during standby-exit, the first, the second, and the third power domains are configured to be powered up sequentially; isolation paths that provide controlled signal transmission among the first, the second, and the third power domains, where each isolation path includes an isolation circuit between an input power domain and an output power domain of the isolation path; and a control circuit in the first power domain, where for each isolation path, the control circuit is configured to generate an isolation control signal for the isolation circuit, where the isolation circuit is configured enable or disable signal transmission along the isolation path.

公开(公告)号：US11550348B2

公开(公告)日：2023-01-10

申请号：US17211545

申请日：2021-03-24

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Mayankkumar Hareshbhai Niranjani ,  Gourav Garg

IPC: G05F1/56 ,  G01R31/28 ,  H03K19/20

Abstract: A method to bypass a voltage regulator of a system on a chip (SOC) comprising powering a first power domain using a voltage regulator; powering a second power domain using the voltage regulator; coupling a third power domain with an external voltage source; raising an external voltage supply from the external voltage source above a threshold level of the voltage regulator; coupling the first second power domains to the external voltage source; turning OFF the voltage regulator of the SOC after coupling the first power domain of the SOC and the second power domain of the SOC to the external voltage source; and powering the first power domain of the SOC, the second power domain of the SOC, and the third power domain of the SOC with the external voltage source, the external voltage source bypassing the voltage regulator.

公开(公告)号：US20220244308A1

公开(公告)日：2022-08-04

申请号：US17164570

申请日：2021-02-01

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Shiv Kumar Vats ,  Tripti Gupta

IPC: G01R31/3177 ,  G06F1/04 ,  G01R31/317

Abstract: In an embodiment, a method for performing scan includes: entering scan mode; receiving a test pattern; applying the test pattern through a first scan chain by asserting and deasserting a scan enable signal to respectively perform shift and capture operations to the first scan chain; while applying the test pattern through the first scan chain, controlling a further scan flip-flop with the first scan chain without transitioning a further scan enable input of the further scan flip-flop; and evaluating an output of the first scan chain to detect faults.

公开(公告)号：US11119153B1

公开(公告)日：2021-09-14

申请号：US16888059

申请日：2020-05-29

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan

IPC: G01R31/3177 ,  G01R31/3185 ,  G01R31/317 ,  G01R31/28

Abstract: A method of testing a multiple power domain device includes sending a control signal from a test controller powered by a switchable power domain to a non-scan test data register powered by an always on power domain. The method further includes setting, using the control signal, a test data register value of the register to enable scan mode by bypassing an isolation cell between an output of the switchable domain and an input of the always on domain and, while the register value continuously enables scan mode: shifting a test pattern into a scan chain including a flip-flop coupled to the isolation cell, capturing a test result from the scan chain, and shifting the test pattern out of the scan chain to observe the test result. The isolation cell is configured to allow or disallow propagation of a signal from the output to the input.

公开(公告)号：US20190064271A1

公开(公告)日：2019-02-28

申请号：US15684334

申请日：2017-08-23

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Manish Sharma

IPC: G01R31/3185 ,  G01R31/317

CPC classification number: G01R31/31705 ,  G01R31/318597

Abstract: A JTAG interface in an IC includes a test mode select (TMS) pin receiving a TMS signal, a testing test access port (TAP) having a TMS signal input, a debugging test access port (TAP) having a TMS signal and glue logic coupled to receive a first output from the testing TAP and a second output from the debugging TAP. A flip-flop receives input from the testing TAP and the debugging TAP through the glue logic. A first AND gate has output coupled to the TMS signal input of the debugging TAP, and receives input from an output of the flip-flop and the TMS signal. An inverter has an input coupled to receive input from the flip-flop. A second AND gate has output coupled to the TMS signal input of the testing TAP, and receives input from the TMS signal and output of the inverter.

公开(公告)号：US09941875B2

公开(公告)日：2018-04-10

申请号：US15615178

申请日：2017-06-06

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Srinivas Dhulipalla

IPC: H03K17/22 ,  H03K19/20 ,  H03K5/19

CPC classification number: H03K17/223 ,  G01R31/2832 ,  G06F1/24 ,  G06F1/30 ,  H03K5/19 ,  H03K17/22 ,  H03K19/20

Abstract: A power management circuit includes both a power on reset (POR) circuit and a voltage monitoring circuit. Explicit testing of these circuits is accomplished by controlling voltages applied to the circuits and monitoring an output signal responsive to a logical combination of outputs from the POR circuit and voltage monitoring circuit. The applied voltages are controlled with respect to timing of application, fixing of voltages and varying of voltages in a manner where a certain one of the circuits for explicit test is isolated with change in logic state of the output signal being indicative of operation of that isolated circuit.

公开(公告)号：US20180031631A1

公开(公告)日：2018-02-01

申请号：US15223061

申请日：2016-07-29

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Tripti Gupta

IPC: G01R31/3177 ,  G01R31/317

CPC classification number: G01R31/318544 ,  G01R31/318536 ,  G01R31/318541 ,  G01R31/318572

Abstract: A logic built-in self-test (LBIST) circuit implements a pipeline scan enable launch on shift (LOS) feature. A first scan chain flip-flop has a scan enable input configured to receive a first scan enable signal. A logic circuit has a first input coupled to a data output of the first scan chain flip-flop and a second input coupled to receive the first scan enable signal. A second scan chain flip-flop has a scan input coupled to a scan output of the first scan chain flip-flop. A scan enable input of the second scan chain flip-flop is coupled to receive a second scan enable signal generated at an output of the logic circuit. The first and second scan chain flip-flops are clocked by a same clock signal.

公开(公告)号：US12146911B1

公开(公告)日：2024-11-19

申请号：US18203345

申请日：2023-05-30

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Manish Sharma ,  Jeena Mary George ,  Umesh Chandra Srivastava

IPC: G01R31/3185

Abstract: According to an embodiment, a method for testing a triple-voting flop (TVF) is provided. The method includes providing a first and a second scan enable signal by a control circuit to, respectively, a first scan flip-flop and a third scan flip-flop of the TVF; receiving a third scan enable signal at the second scan flip-flop of the TVF; providing a scan input signal to the first scan flip-flop, the second scan flip-flop, and the third scan flip-flop; controlling the first scan enable signal, the second scan enable signal, and the third scan enable signal; receiving, at an output of the TVF, a scan output signal; and determining whether the TVF suffers from a fault based on the scan output signal and the controlling of the first scan enable signal, the second scan enable signal, and the third scan enable signal.

公开(公告)号：US10996266B2

公开(公告)日：2021-05-04

申请号：US16536462

申请日：2019-08-09

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Rajesh Narwal ,  Srinivas Dhulipalla

IPC: G01R31/28

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In an embodiment, an integrated circuit (IC) includes power management unit (PMU), a set-reset (S-R) latch circuit, a multiplexer, and an AND gate circuit. A voltage monitor circuit of the PMU generates an output signal based on a difference between a received reference voltage and a received sense voltage from a functional supply. A power on reset (PoR) generator of the PMU generates a PoR signal based on a power up condition of the PMU. The S-R latch circuit generates an enable signal based on the output signal of the comparator circuit and the PoR signal. The multiplexer passes-through the output signal of the comparator circuit during a functional condition of the PMU. The AND gate circuit generates an enable signal based on an output of the multiplexer and an output of the S-R latch circuit.

公开(公告)号：US20210041496A1

公开(公告)日：2021-02-11

申请号：US16536462

申请日：2019-08-09

Applicant: STMicroelectronics International N.V.

Inventor： Venkata Narayanan Srinivasan ,  Rajesh Narwal ,  Srinivas Dhulipalla

IPC: G01R31/28

Abstract: Circuits and methods for testing voltage monitor circuits are provided. In an embodiment, an integrated circuit (IC) includes power management unit (PMU), a set-reset (S-R) latch circuit, a multiplexer, and an AND gate circuit. A voltage monitor circuit of the PMU generates an output signal based on a difference between a received reference voltage and a received sense voltage from a functional supply. A power on reset (PoR) generator of the PMU generates a PoR signal based on a power up condition of the PMU. The S-R latch circuit generates an enable signal based on the output signal of the comparator circuit and the PoR signal. The multiplexer passes-through the output signal of the comparator circuit during a functional condition of the PMU. The AND gate circuit generates an enable signal based on an output of the multiplexer and an output of the S-R latch circuit.